IP Library › Granted Patent US 10,719,734
Granted Patent B2
US 10,719,734 · App. 15/329,021 · Granted Jul 21, 2020

Method for evaluating structural changes of a sample resulting from a treatment of the sample

Inventors: Igor Andreevich Varfolomeev (Moscow, RU); Alexander Nikolaevich Nadeev (Spring, TX); Dmitry Anatolievich Koroteev (Moscow, RU); Ivan Victorovich Yakimchuk (Moscow, RU); Andrey Vladimirovich Kazak (Moscow, RU)
Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
G06K9/6215G06K9/6212G06K9/78G06K2209/19
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Quick Facts
Patent No.
US 10,719,734
App. No.
15/329,021
Granted
Jul 21, 2020
Kind
B2
Abstract

Evaluating structural changes in a sample resulting from a treatment of the sample. At least one sample of the material is scanned before and after the treatment and a first and a second image of the sample are obtained. The first and the second images are registered in a full spatial resolution using at least one region of the first image and at least one region of the second image, the regions corresponding to the same part of the sample. The registered images are analyzed and the changes in each sample caused by the performed treatment are evaluated.

Claims (27)

1. A method for evaluating structural changes in a sample of a material, resulting from a treatment of the sample, the method comprising:

scanning at least one sample of the material and obtaining a first image of the sample;

performing a treatment of each scanned sample;

scanning each sample after the treatment and obtaining a second image of each sample;

for each sample, performing an initial registration of the first and the second images in a reduced resolution and selecting areas of correspondence of the first and the second images;

for each sample, from the selected area of correspondence of the first and the second images selecting by the same coordinates pairs of patches of the first and the second images;

for each sample, registering each selected pair of the patches of the first and the second images in a full spatial resolution and determining similarity transformation parameters for each selected pair;

for each sample, registering the first and the second images in a full spatial resolution by estimating similarity transformation parameters for the entire sample using the determined similarity transformation parameters for each selected pair, and

analyzing the registered images and evaluating changes in each sample caused by the performed treatment.

2. The method of claim 1 , wherein the treatment of the sample is a thermal treatment.

3. The method of claim 1 , wherein the treatment of the sample is a chemical treatment.

4. The method of claim 3 , wherein the chemical treatment is extraction or cleaning of a pore space of the sample.

5. The method of claim 1 , wherein the treatment of the sample is a mechanical treatment.

6. The method of claim 1 , wherein the treatment of the sample is a transportation of the sample.

7. The method of claim 1 , wherein the treatment of the sample is a storage of the sample.

8. The method of claim 1 , wherein the methods of scanning before and after the treatment are different.

9. The method of claim 1 , wherein each obtained image of the sample is a one-dimensional image.

10. The method of claim 1 , wherein each obtained image of the sample is a two-dimensional image.

11. The method of claim 1 , wherein each obtained image of the sample is a three-dimensional image.

12. The method of claim 1 , wherein the images obtained before and after the treatment have different size.

13. The method of claim 1 , wherein at least one of the obtained images of the sample are pre-processed to remove distortions.

14. The method of claim 1 , comprising constructing a differential image from the registered images.

15. The method of claim 1 , further comprising applying different types of treatments on the samples and additionally determining a treatment producing changes of a predetermined type and value.

16. The method of claim 1 , comprising repeatedly applying the treatment of one type on the samples, each treatment causing changes in the sample structure.

17. The method of claim 1 , wherein each point of the obtained images comprises a set of values that characterize different physical properties of the sample.

18. The method of claim 17 , wherein the set of values in each point of the image is a spectrum of absorption or emission of electromagnetic radiation in a range of wavelengths or energies.

19. The method of claim 1 , wherein the registration procedure uses similarity transformations with further deformation, which allows determining a deformation field in the sample.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 6, 2017
From: VARFOLOMEEV, IGOR ANDREEVICH; NADEEV, ALEXANDER NIKOLAEVICH; KOROTEEV, DMITRY ANATOLIEVICH; YAKIMCHUK, IVAN VICTOROVICH; KAZAK, ANDREY VLADIMIROVICH
To: SCHLUMBERGER TECHNOLOGY CORPORATION
Reel/Frame 041468/0782 →
Continuity (1)
Related Publication 20170220899A1 · Aug 3, 2017