IP Library Granted Patent US 10,522,713
Granted Patent B2
US 10,522,713 · App. 16/147,873 · Granted Dec 31, 2019

Light-emitting diode

Inventors: Guanying Huang (Xiamen, CN); Chun-Yi Wu (Xiamen, CN); Chaoyu Wu (Xiamen, CN); Duxiang Wang (Xiamen, CN)
Assignee: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
H01L33/14H01L25/0753H01L33/06H01L33/38H01L33/0062H01L33/30H01L2933/0016H01L2933/0066
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Quick Facts
Patent No.
US 10,522,713
App. No.
16/147,873
Granted
Dec 31, 2019
Kind
B2
Abstract

A light-emitting diode includes an epitaxial-laminated layer, including an n-type ohmic contact layer; a first n-type transition layer; a second n-type transition layer; an n-type confinement layer; an active layer; a p-type confinement layer; a p-type window layer; a first electrode over an upper surface of the epitaxial-laminated layer; and a conductive substrate located over a bottom surface of the epitaxial-laminated layer.

Claims (40)

1. A light-emitting diode, comprising:

an epitaxial-laminated layer, including:

an n-type ohmic contact layer;

a first n-type transition layer;

a second n-type transition layer;

an n-type confinement layer;

an active layer;

a p-type confinement layer;

a p-type window layer;

a first electrode over an upper surface of the epitaxial-laminated layer; and

a conductive substrate located over a bottom surface of the epitaxial-laminated layer.

2. The light-emitting diode of claim 1 , wherein: a thickness of the first n-type transition layer is greater than a thickness of the second n-type transition layer.

3. The light-emitting diode of claim 1 , wherein: the first and the second n-type transition layers comprise an AlGaInP layer.

4. The light-emitting diode of claim 1 , further comprising a conductive layer over a surface of the n-type ohmic contact layer, wherein: a portion of the n-type ohmic contact layer and the first n-type transition layer are removed, thereby forming a current distribution adjustment structure such that injected current does not flow towards a portion of the epitaxial-laminated layer.

5. The light-emitting diode of claim 4 , wherein: the first electrode is corresponding to a position of the current distribution adjustment structure.

6. The light-emitting diode of claim 5 , wherein: a relationship between a width of the first electrode W 1 and a width of the current distribution adjustment structure W 2 is: 1<W 2 /W 1 .

7. The light-emitting diode of claim 5 , wherein: a relationship between an area of the first electrode W 1 and an area of the current distribution adjustment structure W 2 is: W 2 /W 1 =1.2.

8. The light-emitting diode of claim 4 , wherein: the conductive layer is over an upper surface of the n-type ohmic contact layer, and the first electrode is on the conductive layer.

9. The light-emitting diode of claim 8 , wherein: the conductive layer is a transparent conductive layer or a metal extension finger.

10. The light-emitting diode of claim 8 , wherein: the conductive layer also extends and passes through the n-type ohmic contact layer to form a groove.

11. The light-emitting diode of claim 10 , wherein: the first electrode is located in the groove.

12. The light-emitting diode of claim 8 , wherein: a thickness of the p-type window layer is less than 0.5 μm.

13. The light-emitting diode of claim 4 , wherein: the conductive layer is over a bottom surface of the n-type ohmic contact layer, and the first electrode is over an upper surface of the epitaxial-laminated layer.

14. The light-emitting diode of claim 13 , wherein: the conductive layer is a metal bonding layer, and having a portion corresponding to a position of the first electrode that extends upwards and passes through the n-type ohmic contact layer and the first n-type transition layer, thereby forming the current distribution adjustment structure such that injected current does not flow towards the epitaxial-laminated layer underneath the first electrode.

15. The light-emitting diode of claim 14 , further comprising a mirror system, located between the n-type ohmic contact layer and the metal bonding layer, which extends towards the current distribution adjustment structure and covers an upper surface of the current distribution adjustment structure.

16. The light-emitting diode of claim 1 , further comprising a mirror system located between the epitaxial-laminated layer and the conductive substrate.

17. The light-emitting diode of claim 16 , further comprising a second electrode over a bottom surface of the conductive substrate.

18. The light-emitting diode of claim 1 , wherein: the epitaxial-laminated layer further an n-type etching-stop layer between the first n-type transition layer and the second n-type transition layer.

19. The light-emitting diode of claim 18 , wherein: a relationship between a total thickness of the n-type etching-stop layer and the second n-type transition layer T 1 and a thickness of the first n-type transition layer T 2 is: 5≤T 2 /T 1 ≤30.

20. A light-emitting system comprising a plurality of light-emitting diodes (LEDs), each LED including:

an epitaxial-laminated layer, including:

an n-type ohmic contact layer;

a first n-type transition layer;

a second n-type transition layer;

an n-type confinement layer;

an active layer;

a p-type confinement layer;

a p-type window layer;

a first electrode over an upper surface of the epitaxial-laminated layer; and

a conductive substrate located over a bottom surface of the epitaxial-laminated layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 20, 2023
From: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
To: QUANZHOU SANAN SEMICONDUCTOR TECHNOLOGY CO., LTD.
Reel/Frame 065302/0223 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 1, 2018
From: HUANG, GUANYING; WU, CHUN-YI; WU, CHAOYU; WANG, DUXIANG
To: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
Reel/Frame 047014/0483 →
Priority Claims (1)
CN 2015 1 0674946 · Oct 19, 2015 · national
Continuity (3)
Continuation In Part 15667609 · Aug 2, 2017
Continuation PCTCN2016097760 · Sep 1, 2016
Related Publication 20190044026A1 · Feb 7, 2019