Structural color changeable material and strain detection apparatus
A structural color changeable material includes a strain body and surface plasmon generating particles. In the strain body, a strain is produced by an external pressure or an internal change. The surface plasmon generating particles generate surface plasmon and are contained in the strain body. The surface plasmon is generated by an incident light with a wavelength of 2400 nm or less. A mean particle size of the surface plasmon generating particles is equal to or less than the wavelength of the incident light. The surface plasmon generating particles are periodically arranged parallel to an in-plane direction of a reflection surface of the incident light.
1. A structural color changeable material, comprising:
a strain body in which a strain is produced by an external pressure or an internal change; and
surface plasmon generating particles which generate surface plasmon and which are contained in the strain body,
wherein the surface plasmon is generated by an incident light with a wavelength in the near-infrared spectrum,
wherein a mean particle size of the surface plasmon generating particles is dependent upon the wavelength of incident light and is within a longer wavelength region than a plasmon resonance frequency, and
wherein the surface plasmon generating particles are periodically arranged in a plane parallel with a reflection surface of the incident light.
2. The structural color changeable material according to claim 1 , wherein the surface plasmon generating particles contain an oxide semiconductor in the amount of 50 mass % or more with respect to a total mass of the particles.
3. The structural color changeable material according to claim 2 , wherein the oxide semiconductor is zinc oxide.
4. The structural color changeable material according to claim 1 , wherein the strain body is transparent.
5. The structural color changeable material according to claim 4 , wherein the surface plasmon generating particles are arranged inside the strain body.
6. The structural color changeable material according to claim 1 , wherein a distance between adjacent particles of the surface plasmon generating particles in the plane parallel with the reflection surface is equal to or less than the wavelength of the incident light.
7. The structural color changeable material according to claim 1 , wherein a distance between adjacent particles of the surface plasmon generating particles in a first direction in the plane parallel with the reflection surface is equal to or less than the wavelength of the incident light, and a distance between adjacent particles of the surface plasmon generating particles in a second direction in the plane parallel with the reflection surface is greater than the wavelength of the incident light, where the first direction is a direction in which the strain is produced in the strain body, and the second direction is a direction perpendicular to the first direction.
8. The structural color changeable material according to claim 1 , wherein the surface plasmon generating particles are periodically arranged only in a direction in the plane parallel with the reflection surface.
9. A strain detection apparatus for visualizing a strain in an in-plane direction of a strain body by means of surface plasmon, comprising:
a structural color changeable material;
a light source which emits a beam to the structural color changeable material;
a detector which detects a reflection light or a transmitted light from the structural color changeable material; and
a signal processor which calculates the strain of the structural color changeable material from the reflection light or the transmitted light detected by the detector,
wherein the structural color changeable material comprises:
a strain body in which a strain is produced by an external pressure or an internal change; and
surface plasmon generating particles which generate surface plasmon and which are contained in the strain body,
wherein the surface plasmon is generated by an incident light with a wavelength in the near-infrared spectrum,
wherein a mean particle size of the surface plasmon generating particles is dependent upon the wavelength of incident light and is within a longer wavelength region than a plasmon resonance frequency, and
wherein the surface plasmon generating particles are periodically arranged in a plane parallel with a reflection surface of the incident light.
10. The strain detection apparatus according to claim 9 , wherein the surface plasmon generating particles contain an oxide semiconductor in the amount of 50 mass % or more with respect to a total mass of the particles.
11. The strain detection apparatus according to claim 10 , wherein the oxide semiconductor is zinc oxide.
12. The strain detection apparatus according to claim 9 , wherein the strain body is transparent.
13. The strain detection apparatus according to claim 12 , wherein the surface plasmon generating particles are arranged inside the strain body.
14. The strain detection apparatus according to claim 9 , wherein a distance between adjacent particles of the surface plasmon generating particles in a direction in the plane parallel with the reflection surface is equal to or less than the wavelength of the incident light.
15. The strain detection apparatus according to claim 9 , wherein a distance between adjacent particles of the surface plasmon generating particles in a first direction in the plane parallel with the reflection surface is equal to or less than the wavelength of the incident light, and a distance between adjacent particles of the surface plasmon generating particles in a second direction in the plane parallel with the reflection surface is greater than the wavelength of the incident light, where the first direction is a direction in which the strain is produced in the strain body, and the second direction is a direction perpendicular to the first direction.
16. The strain detection apparatus according to claim 9 , wherein the surface plasmon generating particles are periodically arranged only in a direction in the plane parallel with the reflection surface.