IP Library Granted Patent US 10,482,939
Granted Patent B2
US 10,482,939 · App. 15/822,877 · Granted Nov 19, 2019

Magnetic memory device and method of writing magnetic memory device

Inventors: Woo Chang Lim (Seongnam-si, KR); Kyung-Jin Lee (Seoul, KR); Gyungchoon Go (Seoul, KR); Seung-Jae Lee (Seoul, KR)
Assignees: SAMSUNG ELECTRONICS CO., LTD.; KOREA UNIVERSITY Research and Business Foundation
G11C11/16G11C11/15G11C11/161G11C11/1675G11C11/1693H01L27/222H01L43/02H01L43/08
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,482,939
App. No.
15/822,877
Granted
Nov 19, 2019
Kind
B2
Abstract

Embodiments provide a magnetic memory device and a method of writing a magnetic memory device. The magnetic memory device includes a magnetic tunnel junction including a reference layer, a free layer and a tunnel barrier layer between the reference and free layers, and a first conductive line adjacent to the free layer. A first spin-orbit current having a frequency decreasing with time flows through the first conductive line. The writing method includes applying the first spin-orbit current having the frequency decreasing with time to the first conductive line.

Claims (30)

1. A method of writing a magnetic memory device including a magnetic tunnel junction having a free layer, a reference layer, and a tunnel barrier layer between the free layer and the reference layer, and a first conductive line adjacent to the free layer, the method comprising:

applying a first spin-orbit current to the first conductive line, the first spin-orbit current being an alternating current, and

during applying, decreasing a frequency of the first spin-orbit current over time in a fixed manner.

2. The method as claimed in claim 1 , wherein:

the magnetic tunnel junction is on a first surface of the first conductive line, and

the free layer is between the tunnel barrier layer and the first surface of the first conductive line.

3. The method as claimed in claim 1 , wherein applying the first spin-orbit current applies a spin-orbit torque to a magnetic moment of the free layer.

4. The method as claimed in claim 1 , wherein:

the first spin-orbit current has an initial frequency when applying the first spin-orbit current starts,

a magnetic moment of the free layer has an initial natural frequency when applying the first spin-orbit current starts, and

the initial frequency of the first spin-orbit current is equal to or greater than the initial natural frequency of the magnetic moment of the free layer.

5. The method as claimed in claim 1 , wherein applying the first spin-orbit current generates at least two resonances at which a frequency of the first spin-orbit current coincides with a natural frequency of a magnetic moment of the free layer.

6. The method as claimed in claim 5 , wherein the frequency of the first spin-orbit current is greater than the natural frequency of the magnetic moment of the free layer between the at least two resonances.

7. The method as claimed in claim 1 , further comprising:

applying a spin-transfer current passing through the magnetic tunnel junction.

8. The method as claimed in claim 7 , wherein the spin-transfer current is applied after the applying of the first spin-orbit current.

9. The method as claimed in claim 7 , wherein the spin-transfer current and the first spin-orbit current are applied at the same time for at least a certain period of time.

10. The method as claimed in claim 1 , wherein the magnetic memory device further comprises: a second conductive line intersecting the first conductive line, the method further comprising:

applying a second spin-orbit current having a frequency decreasing with time to the second conductive line.

11. The method as claimed in claim 10 , wherein the magnetic tunnel junction is disposed on a crossing point of the first and second conductive lines.

12. The method as claimed in claim 10 , wherein the frequency of the first spin-orbit current is equal to the frequency of the second spin-orbit current.

13. The method as claimed in claim 1 , wherein applying the first spin-orbit current includes

initially applying the first spin-orbit current having an initial frequency at a first time to the first conductive line; and

subsequently applying the first spin-orbit current having a subsequent frequency, less than the initial frequency, at a second time to the first conductive line, the second time after the first time.

14. The method as claimed in claim 13 , wherein:

a magnetic moment of the free layer has an initial natural frequency when applying the first spin-orbit current starts, and

the initial frequency of the first spin-orbit current is equal to or greater than the initial natural frequency of the magnetic moment of the free layer.

15. The method as claimed in claim 13 , further comprising:

applying a spin-transfer current passing through the magnetic tunnel junction.

16. The method as claimed in claim 13 , wherein applying the first spin-orbit current generates at least two resonances at which a frequency of the first spin-orbit current coincides with a natural frequency of a magnetic moment of the free layer.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE THIRD INVENTOR PREVIOUSLY RECORDED AT REEL: 044226 FRAME: 0102. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT . Recorded Dec 14, 2017
From: LIM, WOO CHANG; LEE, KYUNG-JIN; GO, GYUNGCHOON; LEE, SEUNG-JAE
To: SAMSUNG ELECTRONICS CO., LTD.; KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
Reel/Frame 044876/0817 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 27, 2017
From: LIM, WOO CHANG; LEE, KYUNG-JIN; GO, GYUNGCHOO; LEE, SEUNG-JAE
To: SAMSUNG ELECTRONICS CO., LTD.; KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION
Reel/Frame 044226/0102 →
Priority Claims (1)
KR 10-2016-0160756 · Nov 29, 2016 · national
Continuity (1)
Related Publication 20180151212A1 · May 31, 2018