IP Library Granted Patent US 10,748,885
Granted Patent B2
US 10,748,885 · App. 16/273,859 · Granted Aug 18, 2020

Semiconductor device and method for manufacturing semiconductor device

Inventor: Yusuke Akada (Yokohama Kanagawa, JP)
Assignee: TOSHIBA MEMORY CORPORATION
H01L25/18H01L21/78H01L24/48H01L24/49H01L24/73H01L25/50H01L2224/48091H01L2224/48106H01L2224/48145H01L2224/48227H01L2224/49109H01L2224/49112H01L2224/49175H01L2224/73265
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,748,885
App. No.
16/273,859
Granted
Aug 18, 2020
Kind
B2
Abstract

According to one embodiment, a semiconductor device comprises a first terminal on a first surface of a substrate and a first semiconductor chip on the first surface of the substrate and including a second terminal. A first connector electrically connects the first terminal to the second terminal. A second semiconductor chip is on the first surface of the substrate. An adhesive resin is between the second semiconductor chip and the first surface. A portion of the first connector is embedded in the adhesive resin. The first semiconductor chip is spaced from the adhesive resin in a direction parallel to the first surface.

Claims (33)

1. A semiconductor device, comprising:

a first terminal on a first surface of a substrate;

a first semiconductor chip on the first surface and including a second terminal;

a first connector electrically connecting the first terminal to the second terminal;

a second semiconductor chip on the first surface of the substrate; and

an adhesive resin between the second semiconductor chip and the first surface, a portion of the first connector being embedded in the adhesive resin, the first semiconductor chip being spaced from the adhesive resin in a direction parallel to the first surface, wherein the adhesive resin is in direct contact with the first surface.

2. The semiconductor device according to claim 1 , wherein the substrate is a wiring substrate.

3. The semiconductor device according to claim 1 , wherein the first connector is a bonding wire.

4. The semiconductor device according to claim 1 , wherein the portion of the first connector includes an apex portion of the first connector.

5. The semiconductor device according to claim 1 , wherein the portion of the first connector excludes an apex portion of the first connector.

6. The semiconductor device according to claim 1 , wherein the second semiconductor chip is approximately identical in external shape to the adhesive resin when viewed from above.

7. The semiconductor device according to claim 1 , further comprising:

a plurality of second semiconductor chips stacked one on the other above the adhesive resin.

8. The semiconductor device according to claim 7 , wherein the plurality of second semiconductor chips form a stair-step shape.

9. The semiconductor device according to claim 7 , wherein an uppermost second semiconductor chip of the plurality of second semiconductor chips overlaps the second terminal when viewed from above.

10. The semiconductor device according to claim 1 , further comprising:

a molded resin encasing the first surface, the first semiconductor chip, the second semiconductor chip, the adhesive resin, and any portion of the first connector other than the portion embedded in the adhesive resin.

11. A semiconductor device, comprising:

a plurality of first terminals on a first surface of a substrate; a first semiconductor chip on the first surface and including a plurality of second terminals;

a plurality of first connectors each electrically connecting one first terminal of the plurality of first terminals to one second terminal of the plurality of second terminals;

a first stack of second semiconductor chips on the first surface of the substrate, wherein an uppermost second semiconductor chip in the first stack overlaps the plurality of second terminals when viewed from above; and

an adhesive resin between the first stack of second semiconductor chips and the first surface, a portion of each first connector being embedded in the adhesive resin, the first semiconductor chip being spaced from the adhesive resin in a direction parallel to the first surface.

12. The semiconductor device according to claim 11 , further comprising:

a second stack of second semiconductor chips on the first surface of the substrate, the first semiconductor chip being on a portion of the first surface between the first stack and the second stack.

13. The semiconductor device according to claim 11 , wherein the portion of each of the first connectors includes an apex portion of the respective first connector.

14. The semiconductor device according to claim 11 , wherein the portion of each of the first connectors excludes an apex portion of the respective first connector.

15. The semiconductor device according to claim 11 , wherein the first stack forms a stair-step structure.

16. A method for manufacturing a semiconductor device, the method comprising:

placing a first semiconductor chip on a first surface of a substrate, the first surface having a first terminal thereon, the first semiconductor chip including a second terminal thereon;

electrically connecting the first terminal and the second terminal with a first connector;

placing an adhesive resin on a surface of a second semiconductor chip, the adhesive resin and the second semiconductor chip having substantially a same shape and overlapping when viewed from above; and

placing the second semiconductor chip on the first surface with the adhesive resin between the second semiconductor chip and the first surface, the first terminal and a part of the first connector being embedded in the adhesive resin, wherein the part of the first connector includes an apex portion of the first connector.

17. The method according to claim 16 , wherein the second semiconductor chip is prepared by dicing a wafer to which the adhesive resin has been attached.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 1, 2019
From: AKADA, YUSUKE
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 049044/0884 →
Priority Claims (1)
JP 2018-184646 · Sep 28, 2018 · national
Continuity (1)
Related Publication 20200105734A1 · Apr 2, 2020
Cited By (1)
US 12,648,485