Measurement device, electronic apparatus, and measurement method
A spectroscopic camera includes a wavelength variable interference filter, and an image sensor that receives light which is transmitted through the wavelength variable interference filter. Measurement is implemented a plurality of times by causing measurement light to be incident to the wavelength variable interference filter and changing the wavelength of light that is transmitted by the wavelength variable interference filter. Reflectance based on the intensity of light when a first pixel of the image sensor receives light of a target wavelength, is predicted in the respective plurality of repetitions of measurement on the basis of a light reception central wavelength of light that the first pixel receives, and reflectance that is calculated on the basis of the intensity of light that is received by the first pixel.
1. A measurement device comprising:
a wavelength variable interference filter configured to pass first, second, and third wavelengths of light incident to the wavelength variable interference filter, the light being formed by reflecting a source light from a plurality of reference subjects; and
an image sensor configured by a plurality of pixels; and
a processor configured to execute computer-readable instructions stored in a memory so as to:
receive from the image sensor detected first, second, and third intensities of the light corresponding to the first, second, and third wavelengths, respectively;
form first, second, and third images corresponding to the first, second, and third intensities; and
calculate a first difference between the first wavelength and the second wavelength based on the first image and the second image,
wherein the first pixel is a reference pixel.
2. The measurement device according to claim 1 ,
wherein each of the plurality of reference subjects has a known reflectance that is stored in the memory.
3. The measurement device according to claim 1 ,
wherein a first reference subject among the plurality of reference subjects has a first reflectance, and a second reference subject among the plurality of reference subjects has a second reflectance different from the first reflectance.
4. The measurement device according to claim 1 ,
wherein the processor is configured to calculate the first difference by using a least squares technique.
5. The measurement device according to claim 1 ,
wherein the processor is configured to generate a spectroscopic image of one of the plurality of reference subjects based on the first, second, and third images and the first difference,
the processor is configured to calculate a second difference between the second wavelength and the third wavelength based on the second image and the third image, and
the processor is configured to correct the spectroscopic image based on the second difference.
6. The measurement device according to claim 1 ,
wherein the wavelength variable interference filter is a Fabry-Perot etalon element.
7. A measurement device comprising:
a spectrometer; and
an image sensor that includes a plurality of pixels, the image sensor receiving light that is dispersed by the spectrometer,
wherein a difference between a first wavelength of light that is incident to a reference pixel among the plurality of pixels and a second wavelength of light that is incident to another one of the plurality of pixels is calculated based on each image capture result when images of a plurality of reference subjects are captured by the image sensor.
8. The measurement device according to claim 7 ,
wherein the spectrometer is a wavelength variable interference filter.