Determining focus condition in spectral reflectance system
Embodiments include a spectral reflectance system comprising a light source. The system includes a platform configured to retain a sample. The system includes an optical director positioned in the optical path between the light source and the platform. The optical director couples light from the light source to the platform. The system includes a detector positioned to receive reflected light from the sample. The detector generates a signal representing the reflected light. The system includes a focusing system coupled to the optical director. In response to the signal the focusing system automatically focuses the light on the sample by controlling a position of the optical director to maximize a strength of the signal.
1. A spectral reflectance system, comprising:
a light source;
a platform configured to retain a sample;
an optical director positioned in the optical path between the light source and the platform, wherein the optical director couples light from the light source to the platform, and wherein the optical director comprises a beamsplitter;
a lens disposed between the optical director and the platform;
a detector positioned to receive reflected light from the sample, wherein the detector generates a signal representing the reflected light;
a focusing system coupled to the optical director, wherein in response to the signal the focusing system automatically focuses the light on the sample by controlling a position of the optical director to maximize a strength of the signal; and
a processor in electronic communication with the detector, wherein the processor determines a map of measured reflectance data from the signal and compares the map of measured reflectance data to reference reflectance data to generate a map of outer layer thickness profile of the sample.
2. The spectral reflectance system of claim 1 , comprising a focusing device in the optical path between the light source and the optical director.
3. The spectral reflectance system of claim 1 , wherein the light source comprises a light source aperture.
4. The spectral reflectance system of claim 3 , wherein the detector comprises a detector aperture.
5. The spectral reflectance system of claim 4 , wherein the focusing system controls the position of the optical director to image the light source aperture directly on the detector aperture, wherein the strength of the signal is maximized.
6. The spectral reflectance system of claim 1 , comprising a fiber coupler, wherein a first port of the fiber coupler is coupled to the light source, a second port of the fiber coupler is coupled to the detector, and a third port of the fiber coupler is coupled to the optical director in the optical path.
7. The spectral reflectance system of claim 6 , comprising a focusing device in the optical path between the third port and the optical director.
8. The spectral reflectance system of claim 7 , wherein the focusing device is positioned adjacent to the platform.
9. The spectral reflectance system of claim 8 , wherein the focusing device is positioned in a same plane as the platform.
10. The spectral reflectance system of claim 7 , wherein the focusing device comprises a lens.
11. The spectral reflectance system of claim 7 , wherein the focusing device comprises a focusing mirror.
12. The spectral reflectance system of claim 1 , wherein the beamsplitter is configured to direct a light signal from the light source to the sample.
13. The spectral reflectance system of claim 12 , wherein the beamsplitter is configured to direct reflected light of the light signal from the sample to the detector.
14. The spectral reflectance system of claim 1 , wherein the focusing system controls a length of the optical path by controlling movement of the beamsplitter relative to the platform.
15. The spectral reflectance system of claim 1 , comprising a first lens positioned between the light source and the beamsplitter, wherein the first lens is a collimating lens.
16. The spectral reflectance system of claim 15 , comprising a second lens positioned between the beamsplitter and the detector, wherein the second lens is a focusing lens.
17. The spectral reflectance system of claim 1 , wherein the detector comprises a spectrometer.
18. A method comprising:
directing light along an optical path from a light source to a platform configured to retain a sample, wherein the optical path includes an optical director and a lens between the optical director and the platform, and wherein the optical director comprises a beamsplitter;
positioning a detector to receive reflected light from the sample;
generating a signal representing the reflected light received at the detector;
determining a map of measured reflectance data from the signal using a processor;
comparing the map of measured reflectance data to reference reflectance data to generate a map of outer layer thickness profile of the sample using the processor; and
in response to the signal, automatically focusing the light on the sample by controlling a position of the optical director to maximize a strength of the signal.
19. The method of claim 18 , comprising focusing light of the light source on the optical director.
20. The method of claim 18 , wherein the light source comprises a light source aperture.
21. The method of claim 20 , wherein the detector comprises a detector aperture.
22. The method of claim 21 , wherein automatically focusing the light comprises controlling the position of the optical director to image the light source aperture directly on the detector aperture, wherein the strength of the signal is maximized.
23. The method of claim 18 , comprising coupling a first port of a fiber coupler to the light source, coupling a second port of the fiber coupler to the detector, and coupling a third port of the fiber coupler to the optical director in the optical path.
24. The method of claim 23 , comprising focusing light of the light source on the optical director using a focusing device in the optical path between the third port and the optical director.
25. The method of claim 24 , comprising positioning the focusing device adjacent to the platform.
26. The method of claim 25 , comprising positioning the focusing device in a same plane as the platform.
27. The method of claim 24 , wherein the focusing device comprises a lens.
28. The method of claim 24 , wherein the focusing device comprises a focusing mirror.
29. The method of claim 23 , comprising coupling the optical path to the third port of the fiber coupler using a first mirror of the optical director.
30. The method of claim 29 , comprising coupling the optical path to the sample using a second mirror of the optical director.
31. The method of claim 18 , comprising positioning the beamsplitter to direct a light signal from the light source to the sample.
32. The method of claim 31 , comprising positioning the beamsplitter to direct reflected light of the light signal from the sample to the detector.
33. The method of claim 18 , comprising using the focusing system to control a length of the optical path by controlling movement of the beamsplitter relative to the platform.
34. The method of claim 18 , comprising positioning a first lens between the light source and the beamsplitter, wherein the first lens is a collimating lens.
35. The method of claim 34 , comprising positioning a second lens between the beamsplitter and the detector, wherein the second lens is a focusing lens.
36. The method of claim 18 , wherein the detector comprises a spectrometer.