IP Library › Granted Patent US 10,543,869
Granted Patent B2
US 10,543,869 · App. 16/139,664 · Granted Jan 28, 2020

Electronic control unit and electric power steering apparatus equipped with the same

Inventors: Shin Kumagai (Tokyo, JP); Kyosho Uryu (Tokyo, JP); Nobuhiko Ando (Tokyo, JP)
Assignee: NSK LTD.
B62D5/0484B62D5/04B62D5/046B62D5/0487B62D6/00G01R31/3275H02M1/32H02M1/36H02M7/48H02M7/53871H02P27/06H02P27/08H02P29/0241H03K17/0822B60Y2400/3086B62D5/0463
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Quick Facts
Patent No.
US 10,543,869
App. No.
16/139,664
Granted
Jan 28, 2020
Kind
B2
Abstract

An electronic control unit diagnoses a short failure of an inverter FETs and diagnoses whether the failure of the FET-short detecting section has occurred. The unit controls a motor through an inverter including a bridge having an upper-stage FETs and a lower-stage FETs via an MCU, having: an FET-short detecting section to detect a short failure of the upper-stage FETs and the lower-stage FETs based on respective connection point voltages of the upper-stage FETs and the lower-stage FETs; and a diagnostic function to detect a failure of the FET-short detecting section. The diagnostic function diagnoses the failure of the FET-short detecting section at start up and turns-OFF the upper-stage FETs and the lower-stage FETs when the failure is detected. The FET-short detecting section diagnoses the short failure of the upper-stage FETs and the lower-stage FETs when the failure of the FET-short detecting section is not detected.

Claims (22)

1. An electronic control unit that driving-controls a motor, via an inverter comprising a bridge of upper-stage field-effect transistors (FETs) and lower-stage FETs, by inputting a duty signal of a pulse width modulation (PWM) calculated in a micro controller unit (MCU) into a gate driving section, comprising:

an FET-short detecting section which detects a short failure of at least one side of said upper-stage FETs and said lower-stage FETs based on voltage-divided voltages obtained by voltage-dividing connection point voltages of said upper-stage FETs and said lower-stage FETs by using diagnostic resistor voltage-dividing circuit, and outputs an error notification; and

a detecting-section-failure diagnostic function which is included in said MCU, and detects a failure of said FET-short detecting section,

wherein said FET-short detecting section comprising:

a serial peripheral interface (SPI) communication circuit;

a threshold setting section to set a threshold based on a setting signal from said SPI communication circuit;

a comparing section to compare said voltage-divided voltages with said threshold;

an AND-circuit to input a compared result of said comparing section and said duty signal;

a digital filter to input a setting changing signal, for changing a setting time, from said SPI communication circuit and an output of said AND-circuit and to judge a continuation; and

an error logical circuit that inputs a filter output of said digital filter, outputs said error notification and notifies to said MCU via an NDIAG terminal, and turns-OFF said upper-stage FETs and said lower-stage FETs via said gate driving section,

wherein said detecting-section-failure diagnostic function diagnoses said failure of said FET-short detecting section at start up and turns-OFF said upper-stage FETs and said lower-stage FETs when said failure of said FET-short detecting section is detected, and diagnoses said short failure of said upper-stage FETs and said lower-stage FETs when said failure of said FET-short detecting section is not detected.

2. The electronic control unit according to claim 1 , wherein when said short failure is detected, at least FETs which one of said short failure is not detected are turned-OFF.

3. The electronic control unit according to claim 1 , wherein said FET-short detecting section detects said short failure based on a first threshold for said upper-stage FETs and a second threshold for said lower-stage FETs.

4. The electronic control unit according to claim 2 , wherein said FET-short detecting section detects said short failure based on a first threshold for said upper-stage FETs and a second threshold for said lower-stage FETs.

5. The electronic control unit according to claim 3 , wherein said detecting-section-failure diagnostic function is a diagnostic function that outputs a gate-OFF signal which forcibly turns-OFF said inverter from said MCU at start up, forcibly establishes an abnormality condition of said short failure by calculating with said duty signals of said upper-stage FETs or said duty signals of said lower-stage FETs, and outputs a predetermined signal to said NDIAG terminal.

6. The electronic control unit according to claim 4 , wherein said detecting-section-failure diagnostic function is a diagnostic function that outputs a gate-OFF signal which forcibly turns-OFF said inverter from said MCU at start up, forcibly establishes an abnormality condition of said short failure by calculating with said duty signals of said upper-stage FETs or said duty signals of said lower-stage FETs, and outputs a predetermined signal to said NDIAG terminal.

7. The electronic control unit according to claim 5 , wherein said detecting-section-failure diagnostic function has a diagnostic function that outputs a signal which forcibly transits said error notification from said MCU to an FET-short detecting state in order to confirm being capable of turning-OFF and stopping said inverter in a case that said FET-short detecting section detects said short failure, calculates with said duty signals of said upper-stage FETs or said duty signals of said lower-stage FETs, monitors said connection point voltages, and diagnoses that a stop of said inverter is completed.

8. The electronic control unit according to claim 6 , wherein said detecting-section-failure diagnostic function has a diagnostic function that outputs a signal which forcibly transits said error notification from said MCU to an FET-short detecting state in order to confirm being capable of turning-OFF and stopping said inverter in a case that said FET-short detecting section detects said short failure, calculates with said duty signals of said upper-stage FETs or said duty signals of said lower-stage FETs, monitors said connection point voltages, and diagnoses that a stop of said inverter is completed.

9. The electronic control unit according to claim 1 , wherein a dark current suppressing switch is further interposed between control system circuits, said MCU switches-ON said dark current suppressing switch at start up, said detecting-section-failure diagnostic function turns-OFF said upper-stage FETs and said lower-stage FETs when said short failure is detected, and said MCU switches-OFF said dark current suppressing switch when an operation of said MCU is stopped.

10. The electronic control unit according to claim 9 , wherein said dark current suppressing switch is transistor kind including an FET, and a parasitic diode is connected in parallel with said transistor for a reverse connection protection.

11. The electronic control unit according to claim 9 , wherein said control system circuits include at least said MCU, said resistor voltage-dividing circuit and said FET-short detecting section.

12. An electric power steering apparatus that is equipped with the electronic control unit according to claim 1 .

Priority Claims (2)
JP 2015-162093 · Aug 19, 2015 · national
JP 2015-162094 · Aug 19, 2015 · national
Continuity (2)
Division 15746682
Related Publication 20190031232A1 · Jan 31, 2019
Cited By (1)
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