IP Library › Granted Patent US 10,715,111
Granted Patent B2
US 10,715,111 · App. 16/004,462 · Granted Jul 14, 2020

Elastic wave filter device and duplexer

Inventor: Motoki Ozasa (Nagaokakyo, JP)
Assignee: MURATA MANUFACTURING CO., LTD.
H03H9/6489H03H9/02559H03H9/02984H03H9/14541H03H9/25H03H9/6483H03H9/725H01L41/0477H01L41/0533
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Quick Facts
Patent No.
US 10,715,111
App. No.
16/004,462
Granted
Jul 14, 2020
Kind
B2
Abstract

An elastic wave filter device includes first and second reception filters, an input terminal, output terminals, and reference terminals provided on a piezoelectric substrate. The first reception filter includes series resonators and parallel resonators, and the second reception filter includes series resonators and parallel resonators. The reference terminal connected to the parallel resonator connected so as to be closest to the output terminal among the parallel resonators included in the first reception filter, and the reference terminal connected to the parallel resonator connected so as to be closest to the output terminal among the parallel resonators included in the second reception filter, are separated from each other on the piezoelectric substrate.

Claims (34)

1. An elastic wave filter device comprising:

a first elastic wave filter and a second elastic wave filter having pass bands different from each other and provided on a piezoelectric substrate; and

a shared terminal, a first terminal, a second terminal, and a plurality of reference terminals provided on the piezoelectric substrate; wherein

the first elastic wave filter includes a series resonator connected between the shared terminal and the first terminal and parallel resonators connected between a connection path from the shared terminal to the first terminal and one reference terminal among the plurality of reference terminals;

the second elastic wave filter includes parallel resonators connected between a connection path from the shared terminal to the second terminal and another reference terminal among the plurality of reference terminals;

a first reference terminal among the plurality of reference terminals connected to a parallel resonator connected so as to be closest to the first terminal among the parallel resonators included in the first elastic wave filter, and a second reference terminal among the plurality of reference terminals connected to a parallel resonator connected so as to be closest to the second terminal among the parallel resonators included in the second elastic wave filter, are separated from each other on the piezoelectric substrate; and

the first reference terminal is provided at a first side of the piezoelectric substrate, and the second reference terminal is provided at a second side of the piezoelectric substrate that is different than the first side of the piezoelectric substrate.

2. The elastic wave filter device according to claim 1 , wherein each of the first reference terminal and the second reference terminal is separated on the piezoelectric substrate from any other reference terminals of the plurality of reference terminals on the piezoelectric substrate.

3. The elastic wave filter device according to claim 1 , wherein

the first reference terminal is separated on the piezoelectric substrate from any of the reference terminals connected to the parallel resonators included in the second elastic wave filter; and

the second reference terminal is separated on the piezoelectric substrate from any of the reference terminal connected to the parallel resonators included in the first elastic wave filter.

4. The elastic wave filter device according to claim 1 , wherein at least one set of reference terminals among the plurality of reference terminals is shared on the piezoelectric substrate.

5. The elastic wave filter device according to claim 1 , wherein all of the reference terminals other than the first reference terminal and the second reference terminal, among the plurality of reference terminals, are shared on the piezoelectric substrate.

6. The elastic wave filter device according to claim 1 , wherein

the first elastic wave filter is a first reception filter that filters a first high-frequency signal input through the shared terminal, in a first pass band and outputs the filtered signal to the first terminal; and

the second elastic wave filter is a second reception filter that filters a second high-frequency signal input through the shared terminal, in a second pass band and outputs the filtered signal to the second terminal.

7. The elastic wave filter device according to claim 1 , wherein the first elastic wave filter and the second elastic wave filter are ladder surface acoustic wave filters.

8. The elastic wave filter device according to claim 7 , wherein each of the first and second ladder surface acoustic wave filters includes an IDT electrode having a multilayer structure including a close contact layer and a main electrode layer.

9. The elastic wave filter device according to claim 8 , wherein the close contact layer is made of Ti.

10. The elastic wave filter device according to claim 8 , wherein the main electrode in made of Al including about 1% of Cu.

11. The elastic wave filter device according to claim 8 , wherein each of the first and second ladder surface acoustic wave filters further includes a protective layer covering the IDT electrode.

12. A duplexer comprising the elastic wave filter device according to claim 1 , wherein

the first elastic wave filter is one of a reception filter that filters a high-frequency signal input through the shared terminal, in a first pass band and outputs the filtered signal to the first terminal and a transmission filter that filters a high-frequency signal input through the second terminal, in a second pass band and outputs the filtered signal to the shared terminal; and

the second elastic wave filter is the other of the reception filter and the transmission filter.

13. The duplexer according to claim 12 , wherein each of the first reference terminal and the second reference terminal is separated on the piezoelectric substrate from any other reference terminals of the plurality of reference terminals on the piezoelectric substrate.

14. The duplexer according to claim 12 , wherein

the first reference terminal is separated on the piezoelectric substrate from any of the reference terminals connected to the parallel resonators included in the second elastic wave filter; and

the second reference terminal is separated on the piezoelectric substrate from any of the reference terminal connected to the parallel resonators included in the first elastic wave filter.

15. The duplexer according to claim 12 , wherein at least one set of reference terminals among the plurality of reference terminals is shared on the piezoelectric substrate.

16. The duplexer according to claim 12 , wherein the reference terminals other than the first reference terminal and the second reference terminal, among the plurality of reference terminals, are shared on the piezoelectric substrate.

17. The duplexer according to claim 12 , wherein the first elastic wave filter and the second elastic wave filter are ladder surface acoustic wave filters.

18. The duplexer according to claim 17 , wherein each of the first and second ladder surface acoustic wave filters includes an IDT electrode having a multilayer structure including a close contact layer and a main electrode layer.

19. The duplexer according to claim 18 , wherein the close contact layer is made of Ti.

20. The duplexer according to claim 18 , wherein the main electrode in made of Al including about 1% of Cu.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 11, 2018
From: OZASA, MOTOKI
To: MURATA MANUFACTURING CO., LTD.
Reel/Frame 046039/0001 →
Priority Claims (1)
JP 2015-257540 · Dec 28, 2015 · national
Continuity (2)
Continuation PCTJP2016089199 · Dec 28, 2016
Related Publication 20180294797A1 · Oct 11, 2018
Cited By (1)
US 12,476,616