IP Library Granted Patent US 10,686,108
Granted Patent B2
US 10,686,108 · App. 16/345,186 · Granted Jun 16, 2020

Semiconductor device package

Inventor: Sung Min Kong (Seoul, KR)
Assignee: LG INNOTEK CO., LTD.
H01L33/60H01L33/48H01L33/50H01L33/58H01L33/62H01L33/10H01L33/405
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Quick Facts
Patent No.
US 10,686,108
App. No.
16/345,186
Granted
Jun 16, 2020
Kind
B2
Abstract

Disclosed is a semiconductor device package according to an embodiment, the semiconductor comprising: a substrate; first and second lead frames arranged on the substrate; a semiconductor device electrically connected to the first and second lead frames; a reflective layer arranged on the substrate so as to reflect the light emitted from the semiconductor device; and a lens arranged on the substrate so as to cover the semiconductor device, the reflective layer, and the first and second lead frames.

Claims (32)

1. A semiconductor device package comprising:

a substrate;

a first lead frame and a second lead frame disposed on the substrate;

a semiconductor device electrically connected to the first and second lead frames;

a reflective layer disposed on the substrate and configured to reflect light emitted from the semiconductor device; and

a lens disposed on the substrate and configured to cover the semiconductor device, the reflective layer, the first and second lead frames,

wherein the first lead frame includes:

a first lead electrode portion electrically connected to the semiconductor device;

an edge portion extending according to an edge of the substrate and surrounding the first lead electrode portion and the second lead frame; and

an extension portion configured to connect the edge portion to the first lead electrode portion.

2. The semiconductor device package of claim 1 , wherein the reflective layer is disposed inside the edge portion.

3. The semiconductor device package of claim 1 , comprising:

a first pad electrically connected to the first lead frame; and

a second pad electrically connected to the second lead frame.

4. The semiconductor device package of claim 3 , comprising:

a first through electrode configured to pass through the substrate in a thickness direction thereof to electrically connect the first lead frame to the first pad; and

a second through electrode configured to pass through the substrate in the thickness direction thereof to electrically connect the second lead frame to the second pad.

5. The semiconductor device package of claim 1 , wherein the first lead frame comprises a first electrode pad connecting to the first lead electrode portion and the second lead frame comprises a second electrode pad connecting to a second lead electrode portion, and

wherein the first electrode pad and the second electrode pad are connected to a Zener diode.

6. The semiconductor device package of claim 5 , wherein the extension portion connects the first electrode pad to the first lead electrode portion.

7. The semiconductor device package of claim 5 , wherein the edge portion surrounds a second lead electrode portion and the second electrode pad.

8. The semiconductor device package of claim 1 , wherein the lens includes a convex portion disposed on a central portion of the lens and a flat portion configured to surround the convex portion.

9. The semiconductor device package of claim 8 , wherein the reflective layer comprises a dam portion protruding from the upper surface of the substrate,

wherein the dam portion has one surface close to the semiconductor device and the other surface opposite to the one surface, and

the one surface has a curvature and the other surface has a flat surface.

10. The semiconductor device package of claim 9 , wherein the dam portion is overlapped with the flat portion in a vertical direction.

11. The semiconductor device package of claim 9 , wherein a height of the dam portion is ⅓ times to two times of a height of a semiconductor device.

12. The semiconductor device package of claim 5 , wherein a first angle between an imaginary line connecting an outer side of the reflective layer to the upper surface of the semiconductor device and the side surface of the semiconductor device is in a range of about 34 degrees to 79 degrees.

13. The semiconductor device package of claim 1 , wherein the reflective layer covers a side surface of the semiconductor device.

14. The semiconductor device package of claim 8 , wherein a thickness of the reflective layer decreases farther away from the semiconductor device.

15. The semiconductor device package of claim 1 , comprising a wavelength conversion layer disposed on the semiconductor device,

wherein the wavelength conversion layer extends to the reflective layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2019
From: KONG, SUNG MIN
To: LG INNOTEK CO., LTD.
Reel/Frame 049000/0938 →
Priority Claims (1)
KR 10-2016-0141323 · Oct 27, 2016 · national
Continuity (1)
Related Publication 20190288168A1 · Sep 19, 2019