IP Library Granted Patent US 10,658,350
Granted Patent B2
US 10,658,350 · App. 16/137,743 · Granted May 19, 2020

Semiconductor package

Inventors: Seonggwan Lee (Dae-gu, KR); Chul Park (Seoul, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L25/18H01L23/3128H01L23/3135H01L23/49816H01L24/05H01L24/48H01L25/0652H01L25/0657H01L24/32H01L24/33H01L24/45H01L24/49H01L24/73H01L2224/0401H01L2224/04042H01L2224/32145H01L2224/32225H01L2224/33181H01L2224/45139H01L2224/45144H01L2224/48091H01L2224/48106H01L2224/48145H01L2224/48227H01L2224/49175H01L2224/73204H01L2224/73215H01L2224/73257H01L2224/73265H01L2225/0651H01L2225/06506H01L2225/06517H01L2225/06562H01L2225/06586H01L2924/1434H01L2924/15192H01L2924/15311
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Quick Facts
Patent No.
US 10,658,350
App. No.
16/137,743
Granted
May 19, 2020
Kind
B2
Abstract

A semiconductor package including a substrate including an external terminal; a first semiconductor chip on the substrate and having a first and a second region; at least one second semiconductor chip on the second region of the first semiconductor chip, the at least one second semiconductor chip exposing a top surface of the first region of the first semiconductor chip; and at least one third semiconductor chip on the at least one second semiconductor chip, wherein the first semiconductor chip includes a first pad electrically connected to the at least one second semiconductor chip; a second pad electrically connected to the at least one third semiconductor chip; and a third pad electrically connected to the external terminal, the first pad is on the top surface of the first region, and at least one of the second pad and the third pad is on a top surface of the second region.

Claims (65)

1. A semiconductor package, comprising:

a substrate including an external terminal;

a first semiconductor chip on the substrate, the first semiconductor chip having a first region and a second region in a plan view;

at least one second semiconductor chip on the second region of the first semiconductor chip, the at least one second semiconductor chip exposing a top surface of the first region of the first semiconductor chip; and

at least one third semiconductor chip on the at least one second semiconductor chip,

wherein:

the first semiconductor chip includes:

a first pad electrically connected to the at least one second semiconductor chip;

a second pad electrically connected to the at least one third semiconductor chip; and

a third pad electrically connected to the external terminal,

the first pad is on the top surface of the first region, and

at least one of the second pad and the third pad is on a top surface of the second region.

2. The semiconductor package as claimed in claim 1 , wherein:

the first semiconductor chip includes an integrated circuit section therein, and

the first pad and the second pad are electrically connected through the integrated circuit section to the third pad.

3. The semiconductor package as claimed in claim 2 , wherein signals are transmittable to and from the first pad and the second pad through the third pad.

4. The semiconductor package as claimed in claim 1 , further comprising a second connector on the at least one third semiconductor chip, the second connector being coupled to the second pad and a chip pad of the at least one third semiconductor chip,

wherein the second pad is on the top surface of the first region of the first semiconductor chip.

5. The semiconductor package as claimed in claim 1 , further comprising:

a first connection pad on the substrate;

a second connector on the at least one third semiconductor chip, the second connector being coupled to the first connection pad and a chip pad of the at least one third semiconductor chip,

a connection line in the substrate and electrically connected to the first connection pad;

a second connection pad on the substrate and electrically connected to the connection line; and

a third connector on the first semiconductor chip, the third connector being coupled to the second connection pad and the second pad.

6. The semiconductor package as claimed in claim 5 , wherein the second pad is on the top surface of the second region of the first semiconductor chip.

7. The semiconductor package as claimed in claim 1 , further comprising a first connector on a top surface of the at least one second semiconductor chip and coupled to the first pad.

8. The semiconductor package as claimed in claim 1 , further comprising a support structure between the substrate and the at least one second semiconductor chip,

wherein the support structure is spaced apart from the first semiconductor chip.

9. The semiconductor package as claimed in claim 1 , further comprising an encapsulant between the first semiconductor chip and the at least one second semiconductor chip,

wherein the encapsulant exposes the top surface of the first region of the first semiconductor chip.

10. The semiconductor package as claimed in claim 9 , wherein the encapsulant extends onto a side surface of the first semiconductor chip and fills a gap between the substrate and the at least one second semiconductor chip.

11. The semiconductor package as claimed in claim 1 , wherein

the first semiconductor chip includes buffer circuits therein,

the at least one second semiconductor chip includes a memory chip, and

the at least one third semiconductor chip includes a memory chip.

12. The semiconductor package as claimed in claim 1 , wherein:

the at least one second semiconductor chip includes a plurality of stacked second semiconductor chips, and

the first pad is electrically connected to the plurality of stacked second semiconductor chips.

13. The semiconductor package as claimed in claim 1 , wherein:

the at least one third semiconductor chip includes a plurality of stacked third semiconductor chips,

the second pad is electrically connected to the plurality of stacked third semiconductor chips.

14. The semiconductor package as claimed in claim 1 , further comprising a molding layer on the substrate and covering the first semiconductor chip and the at least one second semiconductor chip,

wherein the molding layer covers the first region of the first semiconductor chip and is spaced apart from the top surface of the second region of the first semiconductor chip.

15. A semiconductor package, comprising:

a substrate;

a first semiconductor chip on the substrate and including a first pad, a second pad, and a third pad, the first pad, the second pad, and the third pad being on a top surface of the first semiconductor chip;

at least one second semiconductor chip on the first semiconductor chip, the at least one second semiconductor chip partially exposing the top surface of the first semiconductor chip; and

at least one third semiconductor chip on the at least one second semiconductor chip,

wherein:

the first pad is electrically connected to the at least one second semiconductor chip,

the second pad is electrically connected to the at least one third semiconductor chip,

the third pad is electrically connected to the first pad and the second pad, and

the at least one second semiconductor chip exposes the first pad and covers at least one of the second pad and the third pad.

16. The semiconductor package as claimed in claim 15 , wherein:

the substrate includes an external terminal on a bottom surface thereof, and

the third pad is coupled through the substrate to the external terminal.

17. The semiconductor package as claimed in claim 15 , wherein signals are transmittable to and from the first pad and the second pad through the third pad.

18. The semiconductor package as claimed in claim 15 , further comprising a support structure between the substrate and the second semiconductor chip.

19. The semiconductor package as claimed in claim 15 , wherein

the at least one second semiconductor chip includes a plurality of stacked second semiconductor chips, and

the at least one third semiconductor chip includes a plurality of stacked third semiconductor chips.

20. The semiconductor package as claimed in claim 15 , further comprising:

a first bonding wire on the at least one second semiconductor chip and coupled to the first pad;

a second bonding wire on the at least one third semiconductor chip and coupled to the second pad; and

a third bonding wire on the first semiconductor chip and coupled to the third pad.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 21, 2018
From: LEE, SEONGGWAN; PARK, CHUL
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 046935/0381 →
Priority Claims (1)
KR 10-2018-0013998 · Feb 5, 2018 · national
Continuity (1)
Related Publication 20190244944A1 · Aug 8, 2019
Cited By (2)
US 12,660,706 US 12,667,019