Confocal imaging technique in a charged particle microscope
Methods and systems for charged particle microscope confocal imaging are disclosed herein. An example method includes obtaining a plurality of probe images of a portion of a sample, each probe image of the plurality of probe images obtained at a different focal depth within the sample, applying a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images, and forming a three-dimensional reconstruction of the sample based on the plurality of confocal images.
1. A method comprising:
obtaining a plurality of probe images of a portion of a sample, each probe image of the plurality of probe images obtained at a different focal depth within the sample;
applying a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images, the virtual aperture being a confined region of a detector proximal to or centered on a location of the detector where the probe image was detected; and
forming a three-dimensional reconstruction of the sample based on the plurality of confocal images.
2. The method of claim 1 , wherein applying a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images comprises selecting a subset of pixels from a plurality of pixels forming each of the plurality of probe images to form respective ones of the plurality of confocal images, wherein the subset of pixels includes a plurality of brightest pixels of the plurality of pixels, and wherein the plurality of pixels are within the confined region.
3. The method of claim 2 , wherein the subset of pixels are summed to form respective one of the plurality of confocal images.
4. The method of claim 1 , wherein applying a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images comprises selecting a plurality of pixels from each probe image based on their proximity to an electron probe beam location impinging on the detector.
5. The method of claim 1 , wherein applying a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images comprises reading out pixel data from the detector from the confined region of the detector centered on a location of an impinging probe beam, wherein the confined region is less than all the pixels of the detector.
6. The method of claim 1 , wherein applying a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images comprises reading out all pixel data of the detector and applying the virtual aperture to all the pixel data subsequent the readout.
7. The method of claim 1 , wherein obtaining a plurality of probe images of a portion of a sample, each probe image of the plurality of probe images obtained at a different focal depth within the sample comprises irradiating the sample with an electron beam and changing the focal depth with respect to a surface of the sample.
8. The method of claim 7 , wherein changing the focal depth with respect to a surface of the sample comprises moving the sample in relation to the focal plane of the electron beam.
9. The method of claim 7 , wherein changing the focal depth with respect to a surface of the sample comprises moving the focal plane in relation to the surface of the sample.
10. The method of claim 1 , wherein an electron beam probe is rastered over an area of the sample at each focal depth.
11. The method of claim 1 , wherein each of the plurality of probe images includes a sequence of probe images of an area of the sample obtained at each focal depth.
12. A system comprising:
an illuminator coupled to illuminate a sample with a beam of electrons;
an imaging system coupled to focus electron flux transmitted through the sample from the beam of electrons;
a detector coupled to detect the focused electron flux; and
a controller coupled to at least the illuminator, imaging system and detector, and including code that, when executed, causes the controller to:
obtain a plurality of probe images of a portion of a sample, each probe image of the plurality of probe images obtained at a different focal depth within the sample;
apply a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images, the virtual aperture being a confined region of a detector proximal to or centered on a location of the detector where the probe image was detected; and
form a three-dimensional reconstruction of the sample based on the plurality of confocal images.
13. The system of claim 12 , wherein the code that causes the controller to apply a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images further includes code that, when executed, causes the controller to:
select a subset of pixels from a plurality of pixels forming each of the plurality of probe images to form respective ones of the plurality of confocal images, wherein the subset of pixels includes a plurality of brightest pixels of the plurality of pixels, and wherein the plurality of pixels are within the confined region.
14. The system of claim 13 , wherein the code that causes the controller to form a respective plurality of confocal images further includes code that, when executed, causes the controller to sum the subset of pixels to form respective ones of the plurality of confocal images.
15. The system of claim 12 , wherein the code that causes the controller to apply a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images further includes code that, when executed, causes the controller to:
select a plurality of pixels from each probe image based on their proximity to an electron probe beam location impinging on the detector.
16. The system of claim 12 , wherein the code that causes the controller to apply a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images further includes code that, when executed, causes the controller to:
read out pixel data from the detector from the confined region of the detector centered on a location of an impinging probe beam, wherein the confined region is less than all the pixels of the detector.
17. The system of claim 12 , wherein the code that causes the controller to apply a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images further includes code that, when executed, causes the controller to:
read out all pixel data of the detector and applying the virtual aperture to all the pixel data subsequent the readout.
18. The system of claim 12 , wherein the code that causes the controller to obtain a plurality of probe images of a portion of a sample, each probe image of the plurality of probe images obtained at a different focal depth within the sample comprises code that, when executed, causes the controller to irradiate the sample with an electron beam and changing the focal depth with respect to a surface of the sample.
19. The system of claim 18 , wherein changing the focal depth with respect to a surface of the sample comprises moving the sample in relation to the focal plane of the electron beam.
20. The system of claim 18 , wherein changing the focal depth with respect to a surface of the sample comprises moving the focal plane in relation to the surface of the sample.
21. The system of claim 12 , wherein each of the plurality of probe images includes a sequence of probe images of an area of the sample obtained at each focal depth.