IP Library › Granted Patent US 10,705,027
Granted Patent B2
US 10,705,027 · App. 16/112,939 · Granted Jul 7, 2020

Surface defect detecting method and surface defect detecting apparatus

Inventors: Hiroaki Ono (Tokyo, JP); Toshifumi Kodama (Tokyo, JP); Takahiro Koshihara (Tokyo, JP); Akihiro Ogawa (Tokyo, JP); Yukinori Iizuka (Tokyo, JP)
Assignee: JFE Steel Corporation
G01N21/8851G01B11/245G01N21/892G01N21/952G06K9/4604G06K9/6267G06T7/0004G06T7/70H04N7/01G01N2021/8822G01N2021/8887G01N2201/063G06T2207/20224G06T2207/30164
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Quick Facts
Patent No.
US 10,705,027
App. No.
16/112,939
Granted
Jul 7, 2020
Kind
B2
Abstract

A detecting method of optically detecting a surface defect of a moving steel material includes an irradiation step of irradiating an examination target part with illumination light beams from different directions by two or more distinguishable light sources whose light emission durations are set based on at least an allowable positional displacement of an image, the two or more distinguishable light sources repeatedly emitting light such that their light emission timings thereof do not overlap each other; and a detection step of obtaining images by reflected light beams of the respective illumination light beams and detecting a surface defect in the examination target part by executing subtraction processing between the obtained images.

Claims (12)

1. A detecting method of optically detecting a surface defect of a moving steel material, the method comprising:

an irradiation step of irradiating an examination target part with illumination light beams from different directions with two or more distinguishable light sources whose light emission durations are set based on at least an allowable positional displacement of an image, the two or more distinguishable light sources repeatedly emitting light such that their light emission timings thereof do not overlap each other; and

a detection step of obtaining images by reflected light beams of the respective illumination light beams and detecting a surface defect in the examination target part by executing subtraction processing between the obtained images.

2. The method according to claim 1 , wherein the light emission durations are set based on the allowable positional displacement of the image, minimum resolution of the image and a moving speed of the steel material.

3. The method according to claim 1 , wherein the light emission durations, the allowable positional displacement of the image, minimum resolution of the image and a moving speed of the steel material satisfy a condition expressed by expression (1):

Light emission duration d [sec]≤Minimum resolution [mm/pixel]×Allowable positional displacement [pixels]/Line conveyance speed [mm/sec].  (1)

4. The method according to claim 1 , wherein the obtained images by reflected light beams of the respective illumination light beams are obtained using plural imaging devices whose optical axes are adjusted to be coaxial with one another.

5. The method according to claim 1 , wherein the detection step includes a step of obtaining images by reflected light beams of the respective illumination light beams by separating the reflected light beams of the respective illumination light beams that have been mixed with one another by using filters that transmit light beams having wavelengths the same as wavelengths of the illumination light beams.

6. The method according to claim 4 , wherein the detection step includes a step of adjusting, by using any of a half mirror, a beam splitter, and a prism, optical axes of the plural imaging devices, which obtain images by reflected light beams of the respective illumination light beams, to be coaxial with one another.

7. A surface defect detecting apparatus that optically detects a surface defect of a moving steel material, the surface defect detecting apparatus comprising:

an irradiation unit configured to irradiate an examination target part with illumination light beams from different directions with two or more distinguishable light sources whose light emission durations are set based on at least an allowable positional displacement of an image, the two or more distinguishable light sources repeatedly emit light such that their light emission timings do not overlap each other; and

a detection unit configured to obtain images by reflected light beams of the respective illumination light beams and detect a surface defect in the examination target part by executing subtraction processing between the obtained images.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE 2ND ASSIGNOR'S EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 046707 FRAME: 0826. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Oct 16, 2018
From: ONO, HIROAKI; KODAMA, TOSHIFUMI; KOSHIHARA, TAKAHIRO; OGAWA, AKIHIRO; IIZUKA, YUKINORI
To: JFE STEEL CORPORATION
Reel/Frame 047241/0897 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 27, 2018
From: ONO, HIROAKI; KODAMA, TOSHIFUMI; KOSHIHARA, TAKAHIRO; OGAWA, AKIHIRO; IIZUKA, YUKINORI
To: JFE STEEL CORPORATION
Reel/Frame 046707/0826 →
Priority Claims (3)
JP 2013-270881 · Dec 27, 2013 · national
JP 2014-090995 · Apr 25, 2014 · national
JP 2014-090996 · Apr 25, 2014 · national
Continuity (2)
Continuation 15107241
Related Publication 20190011375A1 · Jan 10, 2019
Cited By (2)
US 12,320,756 US 12,405,224