IP Library Granted Patent US 10,756,262
Granted Patent B2
US 10,756,262 · App. 16/282,884 · Granted Aug 25, 2020

Spin-orbit-torque magnetization rotational element, spin-orbit-torque magnetoresistance effect element, magnetic memory, and spin-orbit-torque magnetization rotational element manufacturing method

Inventors: Eiji Komura (Tokyo, JP); Yohei Shiokawa (Tokyo, JP)
Assignee: TDK CORPORATION
H01L43/14G11C11/161H01L27/222H01L43/04H01L43/065H01L43/08H01L43/10
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Quick Facts
Patent No.
US 10,756,262
App. No.
16/282,884
Granted
Aug 25, 2020
Kind
B2
Abstract

A spin-orbit-torque magnetization rotational element includes: a spin-orbit-torque wiring which extends in a first direction; and a first ferromagnetic layer which is laminated in a second direction intersecting the spin-orbit-torque wiring, wherein the spin-orbit-torque wiring includes a convex portion which protrudes in the second direction in relation to a first surface on the side of the first ferromagnetic layer at a connecting part between the spin-orbit-torque wiring and the first ferromagnetic layer.

Claims (43)

1. A spin-orbit-torque magnetization rotational element comprising:

a spin-orbit-torque wiring which extends in a first direction; and

a first ferromagnetic layer which is laminated in a second direction intersecting the spin-orbit-torque wiring, wherein:

the spin-orbit-torque wiring includes a convex portion which protrudes in the second direction in relation to a first surface at a connecting part between the spin-orbit-torque wiring and the first ferromagnetic layer, and

a spin is implanted to the first ferromagnetic layer from the spin-orbit-torque wiring.

2. The spin-orbit-torque magnetization rotational element according to claim 1 ,

wherein the convex portion configured to surround a periphery of the first ferromagnetic layer.

3. The spin-orbit-torque magnetization rotational element according to claim 1 ,

wherein a side surface of the convex portion on the side of the first ferromagnetic layer is inclined in a direction away from the first ferromagnetic layer from the first surface toward a tip of the convex portion.

4. The spin-orbit-torque magnetization rotational element according to claim 1 , further comprising:

an insertion layer which is provided at a surface of the spin-orbit-torque wiring, the surface being opposite to the side with the first ferromagnetic layer at a position where the convex portion of the spin-orbit-torque wiring is provided.

5. The spin-orbit-torque magnetization rotational element according to claim 1 ,

wherein the spin-orbit-torque wiring contains one or more elements selected from a group consisting of Ta, W, Pt, Au, Nb, Mo, Ru, Os, Rh, Ir, Pd, and Ag.

6. A spin-orbit-torque magnetoresistance effect element comprising:

the spin-orbit-torque magnetization rotational element according to claim 1 ;

a nonmagnetic layer which is laminated on a surface of the first ferromagnetic layer, the surface being opposite to a surface contacting the spin-orbit-torque wiring; and

a second ferromagnetic layer which sandwiches the first ferromagnetic layer and the nonmagnetic layer, wherein:

the first ferromagnetic layer, the nonmagnetic layer, and the second ferromagnetic layer constitute a functional unit configured to exhibit a magnetoresistance effect, and

an upper electrode for reading a change in resistance value of the functional unit is connected to the upper portion of the functional unit.

7. The spin-orbit-torque magnetoresistance effect element according to claim 6 ,

wherein a shortest distance between the convex portion and the functional unit is equal to or smaller than a height of the functional unit.

8. The spin-orbit-torque magnetoresistance effect element according to claim 6 ,

wherein a shortest distance between the convex portion and the functional unit is equal to or larger than a difference between a height of the functional unit and a height of the convex portion.

9. The spin-orbit-torque magnetoresistance effect element according to claim 6 ,

wherein a height of the convex portion is equal to or smaller than a height of the functional unit.

10. The spin-orbit-torque magnetoresistance effect element according to claim 6 , further comprising:

an interlayer insulating film configured to protect a side wall of the functional unit,

wherein the interlayer insulating film is an oxide or a nitride of one or more elements selected from a group consisting of Si, Al, Ta, Mg, and Hf.

11. A magnetic memory comprising:

a plurality of spin-orbit-torque magnetoresistance effect elements according to claim 6 .

12. A method of manufacturing the spin-orbit-torque magnetization rotational element according to claim 1 , the method comprising the steps of:

laminating a protection layer on a substrate and removing the protection layer excluding at least a position to be the convex portion;

sequentially laminating layers to be the spin-orbit-torque wiring and the ferromagnetic layer on the protection layer; and

forming a sacrificial layer on a part of the ferromagnetic layer and performing etching.

13. A method of manufacturing the spin-orbit-torque magnetization rotational element according to claim 1 , the method comprising the steps of:

sequentially laminating layers to be the spin-orbit-torque wiring and the ferromagnetic layer on a substrate;

forming a sacrificial layer coating portions to be the first ferromagnetic layer and the convex portion; and

performing etching thorough the sacrificial layer.

14. A method of manufacturing the spin-orbit-torque magnetization rotational element according to claim 1 , the method comprising the steps of:

sequentially laminating layers to be the spin-orbit-torque wiring and the ferromagnetic layer on a substrate;

forming a protection layer coating portions to be the first ferromagnetic layer, removing an unnecessary portion, and forming the first ferromagnetic layer;

forming a coating of an insulation layer coating the first ferromagnetic layer and the layer to be the spin-orbit-torque wiring; and

laminating a material, which is a same as a material of the layer to be the spin-orbit-torque wiring, and thickening the layer to be the spin-orbit-torque wiring.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2019
From: KOMURA, EIJI; SHIOKAWA, YOHEI
To: TDK CORPORATION
Reel/Frame 049354/0910 →
Priority Claims (1)
JP 2018-031984 · Feb 26, 2018 · national
Continuity (1)
Related Publication 20190267542A1 · Aug 29, 2019