X-ray imaging system
An x-ray imaging system includes an x-ray source, a beam-splitting grating having a plurality of structures arranged in a two-dimensional periodic array, a stage configured to hold an object to be imaged, and an x-ray detector having a two-dimensional array of x-ray detecting elements and positioned to detect x-rays diffracted by the beam-splitting grating and perturbed by the object to be imaged.
1. An x-ray imaging system comprising:
an x-ray source configured to generate and emit x-rays in a periodic spatial pattern, the x-ray source comprising a substrate comprising a first material and a plurality of discrete structures on or embedded in the substrate, the plurality of discrete structures comprising a second material configured to generate the x-rays in response to electron irradiation, the plurality of discrete structures arranged in a two-dimensional pattern that is periodic in two directions;
a beam-splitting grating comprising a plurality of structures configured to diffract, for a predetermined x-ray wavelength, at least some of the x-rays impinging the beam splitting grating, the plurality of structures arranged in a two-dimensional array that is periodic in two directions;
a stage configured to hold an object to be imaged; and
an x-ray detector comprising a two-dimensional array of x-ray detecting elements, the x-ray detector positioned to detect x-rays diffracted by the beam-splitting grating and perturbed by the object to be imaged.
2. The x-ray imaging system of claim 1 , wherein the plurality of structures of the beam-splitting grating comprises a grid that is periodic in two orthogonal directions.
3. The x-ray imaging system of claim 1 , wherein the plurality of structures of the beam-splitting grating are configured to apply a phase shift of approximately π radians to x-rays having the predetermined x-ray wavelength.
4. The x-ray imaging system of claim 1 , wherein the plurality of structures of the beam-splitting grating are configured to apply a phase shift of approximately π/2 radians to x-rays having the predetermined x-ray wavelength.
5. The x-ray imaging system of claim 1 , wherein the object is positioned between the beam-splitting grating and the x-ray detector.
6. The x-ray imaging system of claim 1 , wherein the object is positioned between the x-ray source and the beam-splitting grating.
7. The x-ray imaging system of claim 1 , wherein the x-ray source comprises an electron beam emitter and a target, the target comprising the substrate, the plurality of discrete structures configured to generate the x-rays when irradiated by electrons from the electron beam emitter.
8. The x-ray imaging system of claim 1 , wherein one or more discrete structures of the plurality of discrete structures have a width of less than 10 microns in at least one dimension.
9. The x-ray imaging system of claim 1 , wherein one or more discrete structures of the plurality of discrete structures have a width of less than 10 microns in a first dimension and a length of greater than 20 microns in a second dimension perpendicular to the first dimension.
10. The x-ray imaging system of claim 1 , wherein a ratio (Z 2 ·ρ 2 )/(Z 1 ·ρ 1 ) for the second material and the first material is greater than 12, where Z 1 and ρ 1 are the atomic number and the mass density, respectively, of the first material and Z 2 and ρ 2 are the atomic number and the mass density, respectively of the second material.
11. The x-ray imaging system of claim 1 , wherein the first material is selected from the group consisting of: beryllium, diamond, graphite, silicon, boron nitride, silicon carbide, sapphire and diamond-like carbon.
12. The x-ray imaging system of claim 1 , wherein an orientation of at least two discrete structures of the plurality of discrete structures of the target is such that, when simultaneously bombarded by electrons from the electron beam emitter, the x-rays generated by a first discrete structure of the at least two discrete structures overlap in part the x-rays generated by a second discrete structure of the at least two discrete structures, and the overlapping x-rays propagate together towards the beam-splitting grating.
13. The x-ray imaging system of claim 1 , wherein the x-ray detector is positioned at a distance from the beam-splitting grating that corresponds to an odd multiple of 1/16 th of a Talbot Distance for the beam-splitting grating when used with spherical wave x-rays of a predetermined wavelength spectrum and spatial coherence, the x-ray detector having a spatial resolution at least three times a Talbot fringe period for a Talbot interference pattern at the odd multiple of 1/16 th of the Talbot Distance for the beam-splitting when used with the x-rays of the predetermined wavelength spectrum and spatial coherence.
14. The x-ray imaging system of claim 1 , wherein the stage is configured to adjust a position of the object.
15. The x-ray imaging system of claim 14 , wherein the stage is further configured to set an angle of the object.
16. The x-ray imaging system of claim 1 , further comprising an analyzer grating in close proximity to a surface of the x-ray detector.
17. The x-ray imaging system of claim 16 , wherein the stage is further configured to adjust a position of the object relative to the analyzer grating.
18. The x-ray imaging system of claim 1 , wherein the x-ray imaging system is configured to perform computed tomography.
19. The x-ray imaging system of claim 1 , wherein the stage is further configured to controllably change an angle of incidence of the x-rays on the object.
20. The x-ray imaging system of claim 19 , wherein the stage and the x-ray detector are further configured to generate a plurality of images of the object, wherein each of the plurality of images is collected using a different setting for the angle of incidence of the x-rays on the object.
21. The x-ray imaging system of claim 1 , wherein at least some of the x-rays have an energy greater than or equal to 30 keV.