Measurement device
A measurement device includes: an optical system that splits incident light into two lights to emit one light as measurement light to a measurement object and the other light as reference light to a reference surface, and recombines the two lights to emit combined light; a light emitter that emits light entering the optical system; an imaging system that takes an image of output light emitted from the optical system; and a processor that executes measurement with regard to a predetermined measurement area of the measurement object, based on an interference fringe image taken by the imaging system, wherein the processor: obtains complex amplitude data at a predetermined position in an optical axis direction at predetermined intervals in at least a predetermined range in the optical axis direction, with regard to a specific area set in advance in the measurement area based on the interference fringe image.
1. A measurement device comprising:
an optical system that:
splits incident light into two lights,
emits one of the two lights as measurement light to a measurement object and the other as reference light to a reference surface, and
recombines the two lights and emits combined light as output light;
a light emitter that emits predetermined light entering the optical system;
an imaging system that takes an image of the output light emitted from the optical system; and
a processor that executes measurement with regard to a predetermined measurement area of the measurement object, based on an interference fringe image taken by the imaging system, wherein
the processor:
obtains a plurality of complex amplitude data at a predetermined position in an optical axis direction at predetermined intervals in at least a predetermined range in the optical axis direction, with regard to a specific area set in advance in the measurement area, based on the interference fringe image taken by the imaging system;
obtains a plurality of intensity images at the predetermined intervals with regard to the specific area, from the plurality of complex amplitude data at the predetermined intervals with regard to the specific area;
determines the predetermined position in the optical axis direction based on the plurality of obtained intensity images;
obtains complex amplitude data at the determined position with regard to the entire measurement area; and
executes measurement with regard to the measurement area based on the obtained complex amplitude data.
2. The measurement device according to claim 1 ,
wherein the processor determines a position of the specific area in the optical axis direction based on the plurality of obtained intensity images.
3. The measurement device according to claim 2 ,
wherein the specific area is a basis for measurement in the optical axis direction with regard to the measurement area.
4. The measurement device according to claim 1 ,
wherein a plurality of specific areas is set at a plurality of positions.
5. The measurement device according to claim 2 ,
wherein a plurality of specific areas is set at a plurality of positions.
6. The measurement device according to claim 3 ,
wherein a plurality of specific areas is set at a plurality of positions.
7. The measurement device according to claim 1 , further comprising:
a polarizer that produces a relative phase difference between the reference light and the measurement light, wherein
the processor executes measurement with regard to the predetermined measurement area of the measurement object, based on a plurality of interference fringe images obtained by the imaging system that takes images of the output light having a phase shifted by a plurality of times by the polarizer.
8. The measurement device according to claim 2 , further comprising:
a polarizer that produces a relative phase difference between the reference light and the measurement light, wherein
the processor executes measurement with regard to the predetermined measurement area of the measurement object, based on a plurality of interference fringe images obtained by the imaging system that takes images of the output light having a phase shifted by a plurality of times by the polarizer.
9. The measurement device according to claim 3 , further comprising:
a polarizer that produces a relative phase difference between the reference light and the measurement light, wherein
the processor executes measurement with regard to the predetermined measurement area of the measurement object, based on a plurality of interference fringe images obtained by the imaging system that takes images of the output light having a phase shifted by a plurality of times by the polarizer.
10. The measurement device according to claim 1 ,
wherein the light emitter comprises:
a first light emitter that emits first light including polarized light of a first wavelength and entering the optical system; and
a second light emitter that emits second light including polarized light of a second wavelength and entering the optical system, and
the imaging system comprises:
a first imaging system that takes the image of output light emitted from the optical system when the first light enters the optical system; and
a second imaging system that takes the image of output light emitted from the optical system when the second light enters the optical system.
11. The measurement device according to claim 2 ,
wherein the light emitter comprises:
a first light emitter that emits first light including polarized light of a first wavelength and entering the optical system; and
a second light emitter that emits second light including polarized light of a second wavelength and entering the optical system, and
the imaging system comprises:
a first imaging system that takes the image of output light emitted from the optical system when the first light enters the optical system; and
a second imaging system that takes the image of output light emitted from the optical system when the second light enters the optical system.
12. The measurement device according to claim 3 ,
wherein the light emitter comprises:
a first light emitter that emits first light including polarized light of a first wavelength and entering the optical system; and
a second light emitter that emits second light including polarized light of a second wavelength and entering the optical system, and
the imaging system comprises:
a first imaging system that takes the image of output light emitted from the optical system when the first light enters the optical system; and
a second imaging system that takes the image of output light emitted from the optical system when the second light enters the optical system.
13. The measurement device according to claim 1 ,
wherein the measurement object is a wafer substrate on which a bump is formed.
14. The measurement device according to claim 2 ,
wherein the measurement object is a wafer substrate on which a bump is formed.
15. The measurement device according to claim 3 ,
wherein the measurement object is a wafer substrate with on which a bump is formed.