Ball grid array rework
Embodiments relate to an apparatus for rework of a BGA package. Memory shape material is placed adjacent to a plurality of solder joints of the package. Stimulation is applied to the material, with the stimulation causing the material to change from a non-stimulated shape to a stimulated shape. This stimulation causes an expansion of the material. As the material expands, it exerts a tensile force on the BGA package and an adjacently positioned carrier, causing a separation of the two components, while mitigating collateral heat of adjacently positioned components.
1. An apparatus comprising:
a ball grid array (BGA) package assembled on to a printed circuit board; and
a material placed between the BGA package and the printed circuit board, wherein exposure of the material to a stimulation changes a shape of the material; and
the shape change of the material separates one or more solder joints between the BGA and the printed circuit board.
2. The apparatus of claim 1 , wherein the material is placed interstitially with respect to a matrix of solder joints between the BGA package and the printed circuit board.
3. The apparatus of claim 1 , further comprising an applicator in communication with the material, the applicator to apply a tensile force between the BGA package and the printed circuit board.
4. The apparatus of claim 3 , wherein the tensile force is controlled by a regulator in communication with the applicator.
5. The apparatus of claim 1 , wherein the material is placed around a perimeter of a matrix of solder joints between the BGA package and the printed circuit board.
6. The apparatus of claim 5 , wherein the shape change elongates the one or more solder joints.
7. The apparatus of claim 5 , wherein the stimulation of the material includes delivery of heat to the one or more solder joints.
8. The apparatus of claim 1 , wherein the stimulation is by an electrical stimulus.
9. The apparatus of claim 1 , further comprising the stimulation to elongate and separate the solder joints, including a first part of at least one solder joint to remain in communication with the BGA package and a second part of the at least one solder joint to remain in communication with the printed circuit board.
10. The apparatus of claim 1 , wherein the material is selected from the group consisting of: a memory shape alloy and a high z-axis coefficient of thermal expansion material.