IP Library › Granted Patent US 10,697,872
Granted Patent B2
US 10,697,872 · App. 16/061,837 · Granted Jun 30, 2020

Measurement device and material tester

Inventor: Hiroshi Tsuji (Kyoto, JP)
Assignee: Shimadzu Corporation
G01N3/08G01N3/06G01N3/066G01N3/62H03F3/45G01B7/16H03F2200/261
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Quick Facts
Patent No.
US 10,697,872
App. No.
16/061,837
Granted
Jun 30, 2020
Kind
B2
Abstract

Once a sensor amplifier side connector of a cable unit for interconnecting a detector and a sensor amplifier is connected to the sensor amplifier, a gain resistor on the cable unit side and an instrumentation amplifier of the sensor amplifier are interconnected and the gain of the instrumentation amplifier is determined. As a result, the gain of the instrumentation amplifier is determined such that the magnitude of a signal that the sensor amplifier receives from the detector becomes a magnitude optimal for an analog circuit in the sensor amplifier.

Claims (14)

1. A measuring device comprising:

a detector converting a change in physical quantity generated in a measurement object into an electric signal and outputting the electric signal;

a sensor amplifier to which the output signal of the detector is input;

and

a cable unit connecting the detector and the sensor amplifier to each other,

wherein the cable unit includes a nonvolatile memory storing information on the detector and a resistor determining a gain of an instrumentation amplifier inside the sensor amplifier to a gain depending on the information on the detector.

2. The measuring device according to claim 1 , wherein the cable unit includes:

an electrical calibration circuit having a calibration bridge and a calibration resistance;

a switch switching a state of the signal input from the detector to the instrumentation amplifier; and

a switch switching a state of connection between the electrical calibration circuit and the instrumentation amplifier.

3. A material testing machine performing material testing, comprising a load mechanism giving a test force to a test piece, and the measuring device according to claim 1 .

4. The material testing machine according to claim 3 , wherein the measuring device is a measuring device including a load cell detecting the test force given to the test piece or a measuring device including a displacement meter detecting displacement generated in the test piece.

5. A material testing machine performing material testing, provided with a load mechanism giving a test force to a test piece, and provided with the measuring device according to claim 2 .

6. The material testing machine according to claim 5 , wherein the measuring device is a measuring device including a load cell detecting the test force given to the test piece or a measuring device including a displacement meter detecting displacement generated in the test piece.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 13, 2018
From: TSUJI, HIROSHI
To: SHIMADZU CORPORATION
Reel/Frame 046074/0138 →
Continuity (1)
Related Publication 20180372602A1 · Dec 27, 2018