Method for monitoring environmental states of a microscope sample with an electron microscope sample holder
An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
1. An electron microscope sample holder comprising:
a specimen tip defining a cell; and
a fiber optic sensor assembly comprising a fiber optic cable and a sensor end carried by the fiber optic cable, the sensor end positioned in the specimen tip.
2. The electron microscope sample holder according to claim 1 , further comprising a barrel on which the specimen tip is mounted, wherein the fiber optic cable extends from the sensor end through the barrel.
3. The electron microscope sample holder of claim 2 , wherein at least one fluidic pathway in fluid communication with the cell extends along the barrel.
4. The electron microscope sample holder of claim 3 , wherein the at least one fluidic pathway defines at least one of a fluid ingress and a fluid egress of the specimen tip.
5. The electron microscope sample holder of claim 4 , wherein the sensor end of the fiber optic sensor assembly is positioned proximal to the at least one of a fluid ingress and a fluid egress of the cell.
6. A sample support assembly for an electron microscope sample holder specimen tip, the sample support assembly comprising:
a first sample support MEMS device having a first thin membrane region;
a second sample support MEMS device having a second thin membrane region aligned with the first thin membrane region when the sample support assembly is positioned in the specimen tip, wherein the first and second sample support MEMS devices are accommodated within a fluidic reservoir.
7. The sample support assembly according to claim 6 , wherein the second sample support MEMS device is larger than the first sample support device.
8. The sample support assembly according to claim 7 , wherein the second sample support MEMS device overhangs beyond at least one side of the first sample support MEMS device when the sample support MEMS devices are positioned in the specimen tip.
9. The sample support assembly according to claim 8 , further comprising a first O-ring and a second O-ring.
10. The sample support assembly according to claim 9 , wherein, when the sample support MEMS devices are positioned in the specimen tip, the first O-ring contacts the first sample support MEMS device and the second O-ring contacts the second sample support MEMS device.