Semiconductor device
A semiconductor device is provided. The semiconductor device includes first and second logic cells adjacent to each other on a substrate, and a mixed separation structure extending in a first direction between the first and second logic cells. Each logic cell includes first and second active patterns that extend in a second direction intersecting the first direction and that are spaced apart from each other in the first direction, and gate electrodes extending in the first direction and spanning the first and second active patterns, and having a gate pitch. The mixed separation structure includes a first separation structure separating the first active pattern of the first logic cell from the first active pattern of the second logic cell; and a second separation structure on the first separation structure. A width of the first separation structure is greater than the gate pitch.
1. A semiconductor device comprising:
a first logic cell and a second logic cell that are adjacent to each other on a substrate; and
a mixed separation structure extending in a first direction between the first logic cell and the second logic cell,
wherein each of the first logic cell and the second logic cell comprises:
a first active pattern and a second active pattern that extend in a second direction intersecting the first direction and that are spaced apart from each other in the first direction; and
a plurality of gate electrodes extending in the first direction and spanning the first active pattern and the second active pattern, and having a gate pitch, and
wherein the mixed separation structure comprises:
a first separation structure separating the first active pattern of the first logic cell from the first active pattern of the second logic cell; and
a second separation structure on the first separation structure,
wherein a width of the first separation structure is greater than the gate pitch.
2. The semiconductor device of claim 1 , wherein the second separation structure extends in the first direction and separates the second active pattern of the first logic cell from the second active pattern of the second logic cell.
3. The semiconductor device of claim 2 , wherein
the first active pattern comprises a plurality of first source/drain regions on a first upper portion of the first active pattern,
the second active pattern comprises a plurality of second source/drain regions on a second upper portion of the second active pattern,
the second separation structure is provided between a first source/drain region of the first logic cell and a first source/drain region of the second logic cell, and
the second separation structure is provided between a second source/drain region of the first logic cell and a second source/drain region of the second logic cell.
4. The semiconductor device of claim 2 , wherein a first lowest level of a first bottom surface of the second separation structure on the second active pattern is higher than a second lowest level of a second bottom surface of the second separation structure on the first separation structure.
5. The semiconductor device of claim 1 , wherein the second active pattern is spaced apart in the first direction from the first separation structure.
6. The semiconductor device of claim 1 , wherein the second separation structure comprises a first segment and a second segment at opposite sides of the second separation structure,
wherein the first segment and the second segment are spaced apart from each other in the second direction, and
wherein a segment pitch between the first segment and the second segment is substantially the same as the gate pitch.
7. The semiconductor device of claim 1 , further comprising a first gate spacer and a second gate spacer, the first gate spacer provides on a first sidewall of the second separation structure and the second gate spacer provides on a second sidewall of the second separation structure opposite from the first sidewall.
8. The semiconductor device of claim 1 , wherein the second separation structure comprises a pair of second separation structures on the first separation structure,
wherein a separation pitch between the pair of second separation structures is substantially the same as the gate pitch.
9. The semiconductor device of claim 1 , wherein a first gate electrode of the plurality of gate electrodes is provided on the first separation structure, the first gate electrode being spaced apart in the first direction from the second separation structure,
wherein the semiconductor device further comprises a gate separation structure between the first gate electrode and the second separation structure.
10. The semiconductor device of claim 1 , wherein a first number of the first active patterns of the first logic cell is different from a second number of the first active patterns of the second logic cell.
11. A semiconductor device comprising:
a substrate including a first active region and a second active region, the first active region and the second active region being spaced apart from each other in a first direction and extending in a second direction intersecting the first direction;
a device isolation layer provided on the substrate and defining a first active pattern and a second active pattern, the first active pattern and the second active pattern extending in the second direction on the first active region and the second active region, respectively; and
a mixed separation structure spanning the first active region and the second active region and extending in the first direction,
wherein the mixed separation structure comprises:
a first separation structure selectively spanning the first active pattern except for the second active pattern; and
a second separation structure spanning the first active pattern and the second active pattern,
wherein a first level of a first bottom surface of the first separation structure is lower than a second level of a second bottom surface of the second separation structure.
12. The semiconductor device of claim 11 , further comprising a plurality of gate electrodes extending in the first direction and spanning the first active pattern and the second active pattern, and having a gate pitch,
wherein a width of the first separation structure is greater than the gate pitch.
13. The semiconductor device of claim 11 , wherein
the first active pattern comprises a plurality of first source/drain regions having a first conductivity on a first upper portion of the first active pattern, and
the second active pattern comprises a plurality of second source/drain regions having a second conductivity on a second upper portion of the second active pattern, the second conductivity being different from the first conductivity.
14. The semiconductor device of claim 11 , wherein a first lowest level of a first bottom surface of the second separation structure on the second active pattern is higher than a second lowest level of a second bottom surface of the second separation structure on the first separation structure.
15. The semiconductor device of claim 11 , wherein the second separation structure comprises a second insulating material different from a first insulating material of the first separation structure.
16. A semiconductor device comprising:
a first logic cell and a second logic cell that are adjacent to each other on a substrate; and
a mixed separation structure extending in a first direction between the first logic cell and the second logic cell,
wherein each of the first logic cell and the second logic cell comprises:
a first active region provided with a plurality of first transistors having a first conductivity; and
a second active region provided with a plurality of second transistors having a second conductivity different from the first conductivity, and
wherein the mixed separation structure comprises:
a first separation structure separating the first active region of the first logic cell from the first active region of the second logic cell; and
a second separation structure extending in the first direction on the first separation structure and separating the second active region of the first logic cell from the second active region of the second logic cell,
wherein the second separation structure comprises a second insulating material different from a first insulating material of the first separation structure.
17. The semiconductor device of claim 16 , wherein a first level of a first bottom surface of the first separation structure is lower than a second level of a second bottom surface of the second separation structure.
18. The semiconductor device of claim 16 , wherein
the second active region is spaced apart in the first direction from the first active region, and
the first active region and the second active region extend in a second direction intersecting the first direction.
19. The semiconductor device of claim 16 , wherein the first separation structure selectively separates the first active region except for the second active region.
20. The semiconductor device of claim 16 , wherein a width of the first separation structure is greater than a pitch between a plurality of gate electrodes of the plurality of first transistors and the plurality of second transistors.