IP Library Granted Patent US 10,600,839
Granted Patent B2
US 10,600,839 · App. 16/122,060 · Granted Mar 24, 2020

Semiconductor device including oxide semiconductor

Inventor: Yoshiyuki Kurokawa (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/14643H01L27/14609H01L27/14612H01L27/14623H01L27/14636H01L27/14667H01L29/24H01L31/0272H01L31/0322
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Quick Facts
Patent No.
US 10,600,839
App. No.
16/122,060
Granted
Mar 24, 2020
Kind
B2
Abstract

A semiconductor device including pixels arranged in a matrix of n rows and m columns, in which the pixels in the m-th column are shielded from light, is provided.

Claims (17)

1. A semiconductor device comprising:

memory elements arranged in a matrix of n rows and m columns, where each of n and m is a natural number of 2 or more,

wherein each of the memory elements comprise a transistor whose channel formation region comprises an oxide semiconductor, and

wherein the semiconductor device performs vector matrix multiplication while canceling an effect due to dark current of the memory elements.

2. The semiconductor device according to claim 1 , wherein the memory elements are configured to output pulse, depending on a threshold, so that the semiconductor device performs vector matrix multiplication.

3. A semiconductor device comprising:

memory elements arranged in a matrix of n rows and m columns, where each of n and m is a natural number of 2 or more; and

reference memory elements that are shielded from light,

wherein each of the memory elements comprise a transistor whose channel formation region comprises an oxide semiconductor, and

wherein the semiconductor device performs vector matrix multiplication while subtracting dark current of the reference memory elements.

4. The semiconductor device according to claim 3 , wherein the memory elements are configured to output pulse, depending on a threshold, so that the semiconductor device performs vector matrix multiplication.

5. A semiconductor device comprising:

memory elements arranged in a matrix of n rows and m columns, where each of n and m is a natural number of 2 or more,

wherein each of the memory elements comprise a transistor whose channel formation region comprises an oxide semiconductor,

wherein the semiconductor device performs vector matrix multiplication while canceling an effect due to dark current of the memory elements, and

wherein the semiconductor device performs smoothing processing, edge enhancement processing, or cosine transform by the vector matrix multiplication.

6. The semiconductor device according to claim 5 , wherein the memory elements are configured to output pulse, depending on a threshold, so that the semiconductor device performs vector matrix multiplication.

Priority Claims (2)
JP 2014-250013 · Dec 10, 2014 · national
JP 2014-266957 · Dec 29, 2014 · national
Continuity (3)
Continuation 15708527 · Sep 19, 2017
Division 14961181 · Dec 7, 2015
Related Publication 20190067360A1 · Feb 28, 2019
Cited By (5)
US 12,225,314 US 12,238,435 US 12,396,181 US 12,659,621 US 12,660,239