IP Library Granted Patent US 10,411,176
Granted Patent B2
US 10,411,176 · App. 15/510,585 · Granted Sep 10, 2019

Method for manufacturing semiconductor light-emitting device

Inventors: Soo Kun Jeon (Gyeonggi-do, KR); Seung Ho Baek (Gyeonggi-do, KR); Da Rae Lee (Gyeonggi-do, KR); Bong Hwan Kim (Gyeonggi-do, KR); Dong So Jung (Gyeonggi-do, KR)
Assignee: SEMICON LIGHT CO., LTD.
H01L33/62H01L21/67144H01L21/67271H01L22/12H01L24/19H01L24/96H01L33/0095H01L33/505H01L33/54H01L33/60H01L33/20H01L2933/005H01L2933/0041H01L2933/0066
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Quick Facts
Patent No.
US 10,411,176
App. No.
15/510,585
Granted
Sep 10, 2019
Kind
B2
Abstract

Disclosed is a method for manufacturing a semiconductor light emitting device, the method including: providing a mask having a plurality of openings on a base; placing semiconductor light emitting chips on exposed portions of the base through the openings, respectively, by a device carrier which recognizes a shape of the mask and calibrates position for a semiconductor light emitting chip to be seated; and supplying an encapsulant to each of the openings, with the mask serving as a dam.

Claims (15)

1. A method for manufacturing a semiconductor light emitting device, the method comprising:

providing a mask having a plurality of openings on a base;

placing semiconductor light emitting chips on exposed portions of the base through the openings, respectively, by a device carrier which recognizes a shape of the mask and calibrates a position for a semiconductor light emitting chip to be seated;

supplying an encapsulant to each of the openings, with the mask serving as a dam; and

after supplying the encapsulant, separating an assembly of the mask, the encapsulant and the semiconductor light emitting chip from the base, and taking out an assembly of the semiconductor light emitting chip and the encapsulant from the mask.

2. The method for manufacturing a semiconductor light emitting device according to claim 1 , further comprising arranging a plurality of semiconductor light emitting chips on a fixing layer using sorting equipment,

wherein the device carrier picks up each semiconductor light emitting chip on the fixing layer and places a semiconductor light emitting chip of interest on the base by recognizing a vacant position of a semiconductor light emitting chip on the fixing layer, and

wherein the device carrier places a semiconductor light emitting chip by recognizing a shape of the mask and a shape of an electrode of the semiconductor light emitting chip to calibrate an angle of the semiconductor light emitting chip, and then placing the semiconductor light emitting chip on the base.

3. The method for manufacturing a semiconductor light emitting device according to claim 1 , wherein, when placing semiconductor light emitting chips on the base, each of the semiconductor light emitting chips is a flip chip having two electrodes and is placed with the two electrodes facing the base.

4. The method for manufacturing a semiconductor light emitting device according to claim 1 , wherein the semiconductor light emitting chip comprises:

a plurality of semiconductor layers including a first semiconductor layer having a first conductivity type, a second semiconductor layer having a second conductivity type different from the first conductivity type, and an active layer interpositioned between the first semiconductor layer and the second semiconductor layer, for generating light by electron-hole recombination;

a first electrode in electrical communication with the first semiconductor layer and supplying electrons or holes to the first semiconductor layer; and

a second electrode in electrical communication with the second semiconductor layer and supplying electrons or holes, whichever are not supplied to the first semiconductor layer, to the second semiconductor layer,

wherein the method further comprises: prior to placing semiconductor light emitting chips on the base, coating a phosphor layer on the surface of each semiconductor light emitting layer to expose the first and second electrodes.

5. The method for manufacturing a semiconductor light emitting device according to claim 1 , further comprising testing each semiconductor light emitting chip in an assembled state with the mask and the encapsulant, using optical measuring equipment, wherein testing includes reflecting, in the mask, light from each semiconductor light emitting chip towards the optical measuring equipment.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 7, 2023
From: SEMICON LIGHT CO., LTD.
To: LUMENS CO., LTD.
Reel/Frame 065788/0381 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2017
From: JEON, SOO KUN; BAEK, SEUNG HO; LEE, DA RAE; KIM, BONG HWAN; JUNG, DONG SO
To: SEMICON LIGHT CO., LTD.
Reel/Frame 041977/0048 →
Priority Claims (7)
KR 10-2014-0121190 · Sep 12, 2014 · national
KR 10-2014-0121191 · Sep 12, 2014 · national
KR 10-2014-0121193 · Sep 12, 2014 · national
KR 10-2014-0128478 · Sep 25, 2014 · national
KR 10-2014-0128481 · Sep 25, 2014 · national
KR 10-2014-0144087 · Oct 23, 2014 · national
KR 10-2014-0144088 · Oct 23, 2014 · national
Continuity (1)
Related Publication 20170263837A1 · Sep 14, 2017