Solid-state imaging device, method of driving solid-state imaging device, and electronic device
The present technology is concerned with a solid-state imaging device, a method of driving a solid-state imaging device, and an electronic device which are capable of reducing power supply noise of a pixel signal with a single-ended circuit arrangement. The solid-state imaging device includes a pixel section including a plurality of unit pixels disposed for photoelectric transduction, a power supply noise detector detecting a noise component from a power supply used to energize the unit pixels and outputting a single-ended canceling signal including a canceling component for canceling the noise component, a sample and hold section configured to sample single-ended pixel signals output from the unit pixels and hold and output pixel signals representing the sampled pixel signals from which the noise component has been removed on the basis of the canceling signal, and an A/D converter performing A/D conversion on the pixel signals that have been held. The present technology is applicable to a CMOS image sensor, for example.
1. A solid-state imaging device comprising:
a pixel section including a plurality of unit pixels disposed for photoelectric transduction;
a power supply noise detector that detects a noise component from a power supply used to energize said unit pixels and outputs a single-ended canceling signal including a canceling component for canceling said noise component;
a sample and hold circuit that samples single-ended pixel signals output from said unit pixels and hold and output holds and outputs pixel signals representing the sampled pixel signals from which said noise component has been removed based on the canceling signal; and
an A/D converter that performs A/D (Analog/Digital) conversion on the pixel signals that have been held,
wherein said power supply noise detector includes
a first electric charge storage section configured to store an electric charge based on the pixel signals, and
a second electric charge storage section configured to store an electric charge based on said canceling signal, said second electric charge storage section having a reference potential shared with said first electric charge storage section.
2. The solid-state imaging device according to claim 1 , wherein said second electric charge storage section stores a canceling electric charge of substantially a same quantity as a noise electric charge stored in said first electric charge storage section by said noise component of the pixel signal, by way of said canceling component of said canceling signal during a sampling period of said pixel signal.
3. The solid-state imaging device according to claim 2 , wherein, during a holding period of said pixel signal, said sample and hold section cancels out said noise electric charge stored in said first electric charge storage section during said sampling period and said canceling electric charge stored in said second electric charge storage section during said sampling period.
4. The solid-state imaging device according to claim 1 , wherein
said canceling component is a component representing said noise component amplified by a predetermined gain, and
the capacity of said second electric charge storage section is smaller than the capacity of said first electric charge storage section by a degree corresponding to said pre-determined gain.
5. The solid-state imaging device according to claim 4 , wherein the phase of said canceling component is a phase inverted from the phase of said noise component.
6. The solid-state imaging device according to claim 5 , wherein said power supply noise detector includes an adjusting mechanism adjusting said gain and the phase of said canceling component.
7. The solid-state imaging device according to claim 1 , wherein an end of said second electric charge storage section, which is different from the end thereof that is set to said reference potential, is connected to the output of said power supply noise detector through a first switch, which is turned on during a sampling period of said pixel signal, and is connected to an end of said first electric charge storage section, which is different from the end thereof that is set to said reference potential through a second switch, which is turned on during a holding period of said pixel signal.
8. The solid-state imaging device according to claim 1 , wherein
said power supply noise detector includes
a first output outputting said canceling signal, and
a second output outputting a single-ended reference signal representing a bias voltage of said canceling signal, and
an end of said second electric charge storage section, which is different from the end thereof that is set to said reference potential, is connected to said first output through a first switch, which is turned on during a sampling period of said pixel signal, and is connected to said second output through a second switch is, which is turned on during a holding period of said pixel signal.
9. A method of driving a solid-state imaging device, comprising:
detecting a noise component from a power supply used to energize a plurality of unit pixels disposed for photoelectric transduction, and outputting a single-ended canceling signal including a canceling component for canceling said noise component;
sampling single-ended pixel signals output from said unit pixels and holding and outputting pixel signals representing the sampled pixel signals from which said noise component has been removed based on the canceling signal; and
performing A/D (Analog/Digital) conversion on the pixel signals that have been held,
wherein said detecting includes:
storing an electric charge based on the pixel signals in a first electric charge storage section, and
storing an electric charge based on said canceling signal in a second electric charge storage section, said second electric charge storage section having a reference potential shared with said first electric charge storage section.
10. An electronic device comprising:
a solid-state imaging device including
a pixel section including a plurality of unit pixels disposed for photoelectric transduction,
a power supply noise detector that detects a noise component from a power supply used to energize said unit pixels and outputs a single-ended canceling signal including a canceling component for canceling said noise component,
a sample and hold circuit that samples single-ended pixel signals output from said unit pixels and holds and outputs pixel signals representing the sampled pixel signals from which said noise component has been removed based on the canceling signal, and
an A/D converter that performs A/D (Analog/Digital) conversion on the pixel signals that have been held,
wherein said power supply noise detector includes
a first electric charge storage section configured to store an electric charge based on the pixel signals, and
a second electric charge storage section configured to store an electric charge based on said canceling signal, said second electric charge storage section having a reference potential shared with said first electric charge storage section.