IP Library › Granted Patent US 10,741,246
Granted Patent B2
US 10,741,246 · App. 15/960,365 · Granted Aug 11, 2020

Method, system and device for integration of volatile and non-volatile memory bitcells

Inventors: Mudit Bhargava (Austin, TX); Brian Tracy Cline (Austin, TX); George McNeil Lattimore (Austin, TX); Bal S. Sandhu (Fremont, CA)
Assignee: Arm Limited
G11C14/0045G11C7/06G11C13/0069G11C14/009
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,741,246
App. No.
15/960,365
Granted
Aug 11, 2020
Kind
B2
Abstract

Disclosed are methods, systems and devices for operation of memory device. In one aspect, volatile memory bitcells and non-volatile memory bitcells may be integrated to facilitate transfer of stored values between the volatile and non-volatile memory bitcells.

Claims (12)

1. A bitcell circuit comprising:

one or more volatile memory elements;

one or more non-volatile memory elements, wherein

a first volatile memory element of the one or more volatile memory elements and at least a first non-volatile memory element of the one or more non-volatile memory elements are accessible via a first bitline responsive to a signal on a wordline.

2. The bitcell circuit of claim 1 , and further comprising a first conducting element to couple the first non-volatile memory element to a first node and second conducting element to couple a second non-volatile memory element to a second node to form a non-volatile memory cell that is responsive to a signal on a wordline to connect the non-volatile memory cell to the first bitline, and a third conducting element to couple the first volatile memory element to the first node and a fourth conducing element to couple a second volatile memory element to the second node to form a volatile memory cell that is responsive to a signal on said wordline to connect the volatile memory cell to said first bitline.

3. The bitcell circuit of claim 1 , and further comprising at least a first multiplexer circuit to couple the first bitline to either a first terminal of the first volatile memory element or the first terminal of the first non-volatile memory element.

4. The bitcell circuit of claim 1 , and further comprise a conducting element to selectively couple a terminal of the first non-volatile memory element to the first bitline to configure the bitcell circuit to operate as a non-volatile memory bitcell or decouple the terminal of the first non-volatile memory element from the first bitline to configure the bitcell circuit to operate as a volatile memory bitcell.

5. The bitcell circuit of claim 1 , and further comprising a circuit to transfer a value stored in the first non-volatile memory element to the first volatile memory element responsive to power applied to the first volatile memory element.

6. The bitcell circuit of claim 5 , wherein the circuit to transfer the value stored in the first non-volatile memory element to the first volatile memory element is further configured to transfer the value stored in the first non-volatile memory element to the first volatile memory while the bitcell circuit is disconnected from the first bitline.

7. The bitcell circuit of claim 6 , wherein the bitcell circuit is further configured to selectively decouple at least one terminal of the first non-volatile memory element from the bitline to configure the bitcell circuit to operate as a volatile memory bitcell.

8. The bitcell circuit of claim 1 , and further comprising a write driver circuit to apply a programming signal to the first non-volatile memory element to affect a non-volatile memory state of the first non-volatile memory element based on a current volatile memory state of the first volatile memory element while the bitcell circuit is disconnected from the first bitline.

9. The bitcell circuit of claim 1 , wherein the one or more non-volatile memory elements comprise one or more correlated electron switch (CES) elements.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 28, 2018
From: BHARGAVA, MUDIT; CLINE, BRIAN TRACY; LATTIMORE, GEORGE MCNEIL; SANDHU, BAL S.
To: ARM LIMITED
Reel/Frame 047610/0102 →
Continuity (1)
Related Publication 20190325959A1 · Oct 24, 2019