Inspection system and inspection method
An inspection system of an embodiment includes: a planar illumination unit that temporally varies an intensity of light in a periodic manner by spatially moving a stripe pattern of the intensity of light; a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; and a calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface.
1. An inspection system comprising:
a planar illuminator that temporally varies an intensity of light emitted from the planar illuminator to an inspection target surface in a successive and periodic manner by spatially moving a stripe pattern of the intensity of the light; and
at least one processor configured to:
multiply a light intensity signal by a reference signal, the light intensity signal representing an intensity of light reflected from the inspection target surface in response to the light emitted from the planar illuminator incident on the inspection target surface, the reference signal periodically changing in response to a temporal change of the intensity of the light emitted from the planar illuminator due to spatially moving the strip pattern of the intensity of the light emitted from the planar illuminator according to a lapse of time;
generate, using an image capturing device, a time-correlation image according to the multiplied light intensity signal; and
calculate a characteristic from the time-correlation image, the characteristic corresponding to a concave-convex irregularity/abnormality of the inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface,
wherein the planar illuminator temporally varies the intensity of the light emitted from the planar illuminator in the successive and periodic manner in a single exposure time of the image capturing device by spatially moving the stripe pattern of the intensity of the light emitted from the planar illuminator according to the lapse of time.
2. The inspection system according to claim 1 , wherein the stripe pattern is set so as to be projectable based on the following expression (1):
e jωt ·e jϕ(x,y) (1)
where e represents an exponential function, j represents an imaginary number, ωrepresents a temporal angular velocity, t represents time, x and y represent two-dimensional coordinates, and ϕ represents a phase distribution continuously varying in the x-y plane.
3. The inspection system according to claim 1 , wherein a stripe width of the stripe pattern is set so as to satisfy the following expression (2):
p·w/λ>0.5 (2)
where w=1−2H(1+γ 2 )·f xx , p represents a width of an image capturing element of the time-correlation camera, λ represents the stripe width, H represents a distance between an inspection subject and the planar illumination unit, γ represents tan θ 0 , θ 0 represents an angle of a direction of the image pickup device with respect to a frontal direction of the inspection subject, f xx , represents the second-order derivative of f(x), f(x) is a function representing a shape of a surface, and x represents a direction along a representative surface of the inspection subject.
4. The inspection system according to claim 1 , wherein the stripe pattern is set so as to move in a direction intersecting a longitudinal direction of a defect.
5. The inspection system according to claim 1 , wherein a stripe width of the stripe pattern is set according to an inclination of the inspection target surface.
6. The inspection system according to claim 1 , wherein the illumination unit outputs a plurality of stripe patterns having different stripe widths to one inspection target surface.
7. The inspection system according to claim 1 , wherein the illumination unit outputs a stripe pattern including a plurality of stripes having different stripe widths.
8. The inspection system according to claim 7 , wherein the stripe pattern includes a plurality of stripes having different stripe widths and extending in the same direction.
9. The inspection system according to claim 7 , wherein the stripe pattern includes a plurality of stripes having different widths and extending in intersecting directions.
10. The inspection system according to claim 1 , wherein the illumination unit outputs a plurality of stripe patterns extending in different directions to one inspection target surface.
11. An inspection method comprising:
varying an intensity of light emitted from a planar illuminator to an inspection subject in a successive and periodic manner by spatially moving a stripe pattern of the intensity of light;
multiplying a light intensity signal by a reference signal, the light intensity signal representing an intensity of light reflected from the inspection target surface of an inspection subject in response to the light emitted from the planar illuminator incident on the inspection target surface, the reference signal periodically changing in response to a temporal change of the intensity of the light emitted from the planar illuminator due to spatially moving the strip pattern of the intensity of the light emitted from the planar illuminator according to a lapse of time;
generating, using an image capturing device, a time-correlation image for the inspection subject irradiated with the light emitted from the planar illuminator according to the multiplied light intensity signal; and
calculating a characteristic from the time-correlation image, the characteristic corresponding to a concave-convex irregularity/abnormality of the inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface,
wherein the intensity of the light emitted from the planar illuminator is varied in the successive and periodic manner in a single exposure time of the image capturing device by spatially moving the stripe pattern of the intensity of the light emitted from the planar illuminator according to the lapse of time.
12. An inspection system comprising:
a planar illuminator that temporally varies an intensity of light emitted from the planar illuminator to an inspection target surface in a successive and periodic manner by spatially moving a stripe pattern of the intensity of the light; and
at least one processor configured to:
multiply a light intensity signal by a reference signal, the light intensity signal representing an intensity of light reflected from the inspection target surface in response to the light emitted from the planar illuminator incident on the inspection target surface, the reference signal periodically changing in response to a temporal change of the intensity of the light emitted from the planar illuminator due to spatially moving the strip pattern of the intensity of the light emitted from the planar illuminator according to a lapse of time; and
generate a time-correlation image according to the multiplied light intensity signal, the time correlation image being used for calculating a characteristic from the time-correlation image, the characteristic corresponding to a concave-convex irregularity/abnormality of the inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface,
wherein the planar illuminator temporally varies the intensity of the light emitted from the planar illuminator in the successive and periodic manner in a single exposure time for generating the time-correlation image by spatially moving the stripe pattern of the intensity of the light emitted from the planar illuminator according to the lapse of time.