IP Library Granted Patent US 10,495,734
Granted Patent B2
US 10,495,734 · App. 15/513,632 · Granted Dec 3, 2019

Position locating instrument

Inventors: Shogo Yagi (Naka, JP); Fumio Saito (Tochigi, JP); Kazunori Naganuma (Kokubunji, JP); Eiichi Sugai (Ebina, JP); Tohru Kodaira (Tokyo, JP); Akira Sawaguchi (Tokyo, JP); Hideki Hagino (Inba-gun, JP); Takeshi Watanabe (Koshigaya, JP); Noriyuki Ishidu (Noda, JP); Hiizu Takemura (Kyotanabe, JP)
Assignee: NTT ADVANCED TECHNOLOGY CORPORATION
G01S7/4814G01C15/002G01S17/10G01S17/36G01C3/08G01C7/06
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Quick Facts
Patent No.
US 10,495,734
App. No.
15/513,632
Granted
Dec 3, 2019
Kind
B2
Abstract

Provided is a position locating instrument for a position locating method in which position locating instruments that transmit and receive light beams are arranged in series connection. The position locating instruments reduce error factors and improve measurement accuracy by providing all or some of necessary position and attitude parameters. The position locating instrument has at least one light emission port through which light from a wavelength-changeable light source is emitted; and at least one light receiving port that receives light emitted or reflected by an adjacent position locating instrument. The light emitted from the light emission port has a fanlike pattern and has an emission angle varying, as a monotonic function of a wavelength of the light, in a direction perpendicular to a direction in which the light spreads in the fanlike pattern.

Claims (25)

1. A position locating instrument comprising:

at least one light emission port through which light from a wavelength-changeable light source is emitted; and

at least one light receiving port that detects light emitted or reflected by an adjacent position locating instrument,

wherein a wavelength of the wavelength-changeable light source is swept within a predetermined wavelength range in a predetermined cycle, and

the light emitted from the light emission port has a fanlike pattern and has an emission angle varying, as a monotonic function of a wavelength of the light, in a direction perpendicular to a direction in which the light spreads in the fanlike pattern,

wherein the position locating instrument detects light emitted by the adjacent position locating instrument, or detects light reflected by the adjacent position locating instrument, and then detects the wavelength of the detected light by measuring a time difference between two timings of detecting light of a predetermined wavelength in one cycle of the wavelength sweeping so that at least one of parameters for relative positional relation and attitude of the position locating instrument is measured.

2. The position locating instrument according to claim 1 , wherein

output light from the wavelength-changeable light source is light-power-modulated with a particular frequency, and

a distance to the adjacent position locating instrument is obtained by

detecting, as a reference signal, variation in the intensity of light before the light is emitted,

detecting, as a reflection signal, variation in the intensity of light reflected by the adjacent position locating instrument including an optical reflection element, and

obtaining a phase difference between the reference signal and the reflection signal for at least two frequencies.

3. The position locating instrument according to claim 1 , wherein

the adjacent position locating instrument is provided with at least two light receiving ports at different positions apart with a predetermined space in a direction in which the position locating instrument emitting light varies the emission angle, and

a distance between the two position locating instruments is obtained by measuring a time difference between two timings of receiving light at each of the two light receiving ports.

4. The position locating instrument according claim 1 , wherein

the position locating instrument emits light from at least one of a forward face and a backward face thereof in at least two patterns of light emission angle variation, and

directions of the light emission angle variation are orthogonal to each other.

5. The position locating instrument according to claim 1 , further comprising the wavelength-changeable light source, wherein the position locating instrument receives light reflected by an optical reflection element provided to an excavator located at a head of a tunnel.

6. A position locating system comprising:

a master device having a wavelength-changeable light source for emitting wavelength-changeable light to an optical fiber; and

a plurality of position locating instruments connected to each other in series connection,

wherein each position locating instrument is configured to receive the wavelength-changeable light via the optical fiber, split the wavelength-changeable light to emit part of the light through at least one light emission port, and pass the rest of the light to lower-side position locating instrument via an optical fiber, and includes at least one light receiving port that detects light emitted or reflected by an adjacent position locating instrument,

the light emitted from the light emission port has a fanlike pattern and has an emission angle varying, as a monotonic function of a wavelength of the light, in a direction perpendicular to a direction in which the light spreads in the fanlike pattern, and

a wavelength of light detected by the position locating instrument after being emitted by the adjacent position locating instrument, or a wavelength of light detected by the position locating instrument after being emitted by the position locating instrument and then reflected by the adjacent position locating instrument is obtained so that at least one of parameters for relative positional relation and attitude of the position locating instrument is measured.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2017
From: YAGI, SHOGO; SAITO, FUMIO; NAGANUMA, KAZUNORI; SUGAI, EIICHI; KODAIRA, TOHRU; SAWAGUCHI, AKIRA; HAGINO, HIDEKI; WATANABE, TAKESHI; ISHIDU, NORIYUKI; TAKEMURA, HIIZU
To: NTT ADVANCED TECHNOLOGY CORPORATION
Reel/Frame 042076/0200 →
Priority Claims (1)
JP 2015-001062 · Jan 6, 2015 · national
Continuity (1)
Related Publication 20170299698A1 · Oct 19, 2017