Systems and methods for materials analysis
A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.
1. A method for the characterization of micro-textured regions in a sample containing more than one crystalline phase, comprising:
providing an x-ray diffraction system, the system having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage that includes three axes of translation and three axes of rotation, an x-ray source capable of emitting a non-collimated beam of x-rays, and a collimator operatively associated with the x-ray source, the collimator capable of converting the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than one degree in all directions, wherein the collimated beam of x-rays is directed towards a surface of a sample on the sample stage at an angle of incidence relative to the surface of the sample;
activating the pixelated area detector operatively coupled to the detector arm, the detector continuously creating an output signal, wherein the detector has a detector surface and the detector arm is an automated detector arm capable of varying the distance between the detector surface and the sample and an angle between the collimated beam of x-rays and the detector surface, wherein the detector captures quasi-parallel x-rays diffracted off the surface of the sample at an angle of reflection relative to the surface of the sample, wherein the angle of reflection is different from the angle of incidence, and wherein the detector is located at the angle of reflection;
turning on the X-ray source;
moving the sample stage, the X-ray source and the detector until a portion of the collimated beam of X-rays is diffracted from the sample into the detector; and
sending the output signal to a computer.
2. The method of claim 1 , wherein the moving the sample stage is translation and further comprises the step of translating the sample stage in one hundred micrometer increments along all three axes of translation.
3. The method of claim 2 , wherein the computer quantifies the shape, size, density and orientation of the micro-textured regions in the sample.
4. The method of claim 1 , wherein the moving the sample stage is rotation and further comprises the step of rotating the sample stage in one hundred micrometer increments along one axis of rotation.
5. The method of claim 4 , wherein the computer quantifies the shape, size, density and orientation of the micro-textured regions in the sample.