Electronics tester

1. A testing apparatus comprising:

a frame;

a slot assembly on the frame;

a slot assembly interface on the slot assembly;

a holding structure to place a cartridge holding a plurality of microelectronic devices;

a horizontal transportation apparatus operable to move the cartridge horizontally from a first position to a second position into the slot assembly;

a vertical transportation apparatus operable to move the cartridge and the slot assembly in a first vertical direction relative to one another to engage the slot assembly interface with a cartridge interface on the cartridge; and

a tester connected through the slot assembly interface and the cartridge interface to provide at least power to each microelectronic device and to measure a performance of the microelectronic device, the vertical transportation apparatus being operable to move the cartridge and the slot assembly in a second vertical direction relative to one another, the second vertical direction being opposite to the first vertical direction to disengage the slot assembly interface from the cartridge interface, and the horizontal transportation apparatus being operable to move the cartridge horizontally from the second position to the first position out of the slot assembly.

2. The testing apparatus of claim 1 , wherein the horizontal transportation apparatus is a slide.

3. The testing apparatus of claim 1 , wherein the vertical transportation apparatus is actuated by the horizontal movement apparatus when the horizontal movement apparatus moves the cartridge into the second position.

4. The testing apparatus of claim 1 , further comprising:

a spring connected between the cartridge and the slot assembly, movement of the cartridge and the slot assembly in the first vertical direction relative to one another causing deformation of the spring against a spring force thereof; and

a locking mechanism that engages to lock the cartridge and the slot assembly in a position wherein the spring is deformed.

5. The testing apparatus of claim 4 , wherein the locking mechanism includes:

a control lever that rotates about a pivot connection; and

a pressure lever having a first link connected to the control lever and a second link connected to the spring, wherein the control lever rotates from an unlocked position, where the first link on a first side of a line connecting the pivot connection and the second link, through a compressed position, where the spring is deformed and the first link is in line with the pivot connection and the second link, to a locked position, where the first link is on a second side of the line opposing the first side.

6. The testing apparatus of claim 5 , wherein the movement of the control lever is actuated by the horizontal transportation apparatus when the horizontal movement apparatus moves the cartridge into the second position.

7. The testing apparatus of claim 6 , wherein the horizontal transportation apparatus, when moving the cartridge from the second position to the first position, causes rotation of the control lever from the locked position to the unlocked position.

8. The testing apparatus of claim 4 , wherein the spring is a beam spring.

9. The testing apparatus of claim 1 , further comprising:

a thermal chuck, wherein the relative movement of the cartridge and the slot assembly in the first vertical direction relative to one another engages the thermal chuck with the cartridge and the relative movement of the cartridge and the slot assembly in the second vertical direction relative to one another disengage the thermal chuck from the cartridge; and

at least one temperature modification device, which, when operated causes a transfer of heat between the thermal chuck and the cartridge.

10. A method of testing electronic devices comprising:

holding a cartridge holding a plurality of microelectronic devices in a first position at least partially outside a slot assembly on a frame;

moving the cartridge horizontally from the first position to a second position into a slot assembly;

moving the cartridge and the slot assembly in a first vertical direction relative to one another to engage a slot assembly interface on the slot assembly with a cartridge interface on the cartridge;

testing the microelectronic devices through the slot assembly interface and the cartridge interface by providing at least power to each microelectronic device and measuring a performance of the microelectronic device;

moving the cartridge and the slot assembly in a second vertical direction relative to one another, the second vertical direction being opposite to the first vertical direction to disengage the slot assembly interface from the cartridge interface; and

moving the cartridge horizontally from the second position to the first position out of the slot assembly.

11. The method of claim 10 , further comprising:

deforming a spring connected between the cartridge and the slot assembly, movement of the cartridge and the slot assembly in the first vertical direction relative to one another causing deformation of the spring against a spring force thereof; and

engaging a locking mechanism to lock the cartridge and the slot assembly in a position wherein the spring is deformed.

12. The method of claim 11 , further comprising:

rotating a control lever about a pivot connection to move a pressure lever having a first link connected to the control lever and a second link connected to the spring, wherein the control lever rotates from an unlocked position, where the first link on a first side of a line connecting the pivot connection and the second link, through a compressed position, where the spring is deformed and the first link is in line with the pivot connection and the second link, to a locked position, where the first link is on a second side of the line opposing the first side.

13. The method of claim 10 , further comprising:

engaging a thermal chuck with the cartridge, wherein the relative movement of the cartridge and the slot assembly in the first vertical direction relative to one another engages the thermal chuck with the cartridge and the relative movement of the cartridge and the slot assembly in the second vertical direction relative to one another disengage the thermal chuck from the cartridge; and

transferring heat between the thermal chuck and the cartridge.