Semiconductor device
Provided is a semiconductor device having a structure with which a decrease in electrical characteristics that becomes more significant with miniaturization can be suppressed. The semiconductor device includes a first oxide semiconductor film, a gate electrode overlapping with the first oxide semiconductor film, a first gate insulating film between the first oxide semiconductor film and the gate electrode, and a second gate insulating film between the first gate insulating film and the gate electrode. In the first gate insulating film, a peak appears at a diffraction angle 2θ of around 28° by X-ray diffraction. A band gap of the first oxide semiconductor film is smaller than a band gap of the first gate insulating film, and the band gap of the first gate insulating film is smaller than a band gap of the second gate insulating film.
1. A semiconductor device comprising:
a transistor comprising:
a gate electrode;
an oxide semiconductor layer overlapping with the gate electrode; and
a first gate insulating film and a second gate insulating film between the gate electrode and the oxide semiconductor layer,
wherein the first gate insulating film has a dielectric constant higher than the second gate insulating film, and
wherein the first gate insulating film comprises crystal.
2. The semiconductor device according to claim 1 , wherein the first gate insulating film is positioned between the oxide semiconductor layer and the second gate insulating film.
3. The semiconductor device according to claim 1 , wherein the first gate insulating film comprises a hafnium oxide.
4. The semiconductor device according to claim 3 , wherein the first gate insulating film has a peak at a diffraction angle 2θ of around 28° measured with an X-ray diffraction.
5. The semiconductor device according to claim 3 , wherein a film density of the first gate insulating film is greater than or equal to 8.3 g/cm 3 and less than or equal to 9.0 g/cm 3 .
6. The semiconductor device according to claim 1 ,
wherein the oxide semiconductor layer comprises a first oxide semiconductor film, a second oxide semiconductor film, and a third oxide semiconductor film stacked in this order, and
wherein an electron affinity of the second oxide semiconductor film is higher than those of the first oxide semiconductor film and the third oxide semiconductor film.
7. The semiconductor device according to claim 1 , wherein the gate electrode comprises a pair of regions sandwiching the oxide semiconductor layer in a channel width direction of the transistor.
8. The semiconductor device according to claim 1 , wherein the first gate insulating film comprises an oxide containing one or more elements selected from the group consisting of hafnium, aluminum, tantalum, and zirconium.
9. The semiconductor device according to claim 1 , wherein the second gate insulating film comprises one or more of a magnesium oxide, a silicon oxide, a silicon oxynitride, a silicon nitride oxide, a silicon nitride, a gallium oxide, a germanium oxide, a yttrium oxide, a zirconium oxide, a lanthanum oxide, a neodymium oxide, and a tantalum oxide.
10. A semiconductor device comprising:
a transistor comprising:
a gate electrode;
an oxide semiconductor layer overlapping with the gate electrode;
a first gate insulating film between the gate electrode and the oxide semiconductor layer; and
a second gate insulating film between the gate electrode and the first gate insulating film,
wherein the first gate insulating film has a dielectric constant higher than the second gate insulating film, and
wherein the first gate insulating film comprises crystal.
11. The semiconductor device according to claim 10 , wherein the first gate insulating film is positioned between the oxide semiconductor layer and the second gate insulating film.
12. The semiconductor device according to claim 10 , wherein the first gate insulating film comprises a hafnium oxide.
13. The semiconductor device according to claim 12 , wherein the first gate insulating film has a peak at a diffraction angle 2θ of around 28° measured with an X-ray diffraction.
14. The semiconductor device according to claim 12 , wherein a film density of the first gate insulating film is greater than or equal to 8.3 g/cm 3 and less than or equal to 9.0 g/cm 3 .
15. The semiconductor device according to claim 10 ,
wherein the oxide semiconductor layer comprises a first oxide semiconductor film, a second oxide semiconductor film, and a third oxide semiconductor film stacked in this order, and
wherein an electron affinity of the second oxide semiconductor film is higher than those of the first oxide semiconductor film and the third oxide semiconductor film.
16. The semiconductor device according to claim 10 , wherein the gate electrode comprises a pair of regions sandwiching the oxide semiconductor layer in a channel width direction of the transistor.
17. The semiconductor device according to claim 10 , wherein the first gate insulating film comprises an oxide containing one or more elements selected from the group consisting of hafnium, aluminum, tantalum, and zirconium.
18. The semiconductor device according to claim 10 , wherein the second gate insulating film comprises one or more of a magnesium oxide, a silicon oxide, a silicon oxynitride, a silicon nitride oxide, a silicon nitride, a gallium oxide, a germanium oxide, a yttrium oxide, a zirconium oxide, a lanthanum oxide, a neodymium oxide, and a tantalum oxide.