IP Library › Granted Patent US 10,636,762
Granted Patent B2
US 10,636,762 · App. 16/040,617 · Granted Apr 28, 2020

Method of manufacturing semiconductor device

Inventors: Takatoshi Ishikawa (Fukuoka, JP); Teppei Kojio (Fukuoka, JP)
Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
H01L24/73H01L21/67144H01L24/81H01L24/83H01L24/92H01L24/29H01L2224/13101H01L2224/13147H01L2224/16225H01L2224/2929H01L2224/29386H01L2224/32225H01L2224/73104H01L2224/73204H01L2224/75H01L2224/7565H01L2224/81011H01L2224/81205H01L2224/81801H01L2224/81815H01L2224/83024H01L2224/8388H01L2224/83191H01L2224/83205H01L2224/83855
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,636,762
App. No.
16/040,617
Granted
Apr 28, 2020
Kind
B2
Abstract

A method of manufacturing a semiconductor device includes a step of preparing a semiconductor element including a functional surface on which a bump is formed and an adhesive layer of a film shape including a flux component, a step of positioning the semiconductor element above a board including an electrode, a step of activating a flux component by applying ultrasonic vibration to the semiconductor element, a step of bringing the bump into contact with the electrode by pressing the semiconductor element to the board, and a step of bonding the bump to the electrode by continuing the application of the ultrasonic vibration and the pressing of the semiconductor element.

Claims (10)

1. A method of manufacturing a semiconductor device, comprising:

a first step of preparing a semiconductor element including a functional surface on which a bump for external connection is formed and an adhesive layer of a film shape that covers the functional surface and a top surface of the bump, the adhesive layer including a flux component;

a second step of positioning the semiconductor element in a state in which the bump and an electrode face each other above a board including the electrode to which the bump is bonded;

a third step of activating the flux component of a portion of the adhesive layer sandwiched between the top surface of the bump and the electrode by pressing the adhesive layer against the electrode and applying ultrasonic vibration to the semiconductor element while the bump and the electrode are not in contact with each other;

following the third step, a fourth step of pushing out the flux component from the portion of the adhesive layer that covers the top surface of the bump by pressing the semiconductor element while applying the ultrasonic vibration to the board, and bringing the bump into contact with the electrode; and

a fifth step of bonding the bump to the electrode by continuing the application of the ultrasonic vibration and the pressing of the semiconductor element.

2. The method of manufacturing the semiconductor device of claim 1 ,

wherein the adhesive layer includes a main agent made of a resin, a thermoplastic agent, a curing agent for curing the resin of the main agent, a curing accelerator for accelerating curing of the resin of the main agent, an organic acid, and a filler.

3. The method of manufacturing the semiconductor device of claim 1 ,

wherein a solder is formed on a surface of at least one of the bump and the electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 21, 2019
From: ISHIKAWA, TAKATOSHI; KOJIO, TEPPEI
To: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Reel/Frame 048064/0552 →
Priority Claims (1)
JP 2017-145077 · Jul 27, 2017 · national
Continuity (1)
Related Publication 20190035762A1 · Jan 31, 2019