System and method for testing reference voltage circuit

1. A system for testing a reference voltage circuit, wherein the reference voltage circuit comprises a first switch, a second switch, a bandgap reference voltage circuit, a first capacitor, a second capacitor and a comparator; the bandgap reference voltage circuit is connected to one terminal of the first switch and one terminal of the second switch respectively and outputs a bandgap reference voltage; the first capacitor is connected between the other terminal of the first switch and a ground terminal; the second capacitor is connected between the other terminal of the second switch and another ground terminal; and the comparator is connected to the first capacitor and the second capacitor respectively to compare a voltage difference between the first capacitor and the second capacitor, wherein the system comprises:

a control logic unit connected to an output terminal of the comparator and a control terminal of the comparator, and connected to a control terminal of the first switch, a control terminal of the second switch and the bandgap reference voltage circuit;

wherein in a first test stage of the control logic unit, the control logic unit adjusts a delayed voltage of the comparator through the control terminal of the comparator, such that a comparison reference of the comparator is reduced to a test voltage from an allowable value; the control logic unit further controls the first switch to turn off, the second switch to turn on and the first capacitor to start discharging; the control logic unit is configured to start timing, the comparator is triggered to output a switching signal when the comparator compares a voltage difference between the first capacitor and the second capacitor and the voltage difference exceeds the test voltage, the control logic unit receives the switching signal and records a first time, and enters a second test stage,

wherein in a second test stage of the control logic unit, the control logic unit controls the first switch to turn on, the second switch to turn off, the first capacitor is charged to the bandgap reference voltage, the second capacitor starts discharging, the control logic unit starts timing again; the control logic unit is configured to determine whether the comparator is triggered during a time interval between a starting time of the second test stage and a second time or not, if yes, it is determined to fail the test, if no, it is determined to pass the test, and

wherein the second time is larger than the first time, and a variation rate of a voltage of the first capacitor during charging and discharging is longer than a variation rate of a voltage of the second capacitor during charging and discharging.

2. The system of claim 1 , wherein in an active mode of the control logic unit, the control logic unit controls the first switch and the second switch to turn on, the first capacitor and the second capacitor are charged to the bandgap reference voltage respectively, and the comparator is preset to compare whether or not the voltage difference between the first capacitor and the second capacitor exceeds the allowable value.

3. The system of claim 1 , wherein the control logic unit further comprises a timing unit configured to time in the first test stage and the second test stage respectively for the first time and the second time.

4. The system of claim 1 , wherein the control logic unit further comprises a processing unit configured to calculate the second time based the first time, and is further configured to determine whether or not the comparator is triggered during the time interval between the starting time of the second test stage and the second time.

5. The system of claim 4 , wherein the processing unit is configured to calculate the second time associated with a ratio of the second capacitor and the first capacitor based on the first time.

6. A testing method of a reference voltage circuit for testing a reference voltage circuit, wherein the reference voltage circuit comprises:

a bandgap reference voltage circuit connected to one terminal of the first switch and one terminal of the second switch respectively and outputting a bandgap reference voltage;

a first capacitor connected between the other terminal of the first switch and a ground terminal;

a second capacitor connected between the other terminal of the second switch and another ground terminal;

a comparator connected to the first capacitor and the second capacitor respectively to compare a voltage difference between the first capacitor and the second capacitor,

wherein the testing method comprises the following steps:

entering a first test stage, adjusting a delayed voltage of the comparator through the control terminal of the comparator; such that a comparison reference of the comparator is reduce to a test voltage from an allowable value;

controlling the first switch to turn off, the second switch to turn on, the first capacitor to start discharging;

starting timing, triggering the comparator to output a switching signal and recording a first time at the same time when the comparator compares a voltage difference between the first capacitor and the second capacitor and the voltage difference exceeds the test voltage, and enters a second test stage;

controlling the first switch to turn on, the second switch to turn off, the first capacitor to be charged to the bandgap reference voltage, the second capacitor to start discharging, and starting to time again;

determining whether the comparator is triggered during a time interval between a starting time of the second test stage and a second time or not, if yes, it is determined not to pass the test, if no, it is determined to pass the test,

wherein the second time is larger than the first time, and a variation rate of a voltage of the first capacitor during charging and discharging is larger than a variation rate of a voltage of the second capacitor during charging and discharging.

7. The testing method of claim 6 , further comprising a step of entering an active mode, wherein in the active mode, controlling the first switch and the second switch to turn on, the first capacitor and the second capacitor are charged to the bandgap reference voltage respectively, and the comparator is preset to compare whether or not the voltage difference between the first capacitor and the second capacitor exceeds the allowable value.

8. The testing method of claim 6 , further comprising configuring a timing unit to time in the first test stage and the second test stage respectively for the first time and the second time.

9. The testing method of claim 6 , further comprising configuring a processing unit to calculate the second time based the first time, and further configuring the processing unit to determine whether or not the comparator is triggered during the time interval between the starting time of the second test stage and a second time.

10. The testing method of claim 9 , further comprising configuring the processing unit to calculate the second time associated with a ratio of the second capacitor and the first capacitor based on the first time.

11. A testing method for a reference voltage circuit, wherein the reference voltage circuit is configured to output a reference voltage with a refresh rate, and the refresh rate is determined to a difference between variation rates of voltage of a first capacitor and a second capacitor of the reference voltage circuit during charging and discharging, and the testing method comprises:

charging the first capacitor to a first voltage, and then discharging the first capacitor and counting a first time taken for a difference between a voltage of the first capacitor and the first voltage to reach the reference voltage;

charging the second capacitor to the first voltage, and then discharging the second capacitor and counting a second time taken for a difference between a voltage of the second capacitor and the first voltage to reach the reference voltage;

determining, according to a relation between the first time and the second time, whether the reference voltage circuit passes the test.

12. The testing method of claim 11 , further comprising configuring a comparator connected to the first capacitor and the second capacitor respectively to compare a voltage difference between the first capacitor and the second capacitor.

13. The testing method of claim 11 , further comprising the first capacitor and the second capacitor reach to the reference voltage respectively.

14. The testing method of claim 11 , further comprising configuring a timing unit to time in a first test stage and a second test stage respectively for the first time and the second time.

15. The testing method of claim 14 , further comprising configuring a processing unit to calculate the second time based the first time.