IP Library › Granted Patent US 10,505,514
Granted Patent B2
US 10,505,514 · App. 15/950,583 · Granted Dec 10, 2019

Piezoelectric thin film and bulk acoustic wave filter

Inventors: Yukari Inoue (Tokyo, JP); Tomohiro Terada (Tokyo, JP); Junichi Kimura (Tokyo, JP)
Assignee: QUALCOMM Incorporated
H03H9/02031H01L41/187H03H9/175H03H9/205H03H9/562H03H9/564H03H9/589H01L41/18H03H9/0504
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Quick Facts
Patent No.
US 10,505,514
App. No.
15/950,583
Granted
Dec 10, 2019
Kind
B2
Abstract

A piezoelectric thin film comprises aluminum nitride containing a monad and at least one type among a tetrad and a pentad. The piezoelectric thin film having a large electromechanical coupling factor and a small stiffness.

Claims (16)

1. A piezoelectric thin film comprising aluminum nitride containing a monad and at least one type from among a tetrad and a pentad.

2. The piezoelectric thin film according to claim 1 , wherein the aluminum nitride contains at least one type selected from the group consisting of vanadium, niobium, and tantalum as the pentad.

3. The piezoelectric thin film according to claim 2 , wherein the aluminum nitride contains at least one type from among zirconium and hafnium as the tetrad.

4. The piezoelectric thin film according to claim 1 , wherein the aluminum nitride contains at least one type from among zirconium and hafnium as the tetrad.

5. A bulk acoustic wave filter comprising:

a substrate;

a piezoelectric thin film disposed on the substrate, the piezoelectric thin film including aluminum nitride containing a monad and at least one type from among a tetrad and a pentad; and

a pair of electrodes,

wherein the piezoelectric thin film is disposed between the pair of electrodes.

6. The bulk acoustic wave filter according to claim 5 , wherein the aluminum nitride contains at least one type selected from the group consisting of vanadium, niobium, and tantalum as the pentad.

7. The bulk acoustic wave filter according to claim 6 , wherein the aluminum nitride contains at least one type from among zirconium and hafnium as the tetrad.

8. The bulk acoustic wave filter according to claim 5 , wherein the aluminum nitride contains at least one type from among zirconium and hafnium as the tetrad.

9. The bulk acoustic wave filter according to claim 5 , further comprising an acoustic mirror on the substrate, wherein the piezoelectric thin film and the pair of electrodes form a resonator, and the resonator is disposed on the acoustic mirror.

10. The bulk acoustic wave filter according to claim 9 , further comprising: a second acoustic mirror on the substrate; and

a second resonator disposed on the second acoustic mirror,

wherein the second acoustic mirror is spaced apart from the first acoustic mirror.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2019
From: INOUE, YUKARI; TERADA, TOMOHIRO; KIMURA, JUNICHI
To: TDK CORPORATION
Reel/Frame 050861/0337 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 13, 2018
From: TDK CORPORATION
To: SNAPTRACK, INC.
Reel/Frame 046066/0794 →
Continuity (1)
Related Publication 20190319604A1 · Oct 17, 2019
Cited By (1)
US 12,407,325