Method of producing semiconductor device
A method of producing a semiconductor device includes the following steps (A), (B), and (C). In the step (A), a semiconductor epitaxial wafer is prepared. The semiconductor epitaxial wafer includes a body region. In the step (B), a channel layer is formed by epitaxial growth. In the step (C), a gate insulation film is formed on the channel layer. The channel layer contains impurity at a concentration ranging from 1×10 18 cm −3 to 1×10 19 cm −3 , inclusive, and has a thickness ranging from 10 nm to 100 nm, inclusive. In the steps of (B) and (C), a condition for the epitaxial growth and a condition for forming the gate insulation film are controlled so that a thickness distribution in the channel layer and a thickness distribution in the gate insulation film are positively correlated to each other.
1. A method of producing a semiconductor device, the method comprising steps of:
(A) preparing a semiconductor epitaxial wafer which includes a semiconductor wafer, and a semiconductor layer disposed on a main surface of the semiconductor wafer, the semiconductor layer containing a first conductivity type impurity, the semiconductor epitaxial wafer including a plurality of device regions, each of which includes a body region of a second conductivity type in contact with the semiconductor layer, and a source region of the first conductivity type in contact with the body region;
(B) forming a channel layer which is in contact with at least a part of the body region by epitaxial growth of a semiconductor on a surface of the semiconductor layer; and
(C) forming a gate insulation film on the channel layer, wherein:
the channel layer contains the first conductivity type impurity at a concentration ranging from 1×10 18 cm −3 to 1×10 19 cm −3 , inclusive, and has a thickness ranging from 10 nm to 100 nm, inclusive, and
in the steps of (B) and (C), a condition for the epitaxial growth and a condition for forming the gate insulation film are controlled so that, in a plane parallel to the main surface of the semiconductor wafer, a thickness distribution in the channel layer and a thickness distribution in the gate insulation film are positively correlated to each other.
2. The method according to claim 1 , wherein the semiconductor wafer is a silicon carbide wafer, the semiconductor layer is a silicon carbide semiconductor layer, and the channel layer is constituted by a silicon carbide semiconductor.