IP Library Granted Patent US 10,515,944
Granted Patent B2
US 10,515,944 · App. 16/122,762 · Granted Dec 24, 2019

Integrated circuit and method of generating integrated circuit layout

Inventors: Fong-Yuan Chang (Hsinchu County, TW); Kuo-Nan Yang (Hsinchu, TW); Chung-Hsing Wang (Hsinchu County, TW); Lee-Chung Lu (Taipei, TW); Sheng-Fong Chen (Hsinchu County, TW); Po-Hsiang Huang (Tainan, TW); Hiranmay Biswas (Kolkata, IN); Sheng-Hsiung Chen (Hsinchu County, TW); Aftab Alam Khan (Hsinchu, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
H01L27/0207G06F17/5077H01L23/5226H01L27/11807H01L2027/11881
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,515,944
App. No.
16/122,762
Granted
Dec 24, 2019
Kind
B2
Abstract

An integrated circuit includes a cell layer, a first metal layer, and a first conductive via. The cell layer includes first and second cells, each of which is configured to perform a circuit function. The first metal layer is above the cell layer and includes a first conductive feature that extends from the first cell into the second cell and that is configured to receive a supply voltage. A first conductive via interconnects the cell layer and the metal layer.

Claims (53)

1. An integrated circuit comprising:

a cell layer including first and second cells, each of which is configured to perform a circuit function;

a first metal layer above the cell layer and including a first conductive feature that extends from the first cell into the second cell and that is configured to receive a supply voltage;

a second metal layer above the first metal layer and comprising a second conductive feature that is outside the first and second cells, that extends substantially perpendicular to the first conductive feature, and that is electrically coupled to the first conductive feature; and

a first conductive via interconnecting the cell layer and the first metal layer.

2. The integrated circuit of claim 1 , further comprising:

first and second tracks, the first conductive feature extending along the first track; and

a third conductive feature configured to receive a circuit signal, wherein a distance between the first track and the third conductive feature is less than a pitch of the first and second tracks.

3. The integrated circuit of claim 1 , wherein the cell layer further includes third and fourth cells, each of which is configured to perform a circuit function,

the first metal layer further includes a third conductive feature that extends from the third cell into the fourth cell, that is configured to receive the supply voltage, and that extends along the same track as the first conductive feature.

4. The integrated circuit of claim 3 , further comprising:

first and second tracks, each of first and third conductive features extending along the first track; and

a fourth conductive feature between the first and third conductive features and configured to receive a circuit signal, wherein a distance between the first track and the third conductive feature is less than a pitch of the first and second tracks.

5. The integrated circuit of claim 1 , further comprising:

a third metal layer above the first metal layer and including a third conductive feature that extends across the first conductive feature; and

a second conductive via interconnecting the first and third conductive features.

6. The integrated circuit of claim 1 , further comprising a third metal layer above the first metal layer and including a third conductive feature that extends across the first and second cells and that is electrically coupled to the first conductive feature.

7. The integrated circuit of claim 1 , further comprising a third metal layer above the first metal layer and including:

third and fourth conductive features between first and second tracks and configured to receive a supply voltage; and

an L-shaped fifth conductive feature that is configured to receive a circuit signal and that extends along a third track and into a gap between the first and second conductive features.

8. A method of generating an integrated circuit configured according to claim 1 , the method comprising:

generating first and second cells;

generating a first conductive via such that a first end of the first conductive via is in contact with the first cell; and

generating a first conductive feature that is configured to receive a supply voltage, that is in contact with a second end of the first conductive via, and that extends from the first cell into the second cell.

9. The method of claim 8 , further comprising:

generating first and second tracks;

generating the first conductive feature that extends along the first track;

generating a second conductive feature configured to receive a circuit signal; and

generating the second conductive feature such that a distance between the first track and the second conductive feature is less than a pitch of the first and second tracks.

10. The method of claim 8 , further comprising:

generating third and fourth cells, each of which is configured to perform a circuit function; and

generating a second conductive feature that extends from the third cell into the fourth cell, that is configured to receive the supply voltage, and that extends along the same track as the first conductive feature.

11. The method of claim 8 , further comprising:

generating first and second tracks;

generating the first conductive feature such that the first conductive feature extends along the first track; and

generating a second conductive feature such that a distance between the first track and the second conductive feature is less than a pitch of the first and second tracks.

12. The method of claim 8 , further comprising:

generating a second conductive via such that a first end of the second conductive via is in contact with the first conductive feature;

generating a second conductive feature across the first conductive feature; and

generating the second conductive feature such that the second conductive feature is in contact with a second end of the second conductive via.

13. The method of claim 8 , further comprising generating a second conductive feature above the first conductive feature, across the first and second cells, and electrically coupled to the first conductive feature.

14. The method of claim 8 , further comprising generating a second conductive feature above the first conductive feature, outside the first and second cells, and electrically coupled to the first conductive feature.

15. The method of claim 8 , further comprising generating second and third conductive features above the first conductive feature and between first and second tracks, and configured to receive the supply voltage, and an L-shaped fourth conductive feature that is configured to receive a circuit signal and that extends along a third track and into a gap between the second and third conductive features.

16. The integrated circuit of claim 1 , further comprising first, second, and third tracks, wherein the first metal layer further comprises a second conductive feature configured to receive the supply voltage and third conductive feature configured to receive a circuit signal and extending into a gap between the first and second conductive features, and the first and second conductive features are between the first and second tracks and the third conductive feature extends along the third track.

17. An integrated circuit comprising:

a cell layer over a substrate and including a plurality of cells, each of which is configured to perform a circuit function;

a first metal layer above the cell layer and including first and second conductive features, each of which is configured to receive a supply voltage, and a third conductive feature configured to receive a circuit signal, wherein the third conductive feature extends into a gap between the first and second conductive features; and

first, second, and third tracks, wherein the first and second conductive features are between the first and second tracks and the third conductive feature extends along the third track.

18. The integrated circuit of claim 17 , wherein a distance between an edge of the first conductive feature and an edge of the third conductive feature is less than a pitch of the first, second, and third tracks.

19. The integrated circuit of claim 17 , further comprising:

a plurality of first conductive vias coupled to the cells; and

a plurality of second conductive vias above the first conductive vias and coupled to the first, second, and third conductive features, wherein the second conductive vias has a larger size than the first conductive vias.

20. The integrated circuit of claim 17 , further comprising a second metal layer above the first metal layer and comprising a third conductive feature, wherein the third conductive feature extends across the cells and one of the first and second conductive features and is electrically coupled to the one of the first and second conductive features.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2019
From: CHANG, FONG-YUAN; YANG, KUO-NAN; WANG, CHUNG-HSING; LU, LEE-CHUNG; CHEN, SHENG-FONG; HUANG, PO-HSIANG; BISWAS, HIRANMAY; CHEN, SHENG-HSIUNG; KHAN, AFTAB ALAM
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 048168/0309 →
Continuity (2)
Provisional Application 62585917 · Nov 14, 2017
Related Publication 20190148352A1 · May 16, 2019
Cited By (1)
US 12,363,965