Inspection system and inspection method
An inspection system of an embodiment includes: a planar illumination unit that temporally and spatially varies intensities of light in a periodic manner; a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; and a calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface.
1. An inspection system comprising:
a planar illuminator that temporally and spatially varies intensities of light from the planar illuminator to an inspection target surface in a successive and periodic manner; and
at least one processor configured to:
multiply a light intensity signal by a reference signal, the light intensity signal representing an intensity of light reflected from the inspection target surface in response to the light emitted from the planar illuminator incident on the inspection target surface, the reference signal periodically changing in response to a temporal change of the intensity of the light emitted from the planar illuminator due to spatial change of the intensity of the light emitted from the planar illuminator according to a lapse of time;
generate, using a camera, a time-correlation image according to the multiplied light intensity signal; and
calculate a characteristic from the time-correlation image, the characteristic corresponding to a concave-convex irregularity/abnormality of the inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface,
wherein the planar illuminator temporally varies the intensity of the light emitted from the planar illuminator in the successive and periodic manner in a single exposure time of the camera by spatially changing the intensity of the light emitted from the planar illuminator according to the lapse of time.
2. The inspection system according to claim 1 , wherein
the time-correlation image includes a complex time-correlation image, and
the characteristic corresponds to a distribution of phases of the complex time-correlation image.
3. The inspection system according to claim 2 , wherein the characteristic is a gradient of the distribution of the phases.
4. The inspection system according to claim 3 , wherein the characteristic is a variation in the gradient of the distribution of the phases obtained by applying processing with a phase-only Laplacian to the complex time-correlation image.
5. The inspection system according to claim 2 , wherein the characteristic corresponds to a gradient of the distribution of the normal vectors to the inspection target surface.
6. The inspection system according to claim 1 , wherein
the time-correlation image includes a complex time-correlation image, and
the characteristic corresponds to a distribution of amplitudes of the complex time-correlation image.
7. The inspection system according to claim 6 , wherein
the camera obtains an intensity image, and
the characteristic is a distribution of ratios between the amplitudes and the intensities.
8. An inspection system comprising at least one processor configured to:
acquire a complex image that is a measurement result of an inspection subject by a specific measuring instrument and that has pixel values represented by complex numbers including amplitudes and phases; and
calculate, as a characteristic serving to detect an abnormality of the inspection subject corresponding to a non-steady change of the pixel values of the complex image, a variation in a gradient of a distribution of the phases of the complex image obtained by applying processing with a phase-only Laplacian to the complex image, the phase-only Laplacian representing a calculation for applying second-order differentiation to only the phases while ignoring the amplitudes.
9. An inspection method comprising:
varying temporally and spatially an intensity of light emitted from a planar illuminator to an inspection subject in a successive and periodic manner;
multiplying a light intensity signal by a reference signal, the light intensity signal representing an intensity of light reflected from the inspection target surface in response to the light emitted from the planar illuminator incident on the inspection target surface, the reference signal periodically changing in response to a temporal change of the intensity of the light emitted from the planar illuminator due to spatial change of the intensity of the light emitted from the planar illuminator according to a lapse of time;
generating, using a camera, a time-correlation image; and
calculating a characteristic from the time-correlation image, the characteristic corresponding to concave-convex irregularity/abnormality of the inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface,
wherein the intensity of the light emitted from the planar illuminator is varied in the successive and periodic manner in a single exposure time of the camera by spatially changing the intensity of the light emitted from the planar illuminator according to the lapse of time.
10. An inspection method comprising:
acquiring a complex image that is a measurement result of an inspection subject by a specific measuring instrument and that has pixel values represented by complex numbers including amplitudes and phases; and
calculating, as a characteristic serving to detect an abnormality corresponding to a non-steady change of the pixel values in the complex image, a variation in a gradient of a distribution of the phases of the complex image obtained by applying processing with a phase-only Laplacian to the complex image, the phase-only Laplacian representing a calculation for applying second-order differentiation to only the phases while ignoring the amplitudes.
11. An inspection system comprising:
a planar illuminator that temporally and spatially varies intensities of light from the planar illuminator to an inspection target surface in a successive and periodic manner; and
at least one processor configured to:
multiply a light intensity signal by a reference signal, the light intensity signal representing an intensity of light reflected from the inspection target surface in response to the light emitted from the planar illuminator incident on the inspection target surface, the reference signal periodically changing in response to a temporal change of the intensity of the light emitted from the planar illuminator due to spatial change of the intensity of the light emitted from the planar illuminator according to a lapse of time; and
generate a time-correlation image according to the multiplied light intensity signal, the time-correlation image being used for calculating a characteristic from the time-correlation image, the characteristic corresponding to a concave-convex irregularity/abnormality of the inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface,
wherein the planar illuminator temporally varies the intensity of the light emitted from the planar illuminator in the successive and periodic manner in a single exposure time for generating the time-correlation image by spatially changing the intensity of the light emitted from the planar illuminator according to the lapse of time.