IP Library Granted Patent US 10,727,152
Granted Patent B2
US 10,727,152 · App. 15/939,376 · Granted Jul 28, 2020

Semiconductor apparatus

Inventor: Hiroki Tanaka (Fukuoka, JP)
Assignee: Mitsubishi Electric Corporation
H01L23/3675H01L23/04H01L23/053H01L23/08H01L23/24H01L23/293H01L23/3735H01L24/32H01L23/3737H01L23/49861H01L24/29H01L24/48H01L24/49H01L24/73H01L25/0655H01L2224/29101H01L2224/32225H01L2224/32245H01L2224/48227H01L2224/48247H01L2224/4911H01L2224/49433H01L2224/73265H01L2924/00014H01L2924/10253H01L2924/10272H01L2924/181H01L2924/19107H01L2924/35121
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,727,152
App. No.
15/939,376
Granted
Jul 28, 2020
Kind
B2
Abstract

A semiconductor apparatus includes: a radiator plate; a resin insulating layer provided on the radiator plate; a resin block made of resin and armularly disposed to cover an end part of the radiator plate and an end part of the resin insulating layer; a case disposed to cover the resin block; and a sealing material filled in an inside of the case.

Claims (24)

1. A semiconductor apparatus comprising:

a radiator plate;

a resin insulating layer provided on the radiator plate;

a resin block made of resin and annularly disposed to cover an end part of the radiator plate and an end part of the resin insulating layer;

a case disposed to cover the resin block; and

a sealing material filled in an inside of the case,

wherein the resin block is separated from the sealing material by an adhesive material such that a gap is provided between the resin block and the sealing material.

2. The semiconductor apparatus according to claim 1 , wherein the end part of the radiator plate has a convex shape at a center part on a lateral face of the end part of the radiator plate, and

the resin block has a concave shape corresponding to the convex shape.

3. The semiconductor apparatus according to claim 2 , wherein the resin block is disposed to cover a part of a surface of the resin insulating layer.

4. The semiconductor apparatus according to claim 3 , wherein the case is bonded to the resin block via the adhesive material.

5. The semiconductor apparatus according to claim 2 , wherein the case is bonded to the resin block via the adhesive material.

6. The semiconductor apparatus according to claim 2 , wherein the sealing material is an epoxy-based resin.

7. The semiconductor apparatus according to claim 2 , further comprising a wiring layer provided on the resin insulating layer, and a SiC semiconductor device joined to the wiring layer via a solder.

8. The semiconductor apparatus according to claim 1 , wherein the resin block is disposed to cover a part of a surface of the resin insulating layer.

9. The semiconductor apparatus according to claim 8 , wherein the case is bonded to the resin block via the adhesive material.

10. The semiconductor apparatus according to claim 8 , wherein the sealing material is an epoxy-based resin.

11. The semiconductor apparatus according to claim 8 , further comprising a wiring layer provided on the resin insulating layer, and a SiC semiconductor device joined to the wiring layer via a solder.

12. The semiconductor apparatus according to claim 1 , wherein the case is bonded to the resin block via the adhesive material.

13. The semiconductor apparatus according to claim 12 , wherein the sealing material is an epoxy-based resin.

14. The semiconductor apparatus according to claim 12 , further comprising a wiring layer provided on the resin insulating layer, and a SiC semiconductor device joined to the wiring layer via a solder.

15. The semiconductor apparatus according to claim 1 , wherein the sealing material is an epoxy-based resin.

16. The semiconductor apparatus according to claim 1 , further comprising a wiring layer provided on the resin insulating layer, and a SiC semiconductor device joined to the wiring layer via a solder.

17. The semiconductor apparatus according to claim 1 , wherein the resin block covers end parts of the radiator plate, the end parts of the radiator plate including every lateral face of the radiator plate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 29, 2018
From: TANAKA, HIROKI
To: MITSUBISHI ELECTRIC CORPORATION
Reel/Frame 045381/0713 →
Priority Claims (1)
JP 2017-190985 · Sep 29, 2017 · national
Continuity (1)
Related Publication 20190103334A1 · Apr 4, 2019