IP Library › Granted Patent US 10,400,331
Granted Patent B2
US 10,400,331 · App. 15/120,238 · Granted Sep 3, 2019

Method for manufacturing metal chalcogenide thin film and thin film manufactured thereby

Inventors: Minseok Choi (Seoul, KR); Changgu Lee (Suwon-si, KR); Youngchan Kim (Suwon-si, KR)
Assignees: LG ELECTRONICS INC.; RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
C23C16/305C23C14/0021C23C14/0623C23C14/228C23C16/46
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Quick Facts
Patent No.
US 10,400,331
App. No.
15/120,238
Granted
Sep 3, 2019
Kind
B2
Abstract

The present invention relates to the manufacturing of a heteroelement thin film, and particularly to a method for manufacturing a metal chalcogenide thin film and the thin film manufactured thereby. The present invention, which relates to a method for manufacturing a metal chalcogenide thin film, may comprise the steps of: supplying a vaporized metal precursor; supplying a chalcogen-containing gas; and forming a thin film by reacting the metal precursor with the chalcogen-containing gas on a growth substrate at a first temperature condition.

Claims (23)

1. A method of manufacturing a metal chalcogenide thin film comprising:

supplying a gasified metal precursor by heating MoO 3 powder;

supplying a chalcogen-containing gas including H 2 S;

reacting the metal precursor with the chalcogen-containing gas on a growth substrate under a first temperature condition to form an MoS 2 thin film;

conducting a heat treatment under a second temperature condition higher than the first temperature condition;

cooling to lower a temperature; and

transferring the formed MoS 2 thin film to a final substrate,

wherein the growth substrate comprises a substrate including SiO 2 disposed on Si, and reacting the metal precursor with the chalcogen-containing gas is performed such that the metal chalcogenide thin film is directly formed on the substrate including SiO 2 disposed on Si,

wherein reacting the metal precursor with the chalcogen-containing gas is carried out at a temperature lower than a melting point of metal of the metal precursor,

wherein the second temperature condition is 850 to 1,200° C.,

wherein manufacturing the MoS 2 thin film is carried out using a plasma enhanced chemical vapor deposition (CVD) method,

wherein the first temperature is 100° C. or lower, and

wherein the MoS 2 thin film has a domain size of 50 to 100 nm.

2. The method according to claim 1 , wherein the formation or heat treatment of the MoS 2 thin film is carried out under an argon gas atmosphere.

3. The method according to claim 1 , wherein the formation of the MoS 2 thin film comprises forming a compound or mixture of at least two types of metal chalcogenides.

4. The method according to claim 1 , wherein the chalcogen-containing gas is supplied from a tube.

5. The method according to claim 1 , wherein transferring the formed MoS 2 thin film to the final substrate includes:

forming or attaching a support substrate on a first surface of the MoS 2 thin film;

removing the SiO 2 ;

attaching the final substrate to a second surface of the MoS 2 thin film; and

separating or removing the support substrate.

6. The method according to claim 5 , wherein the support substrate includes a resin including PMMA, PDMS or PVA.

7. The method according to claim 5 , wherein the support substrate is adhered using a release tape including a heat release tape or an optical release tape.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 29, 2016
From: CHOI, MINSEOK; LEE, CHANGGU; KIM, YOUNGCHAN
To: LG ELECTRONICS INC.; RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
Reel/Frame 039898/0236 →
Priority Claims (1)
KR 10-2014-0020276 · Feb 21, 2014 · national
Continuity (1)
Related Publication 20170073809A1 · Mar 16, 2017
Cited By (2)
US 12,297,532 US 12,365,988