Fin field effect transistors having liners between device isolation layers and active areas of the device
An integrated circuit device includes a fin-type active area protruding from a substrate; a plurality of liners sequentially covering lower side walls of the fin-type active area; a device isolation layer covering the lower side walls of the fin-type active area with the plurality of liners between the device isolation layer and the fin-type active area; and a gate insulating layer extending to cover a channel region of the fin-type active area, the plurality of liners, and the device isolation layer, and including protrusions located on portions of the gate insulating layer which cover the plurality of liners.
1. An integrated circuit device comprising:
a substrate;
a first fin active area protruding from the substrate;
a second fin active area protruding from the substrate;
a first insulating liner disposed on a first portion of the substrate and on a sidewall of the first fin active area;
a first stress liner disposed on the first insulating liner;
a first device isolation layer disposed on the first stress liner;
a second insulating liner disposed on a second portion of the substrate and on a sidewall of the second fin active area;
a second stress liner disposed on the second insulating liner; and
a second device isolation layer disposed on the second stress liner,
wherein the first stress liner is a single layer formed between the first device isolation layer and the first insulating liner,
the second stress liner is a single layer formed between the second device isolation layer and the second insulating liner,
a thickness of the first insulating liner is greater than a thickness of the second insulating liner,
an upper surface of the first device isolation layer has an inclined edge portion, the inclined edge portion being closer to the substrate as a distance from the first tin active area increases, and
wherein an upper surface of the inclined edge portion is lower than an upper surface of an end portion of the first stress liner.
2. The integrated circuit device of claim 1 ,
wherein the first insulating liner is disposed on a lower portion of the sidewall of the first fin active area, and
the second insulating liner is disposed on a lower portion of the sidewall of the second fin active area.
3. The integrated circuit device of claim 1 ,
wherein an upper surface of the first device isolation layer has an inclined edge portion and a concave center portion.
4. The integrated circuit device of claim 1 ,
wherein a thickness of the first stress liner is greater than a thickness of the second stress liner.
5. The integrated circuit device of claim 1 ,
wherein a thickness of a bottom portion of the first insulating liner that is disposed on the first portion of the substrate is less than a thickness of a side portion of the first insulating liner that is disposed on the sidewall of the first fin active area.
6. The integrated circuit device of claim 1 , further comprising a first gate insulating layer disposed on the first fin active area and on the first device isolation layer,
wherein the first gate insulating layer includes a protrusion disposed on the end portion of the first stress liner.
7. The integrated circuit device of claim 6 , further comprising a first gate line disposed on the first gate insulating layer.
8. The integrated circuit device of claim 6 , wherein the first gate insulating layer has a structure that is closer to the substrate as a distance from the first fin active area increases.
9. The integrated circuit device of claim 1 ,
wherein a top surface of the first insulating liner is in contact with a sidewall of the first stress liner.
10. An integrated circuit device comprising:
a substrate;
a first fin active area protruding from the substrate;
a second fin active area protruding from the substrate;
a first insulating liner disposed on a first portion of the substrate and on a sidewall of the first fin active area;
a first stress liner disposed on the first insulating liner;
a first device isolation layer disposed on the first stress liner;
a second insulating liner disposed on a second portion of the substrate and on a sidewall of the second fin active area;
a second stress liner disposed on the second insulating liner; and
a second device isolation layer disposed on the second stress liners,
wherein the first stress liner is a single layer formed between the first device isolation layer and the first insulating liner,
the second stress liner is a single layer formed between the second device isolation layer and the second insulating liner, and
a thickness of the first stress liner is greater than a thickness of the second stress liner.
11. The integrated circuit device of claim 10 ,
wherein a thickness of a bottom portion of the first insulating liner that is disposed on the first portion of the substrate is less than a thickness of a side portion of the first insulating liner that is disposed on the sidewall of the first fin active area.
12. The integrated circuit device of claim 10 ,
wherein a thickness of the first insulating liner is greater than a thickness of the second insulating liner.
13. The integrated circuit device of claim 10 , further comprising:
a first gate insulating layer including a first protrusion disposed on an end portion of the first stress liner; and
a second gate insulating layer including a second protrusion disposed on an end portion of the second stress liner,
wherein the first protrusion is greater than the second protrusion.
14. The integrated circuit device of claim 13 , further comprising:
a first gate line disposed on the first gate insulating layer; and
a second gate line disposed on the second gate insulating layer,
wherein a thickness of the first gate line is greater than a thickness of the second gate line.
15. The integrated circuit device of claim 10 ,
wherein each of the first stress liner and the second stress liner includes SiN, SiON, SiBN, SiC, SiC:H, SiCN, SiCN:H, SiOCN, SiOCN:H, SiOC, SiO2, polysilicon, or a combination thereof.
16. The integrated circuit device of claim 10 ,
wherein each of the thickness of the first stress liner and the thickness of the second stress liner is between 10 Å to 100 Å.
17. An integrated circuit device comprising:
a substrate;
a first fin active area protruding from the substrate;
a second fin active area protruding from the substrate;
a first insulating liner disposed on a first portion of the substrate and on a sidewall of the first fin active area;
a first stress liner disposed on the first insulating liner;
a first device isolation layer disposed on the first stress liner;
a first gate insulating layer disposed on the first fin active area and on the first device isolation layer;
a second insulating liner disposed on a second portion of the substrate and on a sidewall of the second fin active area;
a second stress liner disposed on the second insulating liner;
a second device isolation layer disposed on the second stress liner; and
a second gate insulating layer disposed on the second fin active area and on the second device isolation layer,
wherein the first stress liner is a single layer formed between the first device isolation layer and the first insulating liner,
the second stress liner is a single layer formed between the second device isolation layer and the second insulating liner,
the first gate insulating layer includes a first protrusion disposed on an end portion of the first stress liner,
the second gate insulating layer includes a second protrusion disposed on an end portion of the second stress liner,
the first protrusion is greater than the second protrusion size, and
a thickness of a bottom portion of the first insulating liner that is disposed on the first portion of the substrate is less than a thickness of a side portion of the first insulating liner that is disposed on the sidewall of the first fin active area.
18. The integrated circuit device of claim 17 , further comprising:
a first gate line disposed on the first gate insulating layer; and
a second gate line disposed on the second gate insulating layer.
19. The integrated circuit device of claim 17 ,
wherein the first gate insulating layer has a structure that is closer to the substrate as a distance from the first fin active area increases.
20. The integrated circuit device of claim 17 ,
wherein a thickness of the first stress liner is greater than a thickness of the second stress liner.