Systems and methods for testing smart card operation
Methods and systems are presented for testing smart card operations and functions for multiple smart cards and associated readers. The methods and systems use a multiplexer and a demultiplexer to connect smart card sockets to probe cards that can be inserted into smart card readers using actuators. The methods and systems described herein test a response of a selected smart card reader or terminal connected to the smart card reader to insertion of the probe card.
1. A system for testing smart card operation comprising:
a plurality of smart card sockets, each smart card socket capable of receiving a smart card;
a plurality of probe cards, each probe card capable of insertion into one of a plurality of smart card readers, each smart card reader connected to one of a plurality of terminals;
at least one multiplexer having a plurality of multiplexer inputs and a plurality of multiplexer outputs, each one of the plurality of multiplexer inputs in a same portion of the multiplexer is electrically connected to a same smart card contact type on a different one of the plurality of smart card sockets;
at least one demultiplexer having a plurality of demultiplexer outputs and a plurality of demultiplexer inputs, each one of the plurality of demultiplexer outputs in a same portion of the demultiplexer is electrically connected to a same probe card contact type on a different one of the plurality of probe cards, each demultiplexer input is electrically connected to a multiplexer output;
a plurality of actuators, each actuator engaged with a different one of the plurality of probe cards; and
a computing system equipped with a processor and a microcontroller, the computing system engaged with the plurality of actuators,
the computing system is configured to:
receive an identifier for a selected one of the plurality of smart card sockets and an identifier for a selected one of the plurality of probe cards;
send, using the microcontroller, a first binary address corresponding to the identifier for the selected one of the plurality of smart card sockets to the at least one multiplexer;
send, using the microcontroller, a second binary address corresponding to the identifier for the selected one of the plurality of probe cards to the at least one demultiplexer; and
activate the actuator that is engaged to the selected one of the plurality of probe cards to insert the selected one of the plurality of probe cards into a selected one of the plurality of smart card readers to test a response of the selected one of the smart card readers or a response of a selected one of the plurality of terminals connected to the selected one of the smart card readers.
2. The system of claim 1 , wherein the computing system is further configured to validate a smart card engaged with the smart card socket that corresponds to the identifier for the one of the plurality of smart card sockets.
3. The system of claim 1 , wherein at least two of the plurality of terminals operate using different firmware or different versions of firmware.
4. The system of claim 1 , wherein at least two of the plurality of smart card readers operate using different firmware or different versions of firmware.
5. The system of claim 1 , wherein the plurality of smart card sockets comprises sixteen smart card sockets.
6. The system of claim 1 wherein the plurality of probe cards comprises four probe cards.
7. The system of claim 1 wherein the smart card contact type is one of positive voltage, negative voltage, reset, clock, or input/output.
8. The system of claim 1 , wherein each smart card is an EMV card.
9. The system of claim 1 wherein each smart card is a subscriber identification module (SIM) card.
10. A method of testing smart card operation comprising:
receiving an identifier for a selected one of a plurality of smart card sockets capable of receiving a smart card and an identifier for a selected one of a plurality of probe cards, each probe card capable of insertion into one of a plurality of smart card readers, each smart card reader connected to one of a plurality of terminals;
sending, using a microcontroller, a first binary address corresponding to the identifier for the selected one of the plurality of smart card sockets to a multiplexer, the multiplexer having a plurality of multiplexer inputs and a plurality of multiplexer outputs, each one of the plurality of multiplexer inputs in a same portion of the multiplexer is electrically connected to a same smart card contact type on a different one of the plurality of smart card readers;
sending, using the microcontroller, a second binary address corresponding to the identifier for the selected one of the plurality of probe cards to a demultiplexer, the demultiplexer having a plurality of demultiplexer outputs and a plurality of demultiplexer inputs, each one of the demultiplexer outputs in a same portion of the demultiplexer is electrically connected to a same probe card contact type on a different one of the plurality of probe cards, each demultiplexer input is electrically connected to a multiplexer output; and
activating one of a plurality of actuators that is engaged to the selected one of the probe cards to insert the selected one of the plurality of probe cards into a selected one of the plurality of smart card readers to test a response of the selected one of the smart card readers or a response of a selected one of the plurality of terminals connected to the selected one of the smart card readers.
11. The method of claim 10 , further comprising validating a smart card engaged with the smart card socket that corresponds to the identifier for the one of the plurality of smart card sockets.
12. The method of claim 10 , wherein at least two of the plurality of terminals operate using different firmware or different versions of firmware.
13. The method of claim 10 , wherein at least two of the plurality of smart card readers operate using different firmware or different versions of firmware.
14. The method of claim 10 , wherein the plurality of smart card sockets comprises sixteen smart card sockets.
15. The method of claim 10 wherein the plurality of probe cards comprises four probe cards.
16. The method of claim 10 wherein the smart card contact type is one of positive voltage, negative voltage, reset, clock, or input/output.
17. A device for testing smart card operation comprising:
a plurality of smart card sockets, each smart card socket capable of receiving a smart card;
a plurality of probe cards, each probe card capable of insertion into a different one of a plurality of smart card readers, each smart card reader connected to one of a plurality of terminals;
at least one multiplexer having a plurality of multiplexer inputs and a plurality of multiplexer outputs, each one of the plurality of multiplexer inputs in a same portion of the multiplexer is electrically connected to a same smart card contact type on a different one of the plurality of smart card sockets;
at least one demultiplexer having a plurality of demultiplexer outputs and a plurality of demultiplexer inputs, each of the plurality of demultiplexer outputs in a same portion of the demultiplexer is electrically connected to a same probe card contact type on a different one of the plurality of probe cards, each demultiplexer input is electrically connected to a multiplexer output; and
a plurality of linear actuators, each linear actuator engaged with a probe card.
18. The device of claim 17 , wherein the plurality of smart card sockets comprises sixteen smart card sockets.
19. The device of claim 17 wherein the plurality of probe cards comprises four probe cards.
20. The device of claim 17 wherein the smart card contact type is one of positive voltage, negative voltage, reset, clock, or input/output.