IP Library › Granted Patent US 10,417,082
Granted Patent B2
US 10,417,082 · App. 15/826,857 · Granted Sep 17, 2019

Memory systems and operating method thereof

Inventor: Tae-Hoon Kim (Gyeonggi-do, KR)
Assignee: SK hynix Inc.
G06F11/079G06F11/073G06F11/0751G06F11/1048
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Quick Facts
Patent No.
US 10,417,082
App. No.
15/826,857
Granted
Sep 17, 2019
Kind
B2
Abstract

A memory system comprising: a memory device including a plurality of memory dies each having a plurality of the memory blocks; and a controller suitable for performing a command operation to the memory dies, wherein the memory device comprises means for performing an error check operation to a first data provided from the controller to store the first data the memory device.

Claims (67)

1. A memory system comprising:

a memory device including a plurality of memory blocks; and

a controller suitable for performing a command operation to the memory device,

wherein the memory device and the controller individually perform an error check operation on inputted/outputted data, and whether the inputted/outputted data includes an error is checked twice for a read operation or write operation.

2. The memory system according to claim 1 , wherein the memory device is suitable for performing the error check operation to a first data provided from the controller to store the first data the memory device, and requesting the controller to retransfer the first data without storage of the first data when an error is included in the first data.

3. The memory system according to claim 2 , wherein, when an error is not included in the first data, the memory device stores the first data in the memory blocks, and transfers to the controller a signal indicating a success of a program operation to the first data.

4. The memory system according to claim 3 , wherein, after reading the first data stored in the memory blocks, the memory device performs the error check operation for the read first data, and when the read first data include an error, the memory device stores again the first data which do not include an error, in the memory blocks.

5. The memory system according to claim 1 , wherein the memory device performs the error check operation to a second data read from the memory blocks, and transfers to the controller the second data which do not include an error.

6. The memory system according to claim 5 , wherein the memory device reads again the second data from the memory blocks when an error is included in the second data.

7. The memory system according to claim 5 , wherein the controller performs the error check operation to the second data provided from the memory device, provides to an outside the second data which do not include an error, and requests to the memory device retransfer of the second data when the second data include an error.

8. The memory system according to claim 1 ,

further comprising a monitor suitable for checking an abnormal state of one or more of the controller and the memory device,

wherein the monitor transfers to the controller and the memory device a trigger signal, which triggers the error check operations, when one or more of the controller and the memory device are in the abnormal state.

9. The memory system according to claim 8 , wherein the abnormal state is determined when requirement parameters including operation clocks, power levels, current/voltage levels, operation timings and temperature levels for the controller and the memory device exist in an abnormal range.

10. The memory system according to claim 1 ,

wherein the memory device includes a plurality of memory dies each having the plurality of memory blocks,

wherein the memory device includes buffers corresponding to the memory dies, respectively, and

wherein the buffers respectively include error check units which perform the error check operation for data to be stored in the memory dies.

11. The memory system according to claim 10 , wherein the error check operation includes a mathematical operation or a logical operation using data bits and check bits of the inputted/outputted data.

12. The memory system according to claim 11 ,

wherein the memory device further includes an interface module suitable for transferring the inputted/outputted data between the controller and the respective memory dies, and

wherein the interface module includes error check units suitable for performing the error check operations to the inputted/outputted data, and transferring the inputted/outputted data to corresponding memory dies among the memory dies.

13. A method for operating a memory system including a controller and a memory device including a plurality of memory blocks, the method comprising:

performing, individually by the memory device and the controller, an error check operation on inputted/outputted data,

wherein, whether the inputted/outputted data includes an error is checked twice for a read operation or write operation.

14. The method according to claim 13 , further comprising:

providing, from the controller to the memory device, a first data;

performing, by the memory device, the error check operation to the first data to store the first data therein; and

requesting, by the memory device to the controller, retransfer of the first data without storage of the first data when an error is included in the first data.

15. The method according to claim 14 , further comprising when an error is not included in the first data:

storing, by the memory device, the first data in the memory blocks; and

transferring, by the memory device to the controller, a signal indicating a success of a program operation to the first data.

16. The method according to claim 13 , further comprising:

performing, by the memory device, the error check operation to a second data read from the memory blocks; and

transferring, by the memory device to the controller, the second data which do not include an error.

17. The method according to claim 16 , further comprising reading again, by the memory device, the second data from the memory blocks when an error is included in the second data.

18. The method according to claim 16 , further comprising:

performing, by the controller, the error check operation to the second data provided from the memory device;

providing, by the controller to an outside, the second data which do not include an error; and

requesting, by the controller to the memory device, retransfer of the second data when the second data include an error.

19. The method according to claim 13 , further comprising:

checking, by a monitor, an abnormal state of one or more of the controller and the memory device; and

transferring, by the monitor to the controller and the memory device, a trigger signal, which triggers the error check operations, when one or more of the controller and the memory device are in the abnormal state.

20. The method according to claim 19 , wherein the abnormal state is determined when requirement parameters including operation clocks, power levels, current/voltage levels, operation timings and temperature levels for the controller and the memory device exist in an abnormal range.

21. The method according to claim 13 , wherein the error check operation includes a mathematical operation or a logical operation using data bits and check bits of the inputted/outputted data.

22. A memory system comprising:

a memory device including a plurality of memory blocks; and

a controller suitable for performing a command operation to the memory device,

wherein the memory device and the controller individually perform an error check operation on inputted/outputted data, and whether the inputted/outputted data includes an error is checked twice for a read operation or write operation.

23. The memory system according to claim 22 , wherein the memory device is suitable for performing the error check operation to a first data provided from the controller to store the first data the memory device, and requesting the controller to retransfer the first data without storage of the first data when an error is included in the first data.

24. The memory system according to claim 23 , wherein, when an error is not included in the first data, the memory device stores the first data in the memory blocks; and transfers to the controller a signal indicating a success of a program operation to the first data.

25. The memory system according to claim 22 , wherein the memory device performs the error check operation to a second data read from the memory blocks, and transfers to the controller the second data which do not include an error.

26. The memory system according to claim 22 ,

further comprising a monitor suitable for checking an abnormal state of one or more of the controller and the memory device,

wherein the monitor transfers to the controller and the memory device a trigger signal, which triggers the error check operations, when one or more of the controller and the memory device are in the abnormal state.

27. The memory system according to claim 22 ,

wherein the memory device includes a plurality of memory dies each having the plurality of memory blocks,

wherein the memory device includes buffers corresponding to the memory dies, respectively, and

wherein the buffers respectively include error check units which perform the error check operation for data to be stored in the memory dies.

28. The memory system according to claim 27 , wherein the error check operation includes a mathematical operation or a logical operation using data bits and check bits of the inputted/outputted data.

29. The memory system according to claim 24 , wherein, after reading the first data stored in the memory blocks, the memory device performs the error check operation for the read first data, and when the read first data include an error, the memory device stores again the first data which do not include an error, in the memory blocks.

30. The memory system according to claim 25 , wherein the memory device reads again the second data from the memory blocks when an error is included in the second data.

31. The memory system according to claim 25 , wherein the controller performs the error check operation to the second data provided from the memory device, provides to an outside the second data which do not include an error, and requests to the memory device retransfer of the second data when the second data include an error.

32. The memory system according to claim 26 , wherein the abnormal state is determined when requirement parameters including operation clocks, power levels, current/voltage levels, operation timings and temperature levels for the controller and the memory device exist in an abnormal range.

33. The memory system according to claim 28 ,

wherein the memory device further includes an interface module suitable for transferring the inputted/outputted data between the controller and the respective memory dies, and

wherein the interface module includes error check units suitable for performing the error check operations to the inputted/outputted data, and transferring the inputted/outputted data to corresponding memory dies among the memory dies.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 30, 2017
From: KIM, TAE-HOON
To: SK HYNIX INC.
Reel/Frame 044552/0980 →
Priority Claims (1)
KR 10-2017-0027615 · Mar 3, 2017 · national
Continuity (1)
Related Publication 20180253345A1 · Sep 6, 2018