Internal temperature measuring apparatus and sensor package

1. An internal temperature measuring apparatus that measures an internal temperature of a measurement object, the internal temperature measuring apparatus comprising:

a sensor package in which a MEMS chip and a temperature sensor are disposed in a bottomed tubular package, the MEMS chip comprising one or a plurality of thermopiles each of which measures a heat flux passing through a region of a bottom of the bottomed tubular package, the temperature sensor measuring a reference temperature used as temperature of a predetermined portion of the MEMS chip; and

a printed circuit board comprising an arithmetic circuit configured to calculate the internal temperature of the measurement object based on the heat flux measured by the one or the plurality of thermopiles and the reference temperature measured by the temperature sensor of the sensor package,

wherein an outer bottom face of the sensor package projects from a plate face of the printed circuit board through a through-hole made in the printed circuit board.

2. The internal temperature measuring apparatus according to claim 1 , wherein

the bottom of the bottomed tubular package comprises:

a non-heat transfer portion; and

a heat transfer portion comprising a material having a heat conductivity higher than a heat conductivity of a constituent material of the non-heat transfer portion, and

at least a part of the MEMS chip is located on the heat transfer portion.

3. The internal temperature measuring apparatus according to claim 2 , wherein the heat transfer portion comprises a metal.

4. The internal temperature measuring apparatus according to claim 1 , wherein the bottomed tubular package of the sensor package comprises a plurality of leads, in which surfaces oriented toward an identical direction at leading ends of the plurality of leads on an outside of a tubular wall of the bottomed tubular package are located on an identical plane, piercing the tubular wall, and

the sensor package is mounted on the printed circuit board using the surfaces at the leading ends of the plurality of leads.

5. The internal temperature measuring apparatus according to claim 1 , wherein the outer bottom face of the sensor package has a curved shape in which a central portion projects.

6. The internal temperature measuring apparatus according to claim 1 , wherein the bottomed tubular package is formed by mold forming.

7. The internal temperature measuring apparatus according to claim 1 , wherein an inner surface of a tubular wall of the bottomed tubular package is coated with a black material.

8. A sensor package that obtains data used to calculate an internal temperature of a measurement object, the sensor package comprising:

a bottomed tubular package;

a MEMS chip disposed in the bottomed tubular package, the MEMS chip comprising

one or a plurality of thermopiles each of which measures a heat flux passing through a region of a bottom of the bottomed tubular package; and

an arithmetic circuit configured to calculate the internal temperature of the measurement object; and

a temperature sensor disposed in the bottomed tubular package, the temperature sensor measuring a reference temperature used as temperature of a predetermined portion of the MEMS chip,

wherein

the bottomed tubular package comprises a plurality of leads, in which surfaces oriented toward an identical direction at leading ends on an outside of a tubular wall of the bottomed tubular package are located on an identical plane, piercing the tubular wall, and

the arithmetic circuit is configured to calculate the internal temperature of the measurement object using at least the measured heat flux and the measured reference temperature.