IP Library › Granted Patent US 10,379,170
Granted Patent B2
US 10,379,170 · App. 15/552,842 · Granted Aug 13, 2019

Cell deterioration diagnostic based on integrated value

Inventors: Naoto Nagaoka (Kyoto, JP); Naoyuki Yoshioka (Kyoto, JP); Naoya Narita (Kyoto, JP)
Assignee: The Doshisha
G01R31/392H01M10/0525H01M10/42H01M10/48H01M10/486H02J7/00H02J7/008G01R31/367G01R31/374G01R31/378G01R31/388G01R31/389
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Quick Facts
Patent No.
US 10,379,170
App. No.
15/552,842
Granted
Aug 13, 2019
Kind
B2
Abstract

Relatively inexpensive and practical cell deterioration diagnostic method and cell deterioration diagnostic device are provided. A cell deterioration diagnostic method diagnoses cell deterioration of a secondary cell having a transient characteristic. The method includes: a charging step of charging the secondary cell; a calculation step of calculating an integrated value of a potential difference obtained by subtracting a cell internal voltage V 0 of the secondary cell from a cell inter-terminal voltage of the secondary cell by integrating the potential difference as the cell inter-terminal voltage converges to the cell internal voltage V 0 after completion of charging; and a diagnosis step of diagnosing the cell deterioration of the secondary cell based on the integrated value.

Claims (16)

1. A cell deterioration diagnostic method of diagnosing cell deterioration of a rechargeable secondary cell having a cell internal voltage, a cell internal impedance, and a cell inter-terminal voltage, the method comprising:

charging the secondary cell by operation of a charging circuit that supplies a charging electrical current to the secondary cell, the charging causing the cell inter-terminal voltage to increase above the cell internal voltage over time in accordance with a charging transient characteristic;

discharging the secondary cell by interrupting the operation of the charging circuit to cause the cell inter-terminal voltage to decrease towards the cell internal voltage over time in accordance with a rest time transient characteristic;

measuring the cell inter-terminal voltage at predetermined sampling frequencies over the rest time transient characteristic with a voltage detector connected across the secondary cell;

storing potential differences between the cell inter-terminal voltage and the cell internal voltage at the sampling frequencies over the rest time transient characteristic in a storage unit;

integrating the stored potential differences to obtain an integration value by operation of a calculating unit; and

diagnosing the cell deterioration of the secondary cell based on the integrated value by operation of a diagnosis unit.

2. The cell deterioration diagnostic method according to claim 1 , and correcting the integrated value to a corrected integrated value by operation of the calculating unit by using a correction function that exponentially increases as an ambient temperature of the secondary cell increases, and wherein the diagnosing by the diagnosis unit is performed based on the corrected integrated value.

3. A cell deterioration diagnostic device configured to diagnose cell deterioration of a rechargeable secondary cell having a cell internal voltage, a cell internal impedance, and a cell inter-terminal voltage, the device comprising:

a charging circuit configured to supply a charging electrical current to the secondary cell to charge the secondary cell, and to cause the cell inter-terminal voltage to increase above the cell internal voltage over time in accordance with a charging transient characteristic;

the charging circuit being interrupted in operation to discharge the secondary cell and cause the cell inter-terminal voltage to decrease towards the cell internal voltage over time in accordance with a rest time transient characteristic;

a voltage detector connected across the secondary cell and configured to measure the cell inter-terminal voltage at predetermined sampling frequencies over the rest time transient characteristic;

a storage unit configured to store potential differences between the cell inter-terminal voltage and the cell internal voltage at the sampling frequencies over the rest time transient characteristic;

a calculating unit configured to integrate the stored potential differences to obtain an integration value; and

a diagnosis unit configured to diagnose the cell deterioration of the secondary cell based on the integrated value.

4. The cell deterioration diagnostic device according to claim 3 , wherein the calculating unit is configured to correct the integrated value to a corrected integrated value by using a correction function that exponentially increases as an ambient temperature of the secondary cell increases, and wherein the diagnosis unit diagnoses the cell deterioration based on the corrected integrated value.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 23, 2017
From: NAGAOKA, NAOTO; YOSHIOKA, NAOYUKI; NARITA, NAOYA
To: THE DOSHISHA
Reel/Frame 043645/0435 →
Priority Claims (1)
JP 2015-033944 · Feb 24, 2015 · national
Continuity (1)
Related Publication 20180038918A1 · Feb 8, 2018
Cited By (1)
US 12,454,191