IP Library › Granted Patent US 10,585,505
Granted Patent B2
US 10,585,505 · App. 15/562,960 · Granted Mar 10, 2020

Transparent conductive film

Inventors: Naka Tatami (Otsu, JP); Yukihiro Numata (Otsu, JP)
Assignee: TOYOBO CO., LTD.
G06F3/041B32B9/00C08J5/18C23C14/08G01N23/201G01N23/207G06F3/045H01B5/14C23C14/086
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Quick Facts
Patent No.
US 10,585,505
App. No.
15/562,960
Granted
Mar 10, 2020
Kind
B2
Abstract

Provided is a transparent conductive film including a transparent plastic film substrate and an indium-tin composite oxide transparent conductive film laminated on at least one surface of the transparent plastic film substrate, a value of the normalized integrated intensity of a diffraction peak measured by X-ray diffractometry in the (222) plane due to a crystal of the transparent conductive film being 4 to 25 cps·°/nm.

Claims (9)

1. A transparent conductive film comprising a transparent plastic film substrate and an indium-tin composite oxide transparent conductive film laminated on at least one surface of the transparent plastic film substrate, a value of normalized integrated intensity of a diffraction peak measured by X-ray diffractometry in a (222) plane due to a crystal of the transparent conductive film being 4 to 25 cps·°/nm,

wherein the value of normalized integrated intensity of the diffraction peak measured by X-ray diffractometry in a (222) plane due to the crystal of the transparent conductive film is obtained as follows:

the X-ray diffractometry is performed at an incident angle of the X-ray of 0.25°, with a scintillation counter detector scanned in an out-of-plane direction, and at a step interval of 0.02° and a measurement speed of 2.0°/min;

a diffraction peak curve in the (222) plane having a peak top at about 30.5(2θ) is obtained when the incident angle on the (222) plane is plotted as the horizontal axis and the intensity of a diffraction peak is plotted as the vertical axis;

integrated intensity of the diffraction peak in the (222) plane is calculated as an area of the diffraction peak curve in which background subtraction is performed; and

a value obtained by dividing the integrated intensity of the diffraction peak in the (222) plane by a thickness of the transparent conductive film is defined as the value of normalized integrated intensity of the diffraction peak measured by X-ray diffractometry in the (222) plane due to the crystal of the transparent conductive film.

2. The transparent conductive film according to claim 1 , wherein the indium-tin composite oxide transparent conductive film has a crystal grain size of 10 to 1000 nm.

3. The transparent conductive film according to claim 1 , wherein the indium-tin composite oxide transparent conductive film includes 0.5 to 10% by mass of tin oxide.

4. The transparent conductive film according to claim 1 , wherein the indium-tin composite oxide transparent conductive film has a thickness of 10 to 30 nm.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 29, 2017
From: TATAMI, NAKA; NUMATA, YUKIHIRO
To: TOYOBO CO., LTD.
Reel/Frame 043738/0246 →
Priority Claims (2)
JP 2015-071243 · Mar 31, 2015 · national
JP 2016-012142 · Jan 26, 2016 · national
Continuity (1)
Related Publication 20180113526A1 · Apr 26, 2018