IP Library › Granted Patent US 10,432,166
Granted Patent B2
US 10,432,166 · App. 15/616,066 · Granted Oct 1, 2019

Piezoelectric thin film resonator, filter, and multiplexer

Inventors: Jiansong Liu (Tokyo, JP); Tokihiro Nishihara (Tokyo, JP); Shinji Taniguchi (Tokyo, JP)
Assignee: TAIYO YUDEN CO., LTD.
H03H9/02015H03H3/02H03H3/04H03H9/02118H03H9/173H03H9/174H03H9/175H03H9/568H03H9/706H03H2003/0435
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Quick Facts
Patent No.
US 10,432,166
App. No.
15/616,066
Granted
Oct 1, 2019
Kind
B2
Abstract

A piezoelectric thin film resonator includes: a substrate; a piezoelectric film located on the substrate; lower and upper electrodes facing each other across at least a part of the piezoelectric film; a first insertion layer located between the lower and upper electrodes and located in at least a part of an outer peripheral region within a resonance region in which the lower and upper electrodes face each other across the piezoelectric film, the first insertion layer being not located in a center region of the resonance region; and a second insertion layer located between the lower and upper electrodes and located in at least a part of the outer peripheral region, the second insertion layer being not located in the center region, a position of an edge of the second insertion layer being different from a position of an edge of the first insertion film in the resonance region.

Claims (43)

1. A piezoelectric thin film resonator comprising:

a substrate;

a piezoelectric film located on the substrate;

a lower electrode and an upper electrode facing each other across at least a part of the piezoelectric film;

a first insertion layer located between the lower electrode and the upper electrode and located in at least a part of an outer peripheral region within a resonance region in which the lower electrode and the upper electrode face each other across the piezoelectric film, the first insertion layer being not located in a center region of the resonance region; and

a second insertion layer located between the lower electrode and the upper electrode and located in at least a part of the outer peripheral region within the resonance region, the second insertion layer being not located in the center region of the resonance region, a position of an inner edge of the second insertion layer in the resonance region being different from a position of an inner edge of the first insertion film in the resonance region in a plan view,

wherein the first insertion layer and the second insertion layer have different acoustic impedances.

2. The piezoelectric thin film resonator according to claim 1 , wherein

the first insertion layer and the second insertion layer are in contact with each other.

3. The piezoelectric thin film resonator according to claim 2 , wherein

the piezoelectric film includes a lower piezoelectric film and an upper piezoelectric film located on the lower piezoelectric film, and

the first insertion layer and the second insertion layer is inserted between the lower piezoelectric film and the upper piezoelectric film.

4. The piezoelectric thin film resonator according to claim 1 , wherein

the first insertion layer and the second insertion layer have different permittivities.

5. The piezoelectric thin film resonator according to claim 1 , wherein

the first insertion layer and the second insertion layer are separated across a part of the piezoelectric film.

6. The piezoelectric thin film resonator according to claim 1 , wherein

the piezoelectric film includes a lower piezoelectric film and an upper piezoelectric film located on the lower piezoelectric film, and

at least one of the first insertion layer and the second insertion layer is inserted between the lower piezoelectric film and the upper piezoelectric film.

7. The piezoelectric thin film resonator according to claim 1 , wherein

at least one of the first insertion layer and the second insertion layer is located between the piezoelectric film and the lower electrode or between the piezoelectric film and the upper electrode.

8. The piezoelectric thin film resonator according to claim 1 , wherein

at least one of the first insertion layer and the second insertion layer is an air layer.

9. The piezoelectric thin film resonator according to claim 1 , wherein

the resonance region is defined by a region where the lower electrode and the upper electrode face each other across the piezoelectric film;

the first insert film and the second insert film are located at an outer circumference of the resonance region and along the outer circumference of the resonance region within at least a part of a region surrounding the center region of the resonance region and overlap each other within the at least a part of the region surrounding the center region.

10. A filter comprising:

a piezoelectric thin film resonator including:

a substrate;

a piezoelectric film located on the substrate;

a lower electrode and an upper electrode facing each other across at least a part of the piezoelectric film;

a first insertion layer located between the lower electrode and the upper electrode and located in at least a part of an outer peripheral region within a resonance region in which the lower electrode and the upper electrode face each other across the piezoelectric film, the first insertion layer being not located in a center region of the resonance region; and

a second insertion layer located between the lower electrode and the upper electrode and located in at least a part of the outer peripheral region within the resonance region, the second insertion layer being not located in the center region of the resonance region, a position of an inner edge of the second insertion layer in the resonance region being different from a position of an inner edge of the first insertion film in the resonance region in a plan view,

wherein the first insertion layer and the second insertion layer have different acoustic impedances.

11. A multiplexer comprising:

a filter including a piezoelectric thin film resonator, wherein

the piezoelectric thin film resonator includes:

a substrate;

a piezoelectric film located on the substrate;

a lower electrode and an upper electrode facing each other across at least a part of the piezoelectric film;

a first insertion layer located between the lower electrode and the upper electrode and located in at least a part of an outer peripheral region within a resonance region in which the lower electrode and the upper electrode face each other across the piezoelectric film, the first insertion layer being not located in a center region of the resonance region; and

a second insertion layer located between the lower electrode and the upper electrode and located in at least a part of the outer peripheral region within the resonance region, the second insertion layer being not located in the center region of the resonance region, a position of an inner edge of the second insertion layer in the resonance region being different from a position of an inner edge of the first insertion film in the resonance region in a plan view,

wherein the first insertion layer and the second insertion layer have different acoustic impedances.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2017
From: LIU, JIANSONG; NISHIHARA, TOKIHIRO; TANIGUCHI, SHINJI
To: TAIYO YUDEN CO., LTD.
Reel/Frame 042635/0460 →
Priority Claims (1)
JP 2016-120163 · Jun 16, 2016 · national
Continuity (1)
Related Publication 20170366157A1 · Dec 21, 2017