IP Library Granted Patent US 10,504,919
Granted Patent B2
US 10,504,919 · App. 15/333,401 · Granted Dec 10, 2019

Semiconductor device, electronic component, and electronic device

Inventors: Munehiro Kozuma (Kanagawa, JP); Yoshiyuki Kurokawa (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/11807H01L22/14H01L27/124H01L27/1225H01L27/1255H01L28/00H01L29/24H01L29/7869H01L29/78606H01L23/3107H01L23/544H01L24/29H01L24/32H01L24/45H01L24/48H01L24/73H01L24/92H01L2027/1189H01L2027/11838H01L2027/11875H01L2027/11879H01L2223/54486H01L2224/2919H01L2224/32245H01L2224/45139H01L2224/45144H01L2224/4847H01L2224/48247H01L2224/48463H01L2224/73265H01L2224/92247H01L2924/00014H01L2924/3511
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Quick Facts
Patent No.
US 10,504,919
App. No.
15/333,401
Granted
Dec 10, 2019
Kind
B2
Abstract

To achieve high processing capability, a semiconductor device includes first and second circuits, first to third wirings, and first to fourth transistors. The first circuit is electrically connected to the first wiring and a gate of the first transistor. One of a source and a drain of the first transistor is electrically connected to the second wiring. The other of the source and the drain of the first transistor is electrically connected to a gate of the second transistor. The second circuit is electrically connected to the first wiring and a gate of the third transistor. One of a source and a drain of the third transistor is electrically connected to the third wiring. The other of the source and the drain of the third transistor is electrically connected to a gate of the fourth transistor. One of a source and a drain of the fourth transistor is electrically connected to one of a source and a drain of the second transistor. The other of the source and the drain of the fourth transistor is electrically connected to the other of the source and the drain of the second transistor.

Claims (38)

1. A semiconductor device comprising:

a first circuit and a second circuit;

a first wiring, a second wiring, and a third wiring; and

a first transistor, a second transistor, a third transistor, and a fourth transistor,

wherein:

the first circuit is electrically connected to the first wiring,

the first circuit is electrically connected to a gate of the first transistor,

one of a source and a drain of the first transistor is electrically connected to the second wiring,

the other of the source and the drain of the first transistor is electrically connected to a gate of the second transistor,

the second circuit is electrically connected to the first wiring,

the second circuit is electrically connected to a gate of the third transistor,

one of a source and a drain of the third transistor is electrically connected to the third wiring,

the other of the source and the drain of the third transistor is electrically connected to a gate of the fourth transistor,

one of a source and a drain of the fourth transistor is electrically connected to one of a source and a drain of the second transistor, and

the other of the source and the drain of the fourth transistor is electrically connected to the other of the source and the drain of the second transistor.

2. The semiconductor device according to claim 1 , wherein the first transistor and the third transistor each comprise an active layer containing an oxide semiconductor.

3. The semiconductor device according to claim 1 ,

wherein:

the first circuit comprises a fifth transistor and a first capacitor,

the second circuit comprises a sixth transistor and a second capacitor,

the fifth transistor and the sixth transistor each comprise an active layer containing an oxide semiconductor,

one of a source and a drain of the fifth transistor is electrically connected to the first wiring,

the other of the source and the drain of the fifth transistor is electrically connected to the gate of the first transistor,

the gate of the first transistor is electrically connected to one terminal of the first capacitor,

one of a source and a drain of the sixth transistor is electrically connected to the first wiring,

the other of the source and the drain of the sixth transistor is electrically connected to the gate of the third transistor, and

the gate of the third transistor is electrically connected to one terminal of the second capacitor.

4. The semiconductor device according to claim 3 , further comprising a seventh transistor and an eighth transistor,

wherein one of a source and a drain of the seventh transistor is electrically connected to the gate of the second transistor, and

wherein one of a source and a drain of the eighth transistor is electrically connected to the gate of the fourth transistor.

5. The semiconductor device according to claim 4 , wherein the seventh transistor and the eighth transistor each comprise an active layer containing an oxide semiconductor.

6. The semiconductor device according to claim 2 , wherein the oxide semiconductor comprises In, Zn, and M, where M is at least one of Al, Ti, Ga, Sn, Y, Zr, La, Ce, Nd, and Hf.

7. An electronic component comprising:

the semiconductor device according to claim 1 ; and

a lead electrically connected to the semiconductor device.

8. An electronic device comprising:

the electronic component according to claim 7 ; and

at least one of a display device, a touch panel, a microphone, a speaker, an operation key, and a housing.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 31, 2016
From: KOZUMA, MUNEHIRO; KUROKAWA, YOSHIYUKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 040178/0069 →
Priority Claims (1)
JP 2015-214977 · Oct 30, 2015 · national
Continuity (1)
Related Publication 20170125440A1 · May 4, 2017