IP Library › Granted Patent US 10,651,790
Granted Patent B2
US 10,651,790 · App. 16/046,277 · Granted May 12, 2020

Semiconductor device and electronic device

Inventors: Yuki Okamoto (Sagamihara, JP); Yoshiyuki Kurokawa (Sagamihara, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H03B5/06H01L27/092H01L27/1207H01L27/1225H01L27/1255H01L29/7869H03K3/014H03K3/0315
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Quick Facts
Patent No.
US 10,651,790
App. No.
16/046,277
Granted
May 12, 2020
Kind
B2
Abstract

An oscillator capable of quick startup is provided. A transistor is provided between an output terminal of a certain stage inverter and an input terminal of the following stage inverter included in the voltage controlled oscillator. With the use of the on resistance of the transistor, the oscillation frequency of the clock signal is controlled. While supply of the power supply voltage is stopped, a signal that is input to the input terminal of the inverter just before supply of the power supply voltage is stopped is stored by turning off the transistor. This operation makes it possible to immediately output a clock signal that has the same frequency as that before supply of the power supply voltage is stopped at the time when the power supply voltage is supplied again.

Claims (104)

1. A semiconductor device comprising a circuit, the circuit comprising:

a first transistor;

a second transistor;

a third transistor;

a fourth transistor;

a fifth transistor; and

a capacitor,

wherein the first transistor has a polarity different from a polarity of the second transistor,

wherein the fifth transistor has the same polarity as the second transistor,

wherein a gate of the first transistor is electrically connected to a gate of the second transistor,

wherein one of a source and a drain of the first transistor is electrically connected to one of a source and a drain of the second transistor and one of a source and a drain of the fifth transistor,

wherein a gate of the fifth transistor is directly connected to the other of the source and the drain of the first transistor,

wherein the other of the source and the drain of the fifth transistor is electrically connected to one of a source and a drain of the third transistor,

wherein a gate of the third transistor is electrically connected to one of a source and a drain of the fourth transistor and a first electrode of the capacitor, and

wherein a second electrode of the capacitor is electrically connected to the other of the source and the drain of the second transistor.

2. The semiconductor device according to claim 1 , wherein the third transistor, the fourth transistor, and the fifth transistor each comprise an oxide semiconductor in a channel formation region.

3. The semiconductor device according to claim 2 ,

wherein the oxide semiconductor comprises In, Zn, and M, and

wherein M is one of Al, Ga, Y, and Sn.

4. The semiconductor device according to claim 1 ,

wherein the other of the source and the drain of the first transistor is electrically connected to a high potential power supply line, and

wherein the other of the source and the drain of the second transistor is electrically connected to a low potential power supply line.

5. The semiconductor device according to claim 1 , wherein the second transistor comprises an oxide semiconductor in a channel formation region thereof.

6. The semiconductor device according to claim 5 ,

wherein the oxide semiconductor comprises In, Zn, and M, and

wherein M is one of Al, Ga, Y, and Sn.

7. The semiconductor device according to claim 1 ,

wherein the first transistor is a p-channel transistor, and

wherein the second transistor is an n-channel transistor.

8. The semiconductor device according to claim 1 ,

wherein the gate of the first transistor and the gate of the second transistor are electrically connected to a first terminal of the circuit, and

wherein the other of the source and the drain of the third transistor is electrically connected to a second terminal of the circuit.

9. An electronic device comprising:

the semiconductor device according to claim 1 ; and

a display device.

10. A semiconductor device comprising a circuit, the circuit comprising:

a first transistor;

a second transistor;

a third transistor;

a fourth transistor;

a fifth transistor; and

a capacitor,

wherein the first transistor has a polarity different from a polarity of the second transistor,

wherein a gate of the first transistor is electrically connected to a gate of the second transistor,

wherein one of a source and a drain of the third transistor is electrically connected to one of a source and a drain of the fifth transistor,

wherein a gate of the fifth transistor is directly connected to the other of the source and the drain of the first transistor,

wherein a gate of the third transistor is electrically connected to one of a source and a drain of the fourth transistor and a first electrode of the capacitor, and

wherein a second electrode of the capacitor is electrically connected to the other of the source and the drain of the second transistor.

11. The semiconductor device according to claim 10 , wherein the third transistor, the fourth transistor, and the fifth transistor each comprise an oxide semiconductor in a channel formation region.

12. The semiconductor device according to claim 11 ,

wherein the oxide semiconductor comprises In, Zn, and M, and

wherein M is one of Al, Ga, Y, and Sn.

13. The semiconductor device according to claim 10 ,

wherein the other of the source and the drain of the first transistor is electrically connected to a high potential power supply line, and

wherein the other of the source and the drain of the second transistor is electrically connected to a low potential power supply line.

14. The semiconductor device according to claim 10 , wherein the second transistor comprises an oxide semiconductor in a channel formation region thereof.

15. The semiconductor device according to claim 14 ,

wherein the oxide semiconductor comprises In, Zn, and M, and

wherein M is one of Al, Ga, Y, and Sn.

16. The semiconductor device according to claim 10 ,

wherein the first transistor is a p-channel transistor, and

wherein the second transistor is an n-channel transistor.

17. The semiconductor device according to claim 10 ,

wherein the gate of the first transistor and the gate of the second transistor are electrically connected to a first terminal of the circuit, and

wherein the other of the source and the drain of the third transistor is electrically connected to a second terminal of the circuit.

18. The semiconductor device according to claim 10 ,

wherein the gate of the first transistor and the gate of the second transistor are electrically connected to a first terminal of the circuit, and

wherein the other of the source and the drain of the fifth transistor is electrically connected to a second terminal of the circuit.

19. An electronic device comprising:

the semiconductor device according to claim 10 ; and

a display device.

20. A semiconductor device comprising a circuit, the circuit comprising:

a first transistor;

a second transistor;

a third transistor;

a fourth transistor;

a fifth transistor; and

a capacitor,

wherein the first transistor has a polarity different from a polarity of the second transistor,

wherein a gate of the first transistor is electrically connected to a gate of the second transistor,

wherein one of a source and a drain of the first transistor is electrically connected to one of a source and a drain of the second transistor and one of a source and a drain of the third transistor,

wherein a gate of the fifth transistor is directly connected to the other of the source and the drain of the first transistor,

wherein a gate of the third transistor is electrically connected to one of a source and a drain of the fourth transistor and a first electrode of the capacitor, and

wherein a second electrode of the capacitor is electrically connected to the other of the source and the drain of the second transistor.

21. The semiconductor device according to claim 20 , wherein the third transistor, the fourth transistor, and the fifth transistor each comprise an oxide semiconductor in a channel formation region.

22. The semiconductor device according to claim 21 ,

wherein the oxide semiconductor comprises In, Zn, and M, and

wherein M is one of Al, Ga, Y, and Sn.

23. The semiconductor device according to claim 20 ,

wherein the other of the source and the drain of the first transistor is electrically connected to a high potential power supply line, and

wherein the other of the source and the drain of the second transistor is electrically connected to a low potential power supply line.

24. The semiconductor device according to claim 20 , wherein the second transistor comprises an oxide semiconductor in a channel formation region thereof.

25. The semiconductor device according to claim 24 ,

wherein the oxide semiconductor comprises In, Zn, and M, and

wherein M is one of Al, Ga, Y, and Sn.

26. The semiconductor device according to claim 20 ,

wherein the first transistor is a p-channel transistor, and

wherein the second transistor is an n-channel transistor.

27. The semiconductor device according to claim 20 ,

wherein the gate of the first transistor and the gate of the second transistor are electrically connected to a first terminal of the circuit, and

wherein the other of the source and the drain of the fifth transistor is electrically connected to a second terminal of the circuit.

28. An electronic device comprising:

the semiconductor device according to claim 20 ; and

a display device.

Priority Claims (1)
JP 2015-213708 · Oct 30, 2015 · national
Continuity (2)
Division 15298305 · Oct 20, 2016
Related Publication 20180358925A1 · Dec 13, 2018
Cited By (1)
US 12,317,600