IP Library › Granted Patent US 10,497,384
Granted Patent B2
US 10,497,384 · App. 15/900,144 · Granted Dec 3, 2019

Magnetic tape device and reproducing method employing TMR reproducing head and magnetic tape with characterized magnetic layer

Inventors: Norihito Kasada (Minami-ashigara, JP); Eiki Ozawa (Minami-ashigara, JP)
Assignee: FUJIFILM Corporation
G11B5/3909G11B5/00813G11B5/00817G11B5/21G11B5/70G11B5/78
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Quick Facts
Patent No.
US 10,497,384
App. No.
15/900,144
Granted
Dec 3, 2019
Kind
B2
Abstract

A magnetic tape device includes a magnetic tape; and a Tunneling Magnetoresistive (PAR) head as a reproducing head, in which the center line average surface roughness Ra measured regarding a surface of the magnetic layer of the magnetic tape is equal to or smaller than 2.0 nm, the logarithmic decrement acquired by a pendulum viscoelasticity test performed regarding the surface of the magnetic layer is equal to or smaller than 0.050, and ΔSFD in a longitudinal direction of the magnetic tape calculated by Expression 1: ΔSFD=SFD 25° C. −SFD −190° C. is equal to or smaller than 0.50, wherein, in Expression 1, the SFD 25° C. is a switching field distribution SFD measured in a longitudinal direction of the magnetic tape at a temperature of 25° C., and the SFD −190° C. is a switching field distribution SFD measured in a longitudinal direction of the magnetic tape at a temperature of −190° C.

Claims (51)

1. A magnetic tape device comprising:

a magnetic tape; and

a reproducing head,

wherein the reproducing head is a magnetic head including a tunnel magnetoresistance effect type element as a reproducing element,

the magnetic tape includes a non-magnetic support, and a magnetic layer including ferromagnetic powder and a binding agent on the non-magnetic support,

a center line average surface roughness Ra measured regarding a surface of the magnetic layer is equal to or smaller than 2.0 nm,

a logarithmic decrement acquired by a pendulum viscoelasticity test performed regarding the surface of the magnetic layer is equal to or smaller than 0.050, and

ΔSFD in a longitudinal direction of the magnetic tape calculated by Expression 1 is equal to or smaller than 0.50,

ΔSFD=SFD 25° C. −SFD −190° C.   Expression 1

in Expression 1, the SFD 25° C. is a switching field distribution SFD measured in a longitudinal direction of the magnetic tape at a temperature of 25° C., and the SFD −190° C. is a switching field distribution SFD measured in a longitudinal direction of the magnetic tape at a temperature of −190° C.

2. The magnetic tape device according to claim 1 ,

wherein the logarithmic decrement is 0.010 to 0.050.

3. The magnetic tape device according to claim 2 ,

wherein the center line average surface roughness Ra measured regarding the surface of the magnetic layer is 1.2 nm to 2.0 nm.

4. The magnetic tape device according to claim 3 ,

wherein the ΔSFD is 0.03 to 0.50.

5. The magnetic tape device according to claim 2 ,

wherein the ΔSFD is 0.03 to 0.50.

6. The magnetic tape device according to claim 1 ,

wherein the center line average surface roughness Ra measured regarding the surface of the magnetic layer is 1.2 nm to 2.0 nm.

7. The magnetic tape device according to claim 6 ,

wherein the ΔSFD is 0.03 to 0.50.

8. The magnetic tape device according to claim 1 ,

wherein the ΔSFD is 0.03 to 0.50.

9. The magnetic tape device according to claim 1 ,

wherein the magnetic tape includes a non-magnetic layer including non-magnetic powder and a binding agent between the non-magnetic support and the magnetic layer.

10. A magnetic reproducing method comprising:

reproducing information recorded on a magnetic tape by a reproducing head,

wherein the reproducing head is a magnetic head including a tunnel magnetoresistance effect type element as a reproducing element,

the magnetic tape includes a non-magnetic support, and a magnetic layer including ferromagnetic powder and a binding agent on the non-magnetic support,

a center line average surface roughness Ra measured regarding a surface of the magnetic layer is equal to or smaller than 2.0 nm,

a logarithmic decrement acquired by a pendulum viscoelasticity test performed regarding the surface of the magnetic layer is equal to or smaller than 0.050, and

ΔSFD in a longitudinal direction of the magnetic tape calculated by Expression 1 is equal to or smaller than 0.50,

ΔSFD=SFD 25° C. −SFD −190° C.   Expression 1

in Expression 1, the SFD 25° C. is a switching field distribution SFD measured in a longitudinal direction of the magnetic tape at a temperature of 25° C., and the SFD −190° C. is a switching field distribution SFD measured in a longitudinal direction of the magnetic tape at a temperature of −190° C.

11. The magnetic reproducing method according to claim 10 ,

wherein the logarithmic decrement is 0.010 to 0.050.

12. The magnetic reproducing method according to claim 11 ,

wherein the center line average surface roughness Ra measured regarding the surface of the magnetic layer is 1.2 nm to 2.0 nm.

13. The magnetic reproducing method according to claim 12 ,

wherein the ΔSFD is 0.03 to 0.50.

14. The magnetic reproducing method according to claim 11 ,

wherein the ΔSFD is 0.03 to 0.50.

15. The magnetic reproducing method according to claim 10 ,

wherein the center line average surface roughness Ra measured regarding the surface of the magnetic layer is 1.2 nm to 2.0 nm.

16. The magnetic reproducing method according to claim 15 ,

wherein the ΔSFD is 0.03 to 0.50.

17. The magnetic reproducing method according to claim 10 ,

wherein the ΔSFD is 0.03 to 0.50.

18. The magnetic reproducing method according to claim 10 ,

wherein the magnetic tape includes a non-magnetic layer including non-magnetic powder and a binding agent between the non-magnetic support and the magnetic layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2018
From: KASADA, NORIHITO; OZAWA, EIKI
To: FUJIFILM CORPORATION
Reel/Frame 044979/0944 →
Priority Claims (1)
JP 2017-029493 · Feb 20, 2017 · national
Continuity (1)
Related Publication 20180240479A1 · Aug 23, 2018