Triggered operation and/or recording of test and measurement or imaging tools

1. A system including:

a test and measurement tool configured to generate measurement data;

an imaging tool configured to generate image data; and

a processor in communication with the imaging tool and the test and measurement tool configured to receive image data from the imaging tool, and

in the event that the received image data satisfies a first alarm condition, trigger the test and measurement tool to perform a first operation corresponding to the first alarm condition, and

in the event that the received image data satisfies a second alarm condition, trigger the test and measurement tool to perform a second operation, the second alarm condition being different from the first alarm condition and the second operation being different from the first operation and corresponding to the second alarm condition; and wherein

at least one of the first operation or second operation comprises acquiring measurement data corresponding to the satisfied respective first alarm condition or the second alarm condition via the test and measurement tool.

2. The system of claim 1 , wherein the imaging tool comprises the processor.

3. The system of claim 1 , wherein the test and measurement tool and the imaging tool are combined into a single apparatus.

4. The system of claim 1 , wherein the imaging tool is configured to detect infrared (IR) energy from a target scene and generate IR image data corresponding to the detected IR energy.

5. The system of claim 4 , wherein the first alarm condition or the second alarm condition comprises an alarm condition satisfied by detected IR energy from the target scene.

6. The system of claim 4 , wherein the processor is further configured to determine the amount of power dissipated as heat from an object under test based on detected IR energy from the target scene, and wherein the first alarm condition or the second alarm condition comprises the determined amount of power dissipated as heat meeting a threshold.

7. The system of claim 1 , wherein

the image data generated by the imaging tool comprises infrared image data;

the first alarm condition comprises a temperature value meeting an alarm value; and

the first operation comprises performing a power quality measurement in response to the temperature alarm detected in the image data.

8. The system of claim 1 , wherein the one or more operations performed by the test and measurement tool further includes any combination of adjusting the frequency of a measurement, duration of a measurement, or the type of measurement performed by the test and measurement tool.

9. The system of claim 1 , further comprising a display configured to display one of both of the image data and the measurement data.

10. The system of claim 9 , wherein the display is incorporated into at least one of the imaging tool or the test and measurement tool.

11. The system of claim 9 , wherein one or both of the display and the processor are included in an external device separate from the test and measurement tool and the imaging tool.

12. A system including:

a test and measurement tool configured to generate measurement data including a resistance, a current, and/or a voltage associated with a device under test;

an imaging tool configured to generate image data; and

a processor in communication with the imaging tool and the test and measurement tool configured to

receive measurement data from the test and measurement tool, the received measurement data including a current flowing through a device under test, a voltage drop present in the device under test, or a resistance of a device under test, and

in the event that the received measurement data satisfies one or more predetermined conditions, trigger the imaging tool to capture at least one image of a target scene and generate image data representative of the target scene, the target scene including the device under test; wherein

the one or more predetermined conditions comprises the current flowing through a device under test, a voltage drop present in the device under test, or a resistance of a device under test satisfying at least one predetermined condition.

13. The system of claim 12 , wherein

the imaging tool is configured to detect infrared (IR) energy from a target scene and generate IR image data corresponding to the detected IR energy.

14. The system of claim 12 , wherein the one or more predetermined conditions comprises one or more of:

(i) a resistance, current, or voltage value,

(ii) a change in a resistance, current, or voltage value, or

(iii) a rate of change in a resistance, current, or voltage value meeting a threshold.

15. The system of claim 12 , further comprising a display configured to display an image data generated in response to the received measurement data satisfying one or more predetermined conditions and the received measurement data that satisfied the one or more predetermined conditions.

16. The system of claim 12 , wherein triggering the imaging tool to generate image data representative of a target scene comprises at least one of: triggering the capturing of a single image, triggering the capture of a plurality of images, triggering the starting of a video recording, or triggering the stopping of a video recording.

17. A system including:

a test and measurement tool configured to generate measurement data, the test and measurement tool being capable of performing a power quality measurement;

an infrared imaging tool configured to generate infrared image data representing a target scene; and

a processor in communication with the imaging tool and the test and measurement tool configured to:

receive infrared image data from the infrared imaging tool; and

in the event that the received infrared image data satisfies a first alarm condition, trigger the test and measurement tool to perform a power quality measurement; wherein

the first alarm condition comprises a temperature in the target scene meeting an alarm condition.

18. The system of claim 17 , further comprising a display configured to display one of both of the image data and the measurement data.

19. The system of claim 18 , wherein the display is incorporated into at least one of the imaging tool or the test and measurement tool.

20. The system of claim 19 , wherein one or both of the display and the processor are included in an external device separate from the test and measurement tool and the imaging tool.