IP Library Granted Patent US 10,554,876
Granted Patent B2
US 10,554,876 · App. 15/855,785 · Granted Feb 4, 2020

Image sensor and electronic apparatus

Inventor: Masashi Nakata (Kanagawa, JP)
Assignee: Sony Corporation
H04N5/23212G02B7/34G03B13/36H01L27/14621H01L27/14623H01L27/14625H01L27/14627H04N5/2254H04N5/265H04N5/3696H04N9/045
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Quick Facts
Patent No.
US 10,554,876
App. No.
15/855,785
Granted
Feb 4, 2020
Kind
B2
Abstract

The present technology relates to an image sensor and an electronic apparatus which enable higher-quality images to be obtained. Provided is an image sensor including a plurality of pixels, each pixel including one on-chip lens, and a plurality of photoelectric conversion layers formed below the on-chip lens. Each of at least two of the plurality of photoelectric conversion layers is split, partially formed, or partially shielded from light with respect to a light-receiving surface. The pixels are phase difference detection pixels for performing AF by phase difference detection or imaging pixels for generating an image. The present technology can be applied to a CMOS image sensor, for example.

Claims (43)

1. An imaging device, comprising a pixel pair, the pixel pair comprising:

a first pixel, the first pixel comprising:

a first organic photoelectric conversion portion disposed above a semiconductor substrate;

a first light-shielding film disposed between the first organic photoelectric conversion portion and the semiconductor substrate; and

a first photodiode disposed in the semiconductor substrate;

a third photodiode disposed below the first photodiode in the semiconductor substrate; and

a second pixel, the second pixel comprising:

a second organic photoelectric conversion portion disposed above the semiconductor substrate;

a second light-shielding film disposed between the second organic photoelectric conversion portion and the semiconductor substrate;

a second photodiode disposed in the semiconductor substrate; and

a fourth photodiode disposed below the second photodiode in the semiconductor substrate,

wherein the imaging device is configured to detect a phase difference using a first output of the first organic photoelectric conversion portion and a second output of the second organic photoelectric conversion portion.

2. The imaging device according to claim 1 , wherein the first pixel is adjacent to the second pixel.

3. The imaging device according to claim 1 , further comprising:

a first on-chip lens disposed above the first organic photoelectric conversion portion; and

a second on-chip lens disposed above the second organic photoelectric conversion portion.

4. The imaging device according to claim 1 , wherein the first organic photoelectric conversion portion and the first photodiode are configured to photoelectrically convert light of different wavelengths, and wherein the second organic photoelectric conversion portion and the second photodiode are configured to photoelectrically convert light of the different wavelengths.

5. The imaging device according to claim 1 , wherein the first organic photoelectric conversion portion, the first photodiode, and the third photodiode are configured to photoelectrically convert light of different wavelengths, and wherein the second organic photoelectric conversion portion, the second photodiode, and the fourth photodiode are configured to photoelectrically convert light of the different wavelengths.

6. The imaging device according to claim 1 , wherein the first organic photoelectric conversion portion and the first light-shielding film have a same area in a plan view, and wherein the second organic photoelectric conversion portion and the second light-shielding film have a same area in a plan view.

7. The imaging device according to claim 1 , wherein the first light-shielding film includes a first electrode and the second light-shielding film includes a second electrode.

8. The imaging device according to claim 1 , wherein the first organic photoelectric conversion portion and the second photoelectric conversion portion are configured to photoelectrically convert light with a same wavelength.

9. The imaging device according to claim 8 , wherein the light is green light.

10. The imaging device according to claim 8 , wherein the light is blue light.

11. The imaging device according to claim 8 , wherein the light is red light.

12. The imaging device according to claim 8 , wherein the light is white light.

13. The imaging device according to claim 8 , wherein the light is infrared light.

14. The imaging device according to claim 8 , wherein the light is ultraviolet light.

15. An imaging apparatus, comprising:

a lens;

an imaging device comprising a pixel pair, the pixel pair comprising:

a first pixel, the first pixel comprising:

a first organic photoelectric conversion portion disposed above a semiconductor substrate;

a first light-shielding film disposed between the first organic photoelectric conversion portion and the semiconductor substrate;

a first photodiode disposed in the semiconductor substrate; and

a third photodiode disposed below the first photodiode in the semiconductor substrate; and

a second pixel, the second pixel comprising:

a second organic photoelectric conversion portion disposed above the semiconductor substrate;

a second light-shielding film disposed between the second organic photoelectric conversion portion and the semiconductor substrate;

a second photodiode disposed in the semiconductor substrate; and

a fourth photodiode disposed below the second photodiode in the semiconductor substrate,

wherein the imaging device is configured to detect a phase difference using a first output of the first organic photoelectric conversion portion and a second output of the second organic photoelectric conversion portion;

a phase difference detection section; and

a lens control section.

Priority Claims (1)
JP 2013-061952 · Mar 25, 2013 · national
Continuity (3)
Continuation 15815324 · Nov 16, 2017
Continuation 14775826
Related Publication 20180139379A1 · May 17, 2018