Measurement system and method for operating a measurement system
A measurement system comprising a device under test, at least a first antenna and a second antenna, a reflector device, a shielded space and a signal analysis module is disclosed. The first antenna is configured to at least one of generate electromagnetic waves directed to the reflector device and receive electromagnetic waves reflected by the reflector device. The reflector device is configured to reflect electromagnetic waves between the first antenna and the device under test. The second antenna is positioned in a near-field area of the device under test. At least the second antenna is connected to the signal analysis module, and the device under test, the first antenna, the second antenna and the reflector device are assigned to the shielded space. Moreover, a method for operating a measurement system is disclosed.
1. A measurement system comprising:
a device under test, at least a first antenna and a second antenna, a reflector device, a shielded space and a signal analysis module;
the first antenna being configured to at least one of generate electromagnetic waves directed to the reflector device or receive electromagnetic waves reflected by the reflector device;
the reflector device being configured to reflect electromagnetic waves between the first antenna and the device under test;
the second antenna being positioned in a near-field area of the device under test;
at least the second antenna being connected to the signal analysis module;
the device under test, the first antenna, the second antenna and the reflector device being assigned to the shielded space,
wherein a shielding member is provided, the shielding member being assigned to the shielded space, and the shielding member being positioned between the first antenna and the second antenna, and wherein the shielding member separates a far-field area of the device under test from a near-field area of the device under test.
2. The measurement system according to claim 1 , wherein at least one of the first antenna or the device under test is configured to generate electromagnetic waves within a predetermined frequency band.
3. The measurement system according to claim 2 , comprising at least one signal generation module being connected to at least one of the first antenna or the device under test.
4. The measurement system according to claim 1 , wherein the second antenna is configured to receive an electromagnetic signal provided by the device under test.
5. The measurement system according to claim 1 , wherein at least one of the first antenna or the second antenna is configured as a link antenna.
6. The measurement system according to claim 1 , wherein at least one of the first antenna or the second antenna is stationary relative to the shielded space.
7. The measurement system according to claim 1 , wherein a positioning unit is provided that is configured to adjustably hold the device under test in a position.
8. The measurement system according to claim 7 , wherein the positioning unit is configured to adjust a position of the device under test in two dimensions or in three dimensions.
9. The measurement system according to claim 1 , comprising a third antenna being mounted stationary relative to the device under test.
10. A measurement system comprising:
a device under test, at least a first antenna and a second antenna, a reflector device, a shielded space and a signal analysis module;
the first antenna being configured to at least one of generate electromagnetic waves directed to the reflector device or receive electromagnetic waves reflected by the reflector device;
the reflector device being configured to reflect electromagnetic waves between the first antenna and the device under test;
the second antenna being positioned in a near-field area of the device under test;
at least the second antenna being connected to the signal analysis module;
the device under test, the first antenna, the second antenna and the reflector device being assigned concurrently to the shielded space,
wherein the first antenna is configured to measure far field properties of the device under test, and wherein the second antenna is configured to near field properties of the device under test.
11. The measurement system according to claim 10 , comprising a third antenna being mounted stationary relative to the device under test.